PROCEEDINGS VOLUME 3573
OPTIKA '98: FIFTH CONGRESS ON MODERN OPTICS | 14-17 SEPTEMBER 1998
OPTIKA '98: 5th Congress on Modern Optics
OPTIKA '98: FIFTH CONGRESS ON MODERN OPTICS
14-17 September 1998
Budapest, Hungary
Lasers and Related Devices
Nonlinear Optics
Proc. SPIE 3573, New trends in nonlinear optics, 0000 (19 August 1998); doi: 10.1117/12.320972
Proc. SPIE 3573, Relations between input and output quantum states of integrated optical systems, 0000 (19 August 1998); doi: 10.1117/12.320974
Proc. SPIE 3573, Two-pass second-harmonic generation of ultrashort pulses, 0000 (19 August 1998); doi: 10.1117/12.320975
Proc. SPIE 3573, All-optical inverter operating over a temperature range of -200oC to 750oC in erbium-doped borate glass, 0000 (19 August 1998); doi: 10.1117/12.320976
Proc. SPIE 3573, Optical quadropole sum-frequency generation of polarized waves via dipole-forbidden atomic transition, 0000 (19 August 1998); doi: 10.1117/12.320977
Proc. SPIE 3573, Optimal conditions for light pulse coherence transformation in thin nonlinear media, 0000 (19 August 1998); doi: 10.1117/12.320978
Proc. SPIE 3573, Star states in multi-photon processes, 0000 (19 August 1998); doi: 10.1117/12.320979
Proc. SPIE 3573, Region of phase transition in optical bistable systems, 0000 (19 August 1998); doi: 10.1117/12.320981
Proc. SPIE 3573, Nonlinear reflection of extremely short light pulses, 0000 (19 August 1998); doi: 10.1117/12.320982
Materials Processing
Proc. SPIE 3573, Laser material interaction technologies for materials processing, 0000 (19 August 1998); doi: 10.1117/12.320983
Proc. SPIE 3573, Atomic force microscope study of excimer-laser-treated graphite surfaces, 0000 (19 August 1998); doi: 10.1117/12.320984
Proc. SPIE 3573, Changes in optical properties of excimer-laser-irradiated polymers, 0000 (19 August 1998); doi: 10.1117/12.320985
Proc. SPIE 3573, Smooth vanadium-nitride layers created on silicon substrates by pulse laser deposition method, 0000 (19 August 1998); doi: 10.1117/12.320986
Proc. SPIE 3573, Mask-adapted beam shaping for materials processing with excimer laser radiation, 0000 (19 August 1998); doi: 10.1117/12.320987
Proc. SPIE 3573, Femtosecond UV-laser ablation of solid targets, 0000 (19 August 1998); doi: 10.1117/12.320988
Proc. SPIE 3573, Nickel deposition on silicon surfaces, 0000 (19 August 1998); doi: 10.1117/12.320989
Proc. SPIE 3573, Development of submicrometer periodic surface structures on polyethylene terephthalate, 0000 (19 August 1998); doi: 10.1117/12.320990
Proc. SPIE 3573, Ripple formation on GaAs surfaces by ultrafast (fs) laser pulses, 0000 (19 August 1998); doi: 10.1117/12.320991
Proc. SPIE 3573, Excimer-laser-beam homogenization for materials processing, 0000 (19 August 1998); doi: 10.1117/12.320992
Proc. SPIE 3573, High-optical-quality LiNbO3 thin films obtained by pulsed laser deposition, 0000 (19 August 1998); doi: 10.1117/12.320993
Proc. SPIE 3573, Laser interaction with carbon-type materials, 0000 (19 August 1998); doi: 10.1117/12.320994
Proc. SPIE 3573, Laser-assisted chemical vapor deposition of diamond microstructures, 0000 (19 August 1998); doi: 10.1117/12.320995
Proc. SPIE 3573, Ultrafast photographic investigation on laser ablation of liquid metals, 0000 (19 August 1998); doi: 10.1117/12.320996
