PROCEEDINGS VOLUME 3418
LASERS AND MATERIALS IN INDUSTRY AND OPTO-CONTACT WORKSHOP | 13-16 JULY 1998
Advances in Optical Beam Characterization and Measurements
LASERS AND MATERIALS IN INDUSTRY AND OPTO-CONTACT WORKSHOP
13-16 July 1998
Quebec, Canada
Optical Techniques for Materials and Surface Characterization
Proc. SPIE 3418, Optical characterization of linear and nonlinear materials using Bessel beams, (9 October 1998);doi: 10.1117/12.326640
Proc. SPIE 3418, Characterization of the optical nonlinearities of ZnSe using Z-scan techniques, (9 October 1998);doi: 10.1117/12.326646
Proc. SPIE 3418, Toward double-pulse digital shearography, (9 October 1998);doi: 10.1117/12.326647
Proc. SPIE 3418, Compensation of object beam perturbations in interferometric measurements with a phase conjugation mirror, (9 October 1998);doi: 10.1117/12.326648
Proc. SPIE 3418, Measurements of the nonlinear index of refraction using a polarization interferometer, (9 October 1998);doi: 10.1117/12.326649
Characterization of Laser Beams and Pulses
Proc. SPIE 3418, Throughput vs. the M2 quality factor, (9 October 1998);doi: 10.1117/12.326650
Proc. SPIE 3418, High-speed laser beam diagnostics for pulsed lasers, (9 October 1998);doi: 10.1117/12.326651
Proc. SPIE 3418, Single-shot temporal measurements of ultrashort pulses by means of polarimetric technique, (9 October 1998);doi: 10.1117/12.326652
Proc. SPIE 3418, Tunable optical pulses of given duration by polarization technique, (9 October 1998);doi: 10.1117/12.326653
Proc. SPIE 3418, Characterization of optical signals in fiber optic Fourier converter, (9 October 1998);doi: 10.1117/12.326641
Photoinduced Changes to Materials
Proc. SPIE 3418, Photoexcitation and diffusion of azo dye molecules in nematic liquid crystals, (9 October 1998);doi: 10.1117/12.326642
Theory of Beam and Pulse Propagation
Proc. SPIE 3418, Equation for nonlinear optical propagation beyond the paraxial approximation, (9 October 1998);doi: 10.1117/12.326643
Proc. SPIE 3418, Effects of detuning and dispersion on the dynamics of FM mode-locked Ti:sapphire laser, (9 October 1998);doi: 10.1117/12.326644
Photoinduced Changes to Materials
Proc. SPIE 3418, Photoluminescence study of wurtzite Si-doped GaN thin films, (9 October 1998);doi: 10.1117/12.326645
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