PROCEEDINGS VOLUME 3520
PHOTONICS EAST (ISAM, VVDC, IEMB) | 1-6 NOVEMBER 1998
Three-Dimensional Imaging, Optical Metrology, and Inspection IV
PHOTONICS EAST (ISAM, VVDC, IEMB)
1-6 November 1998
Boston, MA, United States
Structured Light Methods I
Proc. SPIE 3520, Dimensional measurement of plate products using a novel moire system, 0000 (29 December 1998); doi: 10.1117/12.334321
Proc. SPIE 3520, Multicolor fringe projection system with enhanced 3D reconstruction of surfaces, 0000 (29 December 1998); doi: 10.1117/12.334331
Proc. SPIE 3520, Mach-Zehnder interferometer fringe projector for variable-resolution video moire, 0000 (29 December 1998); doi: 10.1117/12.334342
Proc. SPIE 3520, High-speed moire contouring methods analysis, 0000 (29 December 1998); doi: 10.1117/12.334346
Proc. SPIE 3520, Two-frequency phase-shifting projection moire topography, 0000 (29 December 1998); doi: 10.1117/12.334348
Structured Light Methods II
Proc. SPIE 3520, Integration of multiple-baseline color stereo vision with focus and defocus analysis for 3D shape measurement, 0000 (29 December 1998); doi: 10.1117/12.334349
Proc. SPIE 3520, Application of phase-shift optical triangulation to precision gear gauging, 0000 (29 December 1998); doi: 10.1117/12.334350
Proc. SPIE 3520, Speckle-induced phase error in laser-based phase-shifting projected-fringe profilometry, 0000 (29 December 1998); doi: 10.1117/12.334351
Proc. SPIE 3520, Nondestructive profiler for pipe inner wall using triangulation scanning method, 0000 (29 December 1998); doi: 10.1117/12.334352
Proc. SPIE 3520, Recovery of three-dimensional shapes by using a defocus structured light system, 0000 (29 December 1998); doi: 10.1117/12.334322
Proc. SPIE 3520, Calibrating method for a spatial-encoding-based rangefinder, 0000 (29 December 1998); doi: 10.1117/12.334323
Rangefinding Methods
Proc. SPIE 3520, Photogrammetrical matching of point clouds for 3D measurement of complex objects, 0000 (29 December 1998); doi: 10.1117/12.334324
Proc. SPIE 3520, Real-time videogrammetry uncertainty computation and test results, 0000 (29 December 1998); doi: 10.1117/12.334325
Proc. SPIE 3520, High-resolution laser rangefinder based on a phase-shift measurement method, 0000 (29 December 1998); doi: 10.1117/12.334326
Proc. SPIE 3520, Ideas for fast and cheap object capture, 0000 (29 December 1998); doi: 10.1117/12.334327
Micromeasurements
Proc. SPIE 3520, Fundamentals of the advanced Fresnel tracer used for two-dimensional in-process micromeasurements, 0000 (29 December 1998); doi: 10.1117/12.334328
Proc. SPIE 3520, Micromeasurements on smooth surfaces with a new confocal optical profiler, 0000 (29 December 1998); doi: 10.1117/12.334329
Proc. SPIE 3520, Surface structure analysis of paper based on confocal laser scanning microscopy (CLSM) imaging: aiming at the prediction of printability for wood-containing paper, 0000 (29 December 1998); doi: 10.1117/12.334330
Proc. SPIE 3520, Design-model-based in-process measuring method of a three-dimensional microprofile by employing the laser inverse scattering phase-reconstruction method, 0000 (29 December 1998); doi: 10.1117/12.334332
3D Modeling
Proc. SPIE 3520, Fuzzy logic applied to suface modeling from point clouds, 0000 (29 December 1998); doi: 10.1117/12.334333
Proc. SPIE 3520, 3D range image surface feature classification using tripod operators, 0000 (29 December 1998); doi: 10.1117/12.334334
Proc. SPIE 3520, Implicit surface reconstruction for reverse engineering, 0000 (29 December 1998); doi: 10.1117/12.334335
Proc. SPIE 3520, Definition of the fundamentals for the automatic generation of digitalization processes with a 3D laser sensor, 0000 (29 December 1998); doi: 10.1117/12.334336
Proc. SPIE 3520, Volumetric properties for three-dimensional solid objects using optical images, 0000 (29 December 1998); doi: 10.1117/12.334337
Holography/Speckle Methods and Interferometric Feature Measurements
Proc. SPIE 3520, Multiwavelength shearography for evaluation of in-plane strain distributions, 0000 (29 December 1998); doi: 10.1117/12.334338
Proc. SPIE 3520, Birefringent torque sensor for motors, 0000 (29 December 1998); doi: 10.1117/12.334339
Proc. SPIE 3520, Strain/stress measurements using electronic speckle pattern interferometry, 0000 (29 December 1998); doi: 10.1117/12.334340
Proc. SPIE 3520, Optical fiber transient current measurement, 0000 (29 December 1998); doi: 10.1117/12.334341
Proc. SPIE 3520, Simultaneous measurement of the root-mean-square roughness and autocorrelation length by optical method, 0000 (29 December 1998); doi: 10.1117/12.334343
Proc. SPIE 3520, Characterization of a geometrically desensitized interferometer for flatness testing, 0000 (29 December 1998); doi: 10.1117/12.334344
Proc. SPIE 3520, Coherence scanning in a geometrically desensitized interferometer, 0000 (29 December 1998); doi: 10.1117/12.334345
3D Modeling
Proc. SPIE 3520, Practical applications of laser holography in metrology for 3D imaging and industrial inspection, 0000 (29 December 1998); doi: 10.1117/12.334347
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