Optical Information Processing
Proc. SPIE 3573, Modified method for analysis of distorted quasi-periodical images, 0000 (19 August 1998); doi: 10.1117/12.320997
Proc. SPIE 3573, Optical-logic element using array of computer-generated Fresnel holograms, 0000 (19 August 1998); doi: 10.1117/12.320998
Proc. SPIE 3573, Concept of a neural system for real-time evaluation of spectroscopic measurements, 0000 (19 August 1998); doi: 10.1117/12.320999
Proc. SPIE 3573, Optical recording in nanolayered amorphous chalcogenide films, 0000 (19 August 1998); doi: 10.1117/12.321000
Proc. SPIE 3573, Nonfeedback nonlinear holographic associative memories, 0000 (19 August 1998); doi: 10.1117/12.321001
Proc. SPIE 3573, Phase-conjugation cryptography using nonlinearly recorded holograms, 0000 (19 August 1998); doi: 10.1117/12.321002
Proc. SPIE 3573, Edge-enhanced phase conjugation based on a quadric hologram, 0000 (19 August 1998); doi: 10.1117/12.321003
Proc. SPIE 3573, Directional multiplexing for optical board-to-board interconnections, 0000 (19 August 1998); doi: 10.1117/12.321004
Proc. SPIE 3573, Double matched filtering using the photorefractive Bi12TiO20 crystal at lambda = 0.633 um, 0000 (19 August 1998); doi: 10.1117/12.321005
Optical Measurements
Proc. SPIE 3573, New frontiers of elastic light scattering in aerosols, 0000 (19 August 1998); doi: 10.1117/12.321006
Proc. SPIE 3573, New 3D robotic vision system, 0000 (19 August 1998); doi: 10.1117/12.321007
Proc. SPIE 3573, Nature of radiation absorption centers in silica glass, 0000 (19 August 1998); doi: 10.1117/12.321008
Proc. SPIE 3573, Optical constants of thin CVD-Tungsten oxide films, 0000 (19 August 1998); doi: 10.1117/12.321009
Proc. SPIE 3573, Fiber optic sensors and systems at the Federal University of Rio de Janeiro, 0000 (19 August 1998); doi: 10.1117/12.321010
Proc. SPIE 3573, Time-domain and spectral-domain low-coherence interferometry applied to dispersion measurements of optical fibers, 0000 (19 August 1998); doi: 10.1117/12.321012
Proc. SPIE 3573, Real-time trichromatic holographic interferometry: preliminary study, 0000 (19 August 1998); doi: 10.1117/12.321013
Proc. SPIE 3573, Dielectric properties of sol-gel TiO2(La) films, 0000 (19 August 1998); doi: 10.1117/12.321014
Proc. SPIE 3573, Optical characterization of diffuser-input standard irradiance meters, 0000 (19 August 1998); doi: 10.1117/12.321015
Proc. SPIE 3573, New sizing method for liquidborne particles with high dynamic range, 0000 (19 August 1998); doi: 10.1117/12.321017
Proc. SPIE 3573, PC-controlled CCD-matrix-based optical multichannel analyzer for RESPECT measurements, 0000 (19 August 1998); doi: 10.1117/12.321018
Proc. SPIE 3573, Characterization of a new computer-ready photon counting system, 0000 (19 August 1998); doi: 10.1117/12.321019
Proc. SPIE 3573, Optical correlation technique for measurement of roughness at microfacets of reflection-type diffraction gratings, 0000 (19 August 1998); doi: 10.1117/12.321020
Proc. SPIE 3573, Real-time high-resolution absolute distance measurement by two-wavelength interferometry using superheterodyne detection, 0000 (19 August 1998); doi: 10.1117/12.321021
Proc. SPIE 3573, Orientation of optical transitions of pigments in isolated photosystem I particles, 0000 (19 August 1998); doi: 10.1117/12.321022