PROCEEDINGS VOLUME 3626
OPTOELECTRONICS '99 - INTEGRATED OPTOELECTRONIC DEVICES | 23-29 JANUARY 1999
Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV
OPTOELECTRONICS '99 - INTEGRATED OPTOELECTRONIC DEVICES
23-29 January 1999
San Jose, CA, United States
Sensing and Measurement Applications
Proc. SPIE 3626, Fringe locking in a laser diode interferometer in the presence of current modulation, 0000 (14 April 1999); doi: 10.1117/12.345437
Proc. SPIE 3626, Novel optical vibration sensor using external cavity feedback, 0000 (14 April 1999); doi: 10.1117/12.345438
Proc. SPIE 3626, Simple device to measure laser mirror parameters, 0000 (14 April 1999); doi: 10.1117/12.345439
Proc. SPIE 3626, Laser diode applications for contamination control in microelectronics fabrication processes, 0000 (14 April 1999); doi: 10.1117/12.345440
Proc. SPIE 3626, Phase change induced in laser diode interferometric system for measurements with optical fiber in composite material, 0000 (14 April 1999); doi: 10.1117/12.345413
Proc. SPIE 3626, AMCW laser rangefinder for machine vision using two modulation frequencies for wide measurement range and high resolution, 0000 (14 April 1999); doi: 10.1117/12.345414
Proc. SPIE 3626, Fast tunable diode laser with digital control and multiple line selection, 0000 (14 April 1999); doi: 10.1117/12.345415
Illumination, Displays, and Printing
Proc. SPIE 3626, Potential impact of laser illumination on light-valve-based projection displays, 0000 (14 April 1999); doi: 10.1117/12.345416
Proc. SPIE 3626, High-brightness multilaser source, 0000 (14 April 1999); doi: 10.1117/12.345417
Proc. SPIE 3626, Densely packed surface-emitting laser arrays for printing applications, 0000 (14 April 1999); doi: 10.1117/12.345418
Packaging and Testing of Semiconductor Lasers I
Proc. SPIE 3626, Die-bonding study for double-channel ridge waveguide AlGaInP laser diodes, 0000 (14 April 1999); doi: 10.1117/12.345419
Proc. SPIE 3626, Almost temperature-insensitive characteristics in 1.06-um InGaAs laser diodes with strain-compensating electron-barrier layers, 0000 (14 April 1999); doi: 10.1117/12.345420
Proc. SPIE 3626, Semiconductor laser linewidth measurements for space interferometry applications, 0000 (14 April 1999); doi: 10.1117/12.345421
Proc. SPIE 3626, Hermetic diode laser transmitter module, 0000 (14 April 1999); doi: 10.1117/12.345422
Packaging and Testing of Semiconductor Lasers II
Proc. SPIE 3626, Alignment-tolerant structures for ease of optoelectronic packaging, 0000 (14 April 1999); doi: 10.1117/12.345423
Proc. SPIE 3626, Direct spectroscopic measurement of packaging-induced strains in high-power laser diode arrays, 0000 (14 April 1999); doi: 10.1117/12.345424
Proc. SPIE 3626, Surface-mount-type LD module, 0000 (14 April 1999); doi: 10.1117/12.345425
Proc. SPIE 3626, Four-wave mixing in a semiconductor optical amplifier, 0000 (14 April 1999); doi: 10.1117/12.345426
Proc. SPIE 3626, Semiconductor laser diode array characterization by means of field intensity measurements, 0000 (14 April 1999); doi: 10.1117/12.345427
Proc. SPIE 3626, Ceramic-metal composites as a solution for high-performance semiconductor laser packaging, 0000 (14 April 1999); doi: 10.1117/12.345428
Testing and Reliability of Semiconductor Lasers I
Proc. SPIE 3626, Grating coupled surface emitters: integrated lasers, amplifiers, and beam shaping outcouplers, 0000 (14 April 1999); doi: 10.1117/12.345429
Proc. SPIE 3626, Characterization of laser diodes for analog parallel optical links, 0000 (14 April 1999); doi: 10.1117/12.345430
Proc. SPIE 3626, Spectral mapping of multimode vertical-cavity surface-emitting lasers by near-field scanning optical microscopy, 0000 (14 April 1999); doi: 10.1117/12.345431
Proc. SPIE 3626, Reliability and degradation mechanisms of high-power diode lasers, 0000 (14 April 1999); doi: 10.1117/12.345432
Testing and Reliability of Semiconductor Lasers II
Proc. SPIE 3626, Laterally oxidized vertical-cavity lasers with stable polarization, 0000 (14 April 1999); doi: 10.1117/12.345433
Proc. SPIE 3626, Characteristics and reliability of high-power InGaAs/AlGaAs laser diodes with decoupled confinement heterostructure, 0000 (14 April 1999); doi: 10.1117/12.345434
Proc. SPIE 3626, Packaging of electrically switchable tunable tapered lasers, 0000 (14 April 1999); doi: 10.1117/12.345435
Proc. SPIE 3626, New methodology for measuring highly aberrated wavefronts induced by diffractive optical elements, 0000 (14 April 1999); doi: 10.1117/12.345436
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