PROCEEDINGS VOLUME 3558
PHOTONICS CHINA '98 | 16-19 SEPTEMBER 1998
Automated Optical Inspection for Industry: Theory, Technology, and Applications II
PHOTONICS CHINA '98
16-19 September 1998
Beijing, China
Visual Inspection I
Proc. SPIE 3558, New 3D profilometry based on modulation measurement, 0000 (10 August 1998); doi: 10.1117/12.318337
Proc. SPIE 3558, Experimental study of determining the optical properties of glass online, 0000 (10 August 1998); doi: 10.1117/12.318366
Proc. SPIE 3558, Design of image scanning and sampling system for 3D laser radar, 0000 (10 August 1998); doi: 10.1117/12.318377
Proc. SPIE 3558, Automonitoring the status of a mobile microsphere, 0000 (10 August 1998); doi: 10.1117/12.318388
Proc. SPIE 3558, Technology of online spectral response measurement, 0000 (10 August 1998); doi: 10.1117/12.318399
Proc. SPIE 3558, Online turbidity measurement using light surface scattering, 0000 (10 August 1998); doi: 10.1117/12.318410
Proc. SPIE 3558, Visible automeasurement of positional accuracy to complex objects, 0000 (10 August 1998); doi: 10.1117/12.318421
Proc. SPIE 3558, Topography measurement by changing distance, 0000 (10 August 1998); doi: 10.1117/12.318432
Proc. SPIE 3558, Photoelectric detection of the position of electric transmission contact net in electrification railway, 0000 (10 August 1998); doi: 10.1117/12.318443
Proc. SPIE 3558, Scannerless laser three-dimensional imaging method, 0000 (10 August 1998); doi: 10.1117/12.318338
Proc. SPIE 3558, Measuring rotation angles in high speed with laser interference, 0000 (10 August 1998); doi: 10.1117/12.318349
Proc. SPIE 3558, Precision navigation sensor using position-sensitive detector for automatic navigation vehicle, 0000 (10 August 1998); doi: 10.1117/12.318358
Visual Inspection II
Proc. SPIE 3558, Method of dynamic geometric parameter measurement by laser tracking system, 0000 (10 August 1998); doi: 10.1117/12.318359
Proc. SPIE 3558, Computer-vision-based auto-alignment drilling machine for PCB, 0000 (10 August 1998); doi: 10.1117/12.318360
Proc. SPIE 3558, Automated optical inspection for high-speed electron in synchrotron accelerator, 0000 (10 August 1998); doi: 10.1117/12.318361
Proc. SPIE 3558, Automation of temperature measurement by laser, 0000 (10 August 1998); doi: 10.1117/12.318362
Proc. SPIE 3558, Application of TDICCD on real-time Earth reconnaissance satellite, 0000 (10 August 1998); doi: 10.1117/12.318363
Proc. SPIE 3558, Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature field, 0000 (10 August 1998); doi: 10.1117/12.318364
Proc. SPIE 3558, Visual measurement on BGA chip leaders, 0000 (10 August 1998); doi: 10.1117/12.318365
Proc. SPIE 3558, New method for real-time monitoring of laser power and mode online, 0000 (10 August 1998); doi: 10.1117/12.318367
Proc. SPIE 3558, Experimental study of vibration measurement based on laser frequency splitting principle, 0000 (10 August 1998); doi: 10.1117/12.318368
Proc. SPIE 3558, Practical coordinate mapping method for phase-measuring profilometry, 0000 (10 August 1998); doi: 10.1117/12.318369
Proc. SPIE 3558, Online inspection system for steel-plate thickness, 0000 (10 August 1998); doi: 10.1117/12.318370
Proc. SPIE 3558, Measurement technology of ultrafast optoelectronics, 0000 (10 August 1998); doi: 10.1117/12.318371
Proc. SPIE 3558, New inline field tester on visual distance of night vision instrument with faint light, 0000 (10 August 1998); doi: 10.1117/12.318372
High-Speed Optical Inspection Systems
Proc. SPIE 3558, New scheme of high-precision visual collimator, 0000 (10 August 1998); doi: 10.1117/12.318373
Proc. SPIE 3558, Television automatic video-line tester, 0000 (10 August 1998); doi: 10.1117/12.318374
Proc. SPIE 3558, Active trigonometry and its application to thickness measurement on reflective surface, 0000 (10 August 1998); doi: 10.1117/12.318375
Proc. SPIE 3558, Interference measurements for roughness of silicon mirror with Twyman interferometer, 0000 (10 August 1998); doi: 10.1117/12.318376
