OPTOELECTRONICS '99 - INTEGRATED OPTOELECTRONIC DEVICES
23-29 January 1999
San Jose, CA, United States
Laser Nanotechnology
Proc. SPIE 3618, Interferometric lithography for nanoscale fabrication, 0000 (15 July 1999); doi: 10.1117/12.352681
Proc. SPIE 3618, Optical nanoprobes for SNOM based on laser technology, 0000 (15 July 1999); doi: 10.1117/12.352709
Fundamental Processes and Diagnostics of Laser Ablation
Proc. SPIE 3618, Laser-induced electronic bond breaking and structural changes on semiconductor surfaces, 0000 (15 July 1999); doi: 10.1117/12.352723
Proc. SPIE 3618, Pulse-width influence on laser-induced desorption of positive ions from ionic solids, 0000 (15 July 1999); doi: 10.1117/12.352727
Proc. SPIE 3618, Mechanistic studies and applications of laser-induced desorption from metal surfaces, 0000 (15 July 1999); doi: 10.1117/12.352728
Proc. SPIE 3618, Direct mesoscopic simulation of melting and evaporation, 0000 (15 July 1999); doi: 10.1117/12.352672
Proc. SPIE 3618, Optical detection of laser plasma interaction during laser ablation, 0000 (15 July 1999); doi: 10.1117/12.352673
Ultra-Short Pulse Laser Processing
Proc. SPIE 3618, Vibrational excitation and relaxation processes in insulators initiated by ultrashort mid-infrared laser pulses, 0000 (15 July 1999); doi: 10.1117/12.352674
Proc. SPIE 3618, Material processing of dielectrics with femtosecond lasers, 0000 (15 July 1999); doi: 10.1117/12.352675
Proc. SPIE 3618, Micromachining with ultrashort laser pulses, 0000 (15 July 1999); doi: 10.1117/12.352676
Laser-Induced Modification of Surface and Sub-Surface Properties of Materials
Proc. SPIE 3618, Photoinduced and grating alignment of polyimide using excimer lasers for liquid crystal displays, 0000 (15 July 1999); doi: 10.1117/12.352677
Proc. SPIE 3618, Three-dimensional microscopic modifications in glasses by a femtosecond laser, 0000 (15 July 1999); doi: 10.1117/12.352678
Proc. SPIE 3618, Fiber Bragg grating writing by interferometric or phase mask methods using high-power excimer lasers, 0000 (15 July 1999); doi: 10.1117/12.352679
Proc. SPIE 3618, Modification in optical fibers using high-intensity femtosecond lasers, 0000 (15 July 1999); doi: 10.1117/12.352680
Proc. SPIE 3618, Laser-induced nonthermal surface modification of aluminum, 0000 (15 July 1999); doi: 10.1117/12.352682
Proc. SPIE 3618, Semiconductor laser array fabricated by Nd:YAG laser-induced quantum well intermixing, 0000 (15 July 1999); doi: 10.1117/12.352683
Proc. SPIE 3618, Time- and space-resolved imaging and numerical simulation of laser zone texturing of Ni-P disk substrates, 0000 (15 July 1999); doi: 10.1117/12.352684
Proc. SPIE 3618, Thermal and optical properties of semitransparent ceramics: laser-induced high-temperature modifications, 0000 (15 July 1999); doi: 10.1117/12.352685
Innovative Laser Technology for Industrial Applications
Proc. SPIE 3618, Laser applications in the electronics and optoelectronics industry in Japan, 0000 (15 July 1999); doi: 10.1117/12.352686
Proc. SPIE 3618, Advanced-laser processing of photonic and microelectronic components at Photonics Research Ontario, 0000 (15 July 1999); doi: 10.1117/12.352687
Proc. SPIE 3618, Excimer laser micromachining: a 15-year perspective, 0000 (15 July 1999); doi: 10.1117/12.352688
Proc. SPIE 3618, Laser welding of functional and constructional ceramics for microelectronics, 0000 (15 July 1999); doi: 10.1117/12.352689
Laser Surface Cleaning and Crystallization
Proc. SPIE 3618, Laser surface cleaning of electronic materials, 0000 (15 July 1999); doi: 10.1117/12.352690
Proc. SPIE 3618, Excimer laser cleaning for microelectronics: modeling, applications, and challenges, 0000 (15 July 1999); doi: 10.1117/12.352691
Proc. SPIE 3618, Transient temperature measurement of amorphous silicon thin films during excimer laser annealing, 0000 (15 July 1999); doi: 10.1117/12.352692
Proc. SPIE 3618, Correlation between power density fluctuation and grain size distribution of laser-annealed polycrystalline silicon, 0000 (15 July 1999); doi: 10.1117/12.352693
Proc. SPIE 3618, Lattice strain in excimer-laser-crystallized poly-Si thin films, 0000 (15 July 1999); doi: 10.1117/12.352694
Laser Microfabrication and Micromachining
Proc. SPIE 3618, Laser direct writing of circuit elements and sensors, 0000 (15 July 1999); doi: 10.1117/12.352695
Proc. SPIE 3618, Microstructuring of materials by pulsed-laser focusing and projection technique, 0000 (15 July 1999); doi: 10.1117/12.352696
Proc. SPIE 3618, High-accuracy micromachining of ceramics by frequency-tripled Nd:YAG lasers, 0000 (15 July 1999); doi: 10.1117/12.352697
