PROCEEDINGS VOLUME 3578
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1998 | SEP 28 - OCT 1 1998
Laser-Induced Damage in Optical Materials: 1998
LASER-INDUCED DAMAGE IN OPTICAL MATERIALS: 1998
Sep 28 - Oct 1 1998
Boulder, CO, United States
Materials and Measurements
Proc. SPIE 3578, Nomarski interferometer and CCD camera application in the research of optical materials damage processes (Abstract Only), 0000 (7 April 1999); doi: 10.1117/12.344371
Thin Films
Proc. SPIE 3578, Multiharmonic coatings for the YAG laser, 0000 (7 April 1999); doi: 10.1117/12.344382
Materials and Measurements
Proc. SPIE 3578, Effects of excimer laser irradiation on the KDP crystal, 0000 (7 April 1999); doi: 10.1117/12.344393
Proc. SPIE 3578, Laser-induced damage of organic-dye-doped ormosils, 0000 (7 April 1999); doi: 10.1117/12.344404
Proc. SPIE 3578, CW-laser-induced thermal and mechanical damage in optical materials, 0000 (7 April 1999); doi: 10.1117/12.344414
Fundamental Mechanisms
Proc. SPIE 3578, Recent progress in theoretical studies of laser-induced damage (LID) in optical materials: fundamental properties of LID threshold in the wide-pulse-width range from microseconds to femtoseconds, 0000 (7 April 1999); doi: 10.1117/12.344424
Proc. SPIE 3578, Contribution to the failure analysis of AlGaAs/GaAs laser diodes, 0000 (7 April 1999); doi: 10.1117/12.344435
Materials and Measurements
Proc. SPIE 3578, Rutherford backscattering spectroscopy analysis of Au/Cr/GaAs, 0000 (7 April 1999); doi: 10.1117/12.344446
Proc. SPIE 3578, Characterization of absorption and scatter losses on optical components for ArF excimer lasers, 0000 (7 April 1999); doi: 10.1117/12.344455
Fundamental Mechanisms
Proc. SPIE 3578, Pointlike destruction in transparent materials caused by single-photon absorption, 0000 (7 April 1999); doi: 10.1117/12.344372
Proc. SPIE 3578, Analysis of the data on the electronic avalanche obtained from numerical solutions of differential-difference and diffusion-type equations (Abstract Only), 0000 (7 April 1999); doi: 10.1117/12.344373
Proc. SPIE 3578, Path integrals method and description of a valance band impact ionization under multiphoton heating of electrons, 0000 (7 April 1999); doi: 10.1117/12.344374
Materials and Measurements
Proc. SPIE 3578, Structural quality of the interface seed crystal in rapidly grown KDP crystals for high-power lasers, 0000 (7 April 1999); doi: 10.1117/12.344375
Proc. SPIE 3578, Laser damage threshold and optical absorption of KDP crystal dependent on their growth conditions, 0000 (7 April 1999); doi: 10.1117/12.344376
Proc. SPIE 3578, Radiation-stimulated changes of structure and mechanical strength of KDP and DKDP crystals, 0000 (7 April 1999); doi: 10.1117/12.344377
Thin Films
Proc. SPIE 3578, Effects of layer thickness and number of interfaces on the damage threshold of ultraviolet sol-gel mirrors, 0000 (7 April 1999); doi: 10.1117/12.344378
Surfaces and Mirrors
Proc. SPIE 3578, Laser damage study on the first-wall LMJ target chamber, 0000 (7 April 1999); doi: 10.1117/12.344379
Materials and Measurements
Proc. SPIE 3578, Temperature dependences of IR-absorption and CO2-laser damage of ZnSe and CdS single crystals, 0000 (7 April 1999); doi: 10.1117/12.344380
Proc. SPIE 3578, Modification of optical properties of ZnSe crystals by means of photothermal treatment, 0000 (7 April 1999); doi: 10.1117/12.344381
Thin Films
Proc. SPIE 3578, Laser resistivity and causes of damage in coating materials for 193 nm by photothermal methods, 0000 (7 April 1999); doi: 10.1117/12.344383
Proc. SPIE 3578, Changes in optical interference coatings exposed to 193-nm excimer laser radiation, 0000 (7 April 1999); doi: 10.1117/12.344384
Proc. SPIE 3578, ArF radiation resistance of optical coatings on CaF2 in relation to the surface finish of the substrate, 0000 (7 April 1999); doi: 10.1117/12.344385
Proc. SPIE 3578, Current status of radiation resistance of dielectric mirrors in the DUV, 0000 (7 April 1999); doi: 10.1117/12.344386
Proc. SPIE 3578, Influence of thermal substrate properties on the damage threshold of UV coatings, 0000 (7 April 1999); doi: 10.1117/12.344387
Materials and Measurements
Proc. SPIE 3578, Laser-induced damage threshold of optical components for high-repetition-rate Nd:YAG lasers, 0000 (7 April 1999); doi: 10.1117/12.344388
Proc. SPIE 3578, Measurement of optical absorptance according to ISO 11551: parallel round-robin test at 10.6 um, 0000 (7 April 1999); doi: 10.1117/12.344389
Proc. SPIE 3578, Total scatter measurements in the DUV/VUV, 0000 (7 April 1999); doi: 10.1117/12.344390
Fundamental Mechanisms
Proc. SPIE 3578, Finite element thermal analysis of multispectral coatings for the ABL, 0000 (7 April 1999); doi: 10.1117/12.344391
Surfaces and Mirrors