Proc. SPIE 3558, Displacement quantity test and measurement system with the laser light triangle method, 0000 (10 August 1998); doi: 10.1117/12.318378
Proc. SPIE 3558, Probe imaging vision coordinate measuring system using single camera, 0000 (10 August 1998); doi: 10.1117/12.318379
Proc. SPIE 3558, CCD-based microscopic measurement system for precision part geometry error, 0000 (10 August 1998); doi: 10.1117/12.318380
Proc. SPIE 3558, Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel, 0000 (10 August 1998); doi: 10.1117/12.318381
Proc. SPIE 3558, Parallel confocal detection method for three-dimensional surface topography with a micro-optic component, 0000 (10 August 1998); doi: 10.1117/12.318382
Proc. SPIE 3558, High-accuracy optical prismatic scanner and its application to the measurement of large-axle angularity, 0000 (10 August 1998); doi: 10.1117/12.318383
Proc. SPIE 3558, Laser diffraction measurement, 0000 (10 August 1998); doi: 10.1117/12.318384
Proc. SPIE 3558, Optical method of measuring the thickness of optical films in devices, 0000 (10 August 1998); doi: 10.1117/12.318385
Proc. SPIE 3558, Large-scale form and position error measurement, 0000 (10 August 1998); doi: 10.1117/12.318386
Proc. SPIE 3558, Detection system of the dynamic starting characteristic of an electric motor, 0000 (10 August 1998); doi: 10.1117/12.318387
Proc. SPIE 3558, Research for the cylinder edge-checkout models, 0000 (10 August 1998); doi: 10.1117/12.318389
Proc. SPIE 3558, Modeling and simulation of optimization design for structure parameters of CCD intersection measurement system, 0000 (10 August 1998); doi: 10.1117/12.318390
Proc. SPIE 3558, Computer-aided internal thread parameters testing, 0000 (10 August 1998); doi: 10.1117/12.318391
Proc. SPIE 3558, Optoelectronic noncontact inspection method of taper, 0000 (10 August 1998); doi: 10.1117/12.318392
Proc. SPIE 3558, System of photoelectric automeasurement of internal diameter, 0000 (10 August 1998); doi: 10.1117/12.318393
Proc. SPIE 3558, Stereo-vision system for measurement of 3D object, 0000 (10 August 1998); doi: 10.1117/12.318394
Proc. SPIE 3558, Application of Twyman-CCD computer system in automeasurement displacement, 0000 (10 August 1998); doi: 10.1117/12.318395
Proc. SPIE 3558, Three-dimensional profile measurement by using an artificial neural network, 0000 (10 August 1998); doi: 10.1117/12.318396
Proc. SPIE 3558, Nonlinearity of optical triangulation, 0000 (10 August 1998); doi: 10.1117/12.318397
Proc. SPIE 3558, Photoelectric automeasurement system for shape and position, 0000 (10 August 1998); doi: 10.1117/12.318398
Proc. SPIE 3558, Realization of spherical absolute testing, 0000 (10 August 1998); doi: 10.1117/12.318400
Proc. SPIE 3558, Submicron position and measurement system for optical edges, 0000 (10 August 1998); doi: 10.1117/12.318401
Proc. SPIE 3558, Computer-aided testing for contact-type interferometer, 0000 (10 August 1998); doi: 10.1117/12.318402
Proc. SPIE 3558, Noncontact optical sensor for inside-diameter measurements, 0000 (10 August 1998); doi: 10.1117/12.318403
Proc. SPIE 3558, Portable laser roughometer, 0000 (10 August 1998); doi: 10.1117/12.318404
Proc. SPIE 3558, Calibration errors in laser-scanning 3D-vision measurement using the space encoding method, 0000 (10 August 1998); doi: 10.1117/12.318405
Proc. SPIE 3558, Automated inspection of chip type using image analysis method, 0000 (10 August 1998); doi: 10.1117/12.318406
Novel Inspection Algorithms and Architectures
Proc. SPIE 3558, Distortion compensation in large-FOV CCD optical measurement system, 0000 (10 August 1998); doi: 10.1117/12.318407
Proc. SPIE 3558, Exploiting potentialities of linear CCD arrays in real-time dynamic measurement, 0000 (10 August 1998); doi: 10.1117/12.318408
Proc. SPIE 3558, Application of CCD camera to test radar-angle tracking performance, 0000 (10 August 1998); doi: 10.1117/12.318409