Proc. SPIE 3618, UV laser ablation of ultrathin dielectric layers, 0000 (15 July 1999); doi: 10.1117/12.352698
Proc. SPIE 3618, Micromachining of glass materials by laser-induced plasma-assisted ablation (LIPAA) using a conventional nanosecond laser, 0000 (15 July 1999); doi: 10.1117/12.352699
Novel Methods and New Tools for Photon Processing
Proc. SPIE 3618, Overview of the user program for the Jefferson Lab free-electron laser, 0000 (15 July 1999); doi: 10.1117/12.352700
Proc. SPIE 3618, High-power ultraviolet all-solid-state laser for industrial applications, 0000 (15 July 1999); doi: 10.1117/12.352701
Proc. SPIE 3618, Efficiency increase for laser structuring using mask projection, 0000 (15 July 1999); doi: 10.1117/12.352702
Pulsed Laser Deposition, Nanoclusters, Trybological and Diamond Films
Proc. SPIE 3618, Condensation of vapor and nanoclusters formation within the vapor plume produced by nanosecond laser ablation of Si, Ge, and C, 0000 (15 July 1999); doi: 10.1117/12.352703
Proc. SPIE 3618, Pulsed laser deposition of nanocomposite thin films for photonic applications, 0000 (15 July 1999); doi: 10.1117/12.352704
Proc. SPIE 3618, Semiconductor nanocrystallite formation using inert gas ambient pulsed laser ablation and its application to light-emitting devices, 0000 (15 July 1999); doi: 10.1117/12.352705
Proc. SPIE 3618, Advances in pulsed laser deposition growth of nitride thin films, 0000 (15 July 1999); doi: 10.1117/12.352706
Proc. SPIE 3618, Pulsed laser deposition of high-quality tribological coatings, 0000 (15 July 1999); doi: 10.1117/12.352707
Proc. SPIE 3618, Pulsed-laser-deposited amorphous diamond and related materials: synthesis, characterization, and field emission properties, 0000 (15 July 1999); doi: 10.1117/12.352708
Fundamental Processes and Diagnostics of Laser Ablation
Proc. SPIE 3618, Emission spectra and particle ejection during visible laser ablation of graphite for diamondlike coatings, 0000 (15 July 1999); doi: 10.1117/12.352710
Laser Nanotechnology
Proc. SPIE 3618, Atom projector: basic concept, construction, and applications, 0000 (15 July 1999); doi: 10.1117/12.352711
Ultra-Short Pulse Laser Processing
Proc. SPIE 3618, Second harmonic of Ti:sapphire femtosecond laser as a possible tool for pointlike 3D optical information recording, 0000 (15 July 1999); doi: 10.1117/12.352712
Laser-Induced Modification of Surface and Sub-Surface Properties of Materials
Proc. SPIE 3618, Laser texturing processes by reflected light detection, 0000 (15 July 1999); doi: 10.1117/12.352713
Proc. SPIE 3618, Fabrication of true 3D microstructures in glass/ceramic materials by pulsed UV laser volumetric exposure techniques, 0000 (15 July 1999); doi: 10.1117/12.352714
Innovative Laser Technology for Industrial Applications
Proc. SPIE 3618, Concurrent in-line inspection system for CO2 laser drilling machine, 0000 (15 July 1999); doi: 10.1117/12.352715
Laser Microfabrication and Micromachining
Proc. SPIE 3618, Laser direct dry etching of GaAs/AIGaAs multilayer, 0000 (15 July 1999); doi: 10.1117/12.352716
Proc. SPIE 3618, Maskless laser-induced deposition of Cu film patterns from copper formate, 0000 (15 July 1999); doi: 10.1117/12.352717
Novel Methods and New Tools for Photon Processing
Proc. SPIE 3618, Electrical and optical properties of ITO films deposited by excimer-laser-assisted EB method, 0000 (15 July 1999); doi: 10.1117/12.352718
Proc. SPIE 3618, Reliability and lifetime of UV excilamps pumped by glow, barrier, and capacitive discharges, 0000 (15 July 1999); doi: 10.1117/12.352719
Fundamental Processes and Diagnostics of Laser Ablation
Proc. SPIE 3618, Spectroscopic energy characterization of laser-induced titanium plume, 0000 (15 July 1999); doi: 10.1117/12.352720
Pulsed Laser Deposition, Nanoclusters, Trybological and Diamond Films
Proc. SPIE 3618, Pulsed laser deposition of Ti:sapphire thin films using high-speed rotating target, 0000 (15 July 1999); doi: 10.1117/12.352721
Proc. SPIE 3618, Crystallinities and light-emitting properties of nanostructured SiGe alloy prepared by pulsed laser ablation in inert background gases, 0000 (15 July 1999); doi: 10.1117/12.352722
Proc. SPIE 3618, Properties of boron-carbon-nitrogen ternary thin films synthesized by pulsed laser deposition, 0000 (15 July 1999); doi: 10.1117/12.352724
Laser-Induced Modification of Surface and Sub-Surface Properties of Materials
Proc. SPIE 3618, Planarization of hexagonal-GaN(0001) by KrF excimer-laser ablation followed by hydrochloric acid treatment, 0000 (15 July 1999); doi: 10.1117/12.352725
Novel Methods and New Tools for Photon Processing
Proc. SPIE 3618, Microstructuring with 157-nm laser light, 0000 (15 July 1999); doi: 10.1117/12.352726