Proc. SPIE 3578, Ultraprecision grinding of potassium dihydrogen phosphate crystals for getting optical surfaces (Abstract Only), 0000 (7 April 1999); doi: 10.1117/12.344392
Fundamental Mechanisms
Proc. SPIE 3578, Thermomechanical model of mirror laser damage at 1.06 um: I. Nodule ejection, 0000 (7 April 1999); doi: 10.1117/12.344394
Proc. SPIE 3578, Thermomechanical model of mirror laser damage at 1.06 um: II. Flat bottom pits formation, 0000 (7 April 1999); doi: 10.1117/12.344395
Proc. SPIE 3578, Combining optical and thermal stresses in multiple-shot laser experiments, 0000 (7 April 1999); doi: 10.1117/12.344396
Proc. SPIE 3578, New approach for the critical size of nodular defects: the mechanical connection, 0000 (7 April 1999); doi: 10.1117/12.344397
Materials and Measurements
Proc. SPIE 3578, Beam characterization: application to the laser damage threshold, 0000 (7 April 1999); doi: 10.1117/12.344398
Fundamental Mechanisms
Proc. SPIE 3578, Automatic YAG damage test benches: additional possibilities, 0000 (7 April 1999); doi: 10.1117/12.344399
Proc. SPIE 3578, Experimenting with spatial and temporal profiles for the YAG laser damage threshold, 0000 (7 April 1999); doi: 10.1117/12.344400
Thin Films
Proc. SPIE 3578, 1.06-um laser irradiation on high-reflection coatings inside a scanning electron microscope, 0000 (7 April 1999); doi: 10.1117/12.344401
Materials and Measurements
Proc. SPIE 3578, Observation of photoexcited emission clusters in the bulk of KDP and laser conditioning under 355-nm irradiation, 0000 (7 April 1999); doi: 10.1117/12.344402
Thin Films
Proc. SPIE 3578, Laser damage in multispectral optical coatings for the ABL, 0000 (7 April 1999); doi: 10.1117/12.344403
Surfaces and Mirrors
Proc. SPIE 3578, Improvement of laser-induced surface damage in UV optics by ion beam etching (CsLiB6O10 and fused silica), 0000 (7 April 1999); doi: 10.1117/12.344405
Materials and Measurements
Proc. SPIE 3578, Laser-induced damage of photo-thermo-refractive glasses for optical holographic element writing, 0000 (7 April 1999); doi: 10.1117/12.344406
Proc. SPIE 3578, How small stresses affect 351-nm damage onset in fused silica, 0000 (7 April 1999); doi: 10.1117/12.344407
Fundamental Mechanisms
Proc. SPIE 3578, Theoretical modeling of laser-matter interaction in spatial filter pinholes for high-energy pulsed lasers, 0000 (7 April 1999); doi: 10.1117/12.344408
Surfaces and Mirrors
Proc. SPIE 3578, Polishing of fiber optics in the manufacturing environment, 0000 (7 April 1999); doi: 10.1117/12.344409
Materials and Measurements
Proc. SPIE 3578, National round-robin test on laser induced damage at 1.064 um: revised data reduction and correlation analysis, 0000 (7 April 1999); doi: 10.1117/12.344410
Surfaces and Mirrors
Proc. SPIE 3578, Effects of accelerated aging on fiber damage thresholds, 0000 (7 April 1999); doi: 10.1117/12.344411
Materials and Measurements
Proc. SPIE 3578, Effects of wet etch processing on laser-induced damage of fused silica surfaces, 0000 (7 April 1999); doi: 10.1117/12.344412
Fundamental Mechanisms
Proc. SPIE 3578, Extrapolation of damage test data to predict performance of large-area NIF optics at 355 nm, 0000 (7 April 1999); doi: 10.1117/12.344413
Materials and Measurements
Proc. SPIE 3578, Laser damage performance of fused silica optical components measured on the beamlet laser at 351 nm, 0000 (7 April 1999); doi: 10.1117/12.344415
Proc. SPIE 3578, Crack propagation in fused silica during UV and IR nanosecond-laser illumination, 0000 (7 April 1999); doi: 10.1117/12.344416
Fundamental Mechanisms
Proc. SPIE 3578, Current 3-omega large optic test procedures and data analysis for the quality assurance of National Ignition Facility optics, 0000 (7 April 1999); doi: 10.1117/12.344417
Surfaces and Mirrors
Proc. SPIE 3578, Defect characterization on superpolished fused silica surfaces polished for high-power-laser applications at 355 nm (Abstract Only), 0000 (7 April 1999); doi: 10.1117/12.344418
Thin Films
Proc. SPIE 3578, Laser conditioning methods of hafnia-silica multilayer mirrors, 0000 (7 April 1999); doi: 10.1117/12.344419
Proc. SPIE 3578, Role of starting material composition in interfacial damage morphology of hafnia-silica multilayer coatings, 0000 (7 April 1999); doi: 10.1117/12.344420
Surfaces and Mirrors
Proc. SPIE 3578, Laser-induced damage of absorbing and diffusing glass surfaces under IR and UV irradiation, 0000 (7 April 1999); doi: 10.1117/12.344421
Proc. SPIE 3578, Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings, 0000 (7 April 1999); doi: 10.1117/12.344422
Materials and Measurements
Proc. SPIE 3578, Single-beam photothermal microscopy: a new diagnostic tool for optical materials, 0000 (7 April 1999); doi: 10.1117/12.344423