PROCEEDINGS VOLUME 3636
ELECTRONIC IMAGING '99 | 23-29 JANUARY 1999
Flat Panel Display Technology and Display Metrology
ELECTRONIC IMAGING '99
23-29 January 1999
San Jose, CA, United States
Active-Matrix Backplanes and Light Modulators
Proc. SPIE 3636, Polycrystalline thin-film transistors on plastic substrates, 0000 (12 April 1999); doi: 10.1117/12.344632
Proc. SPIE 3636, Front panel engineering with CAD simulation tool, 0000 (12 April 1999); doi: 10.1117/12.344641
Proc. SPIE 3636, VGA active-matrix OLED displays having the single polysilicon TFT pixel structure, 0000 (12 April 1999); doi: 10.1117/12.344648
Proc. SPIE 3636, Compliant substrates for thin-film transistor backplanes, 0000 (12 April 1999); doi: 10.1117/12.344653
Proc. SPIE 3636, High-resolution direct-view displays based on the biological photochromic material bacteriorhodopsin, 0000 (12 April 1999); doi: 10.1117/12.344654
Proc. SPIE 3636, Diffractive color separation filter for high-efficiency LCD panels, 0000 (12 April 1999); doi: 10.1117/12.344655
Proc. SPIE 3636, Scanner design and resolution trade-offs for miniature scanning displays, 0000 (12 April 1999); doi: 10.1117/12.344656
Proc. SPIE 3636, Surface plasmon tunable filters and flat panel display device, 0000 (12 April 1999); doi: 10.1117/12.344657
Emissive Materials
Proc. SPIE 3636, Thin-film EL phosphor development, 0000 (12 April 1999); doi: 10.1117/12.344658
Proc. SPIE 3636, Trap states in electroluminescent SrS:Cu phosphor thin films using thermally stimulated luminescence, 0000 (12 April 1999); doi: 10.1117/12.344633
Proc. SPIE 3636, Protectively coated phosphors, 0000 (12 April 1999); doi: 10.1117/12.344634
Proc. SPIE 3636, Highly efficient phosphors and phospher screens for FED displays, 0000 (12 April 1999); doi: 10.1117/12.344635
Proc. SPIE 3636, Development of standards for characterization of cathodoluminescence efficiency, 0000 (12 April 1999); doi: 10.1117/12.344636
Proc. SPIE 3636, Nanocrystalline phosphors for field emission displays, 0000 (12 April 1999); doi: 10.1117/12.344637
Field Emission Displays
Proc. SPIE 3636, Thin CRT display design and performance, 0000 (12 April 1999); doi: 10.1117/12.344638
Proc. SPIE 3636, Low-voltage vertical multilayer thin-film-edge FEA for field emitter displays, 0000 (12 April 1999); doi: 10.1117/12.344639
Proc. SPIE 3636, Flashover performance of thin-wall spacers in field emission displays, 0000 (12 April 1999); doi: 10.1117/12.344640
Standards, Calibrations, and New Measurement Implementations
Proc. SPIE 3636, Color calibration of liquid crystal displays, 0000 (12 April 1999); doi: 10.1117/12.344642
Proc. SPIE 3636, NIST calibration facility for display colorimeters, 0000 (12 April 1999); doi: 10.1117/12.344643
Proc. SPIE 3636, LCD visual performance: characterization and evaluation, 0000 (12 April 1999); doi: 10.1117/12.344644
Proc. SPIE 3636, Simulated-eye-design camera for high-contrast measurements, 0000 (12 April 1999); doi: 10.1117/12.344645
Proc. SPIE 3636, New uniformity measurement method for LCD panels, 0000 (12 April 1999); doi: 10.1117/12.344646
Characterization of Degradation Factors
Proc. SPIE 3636, Measurement and digital compensation of cross talk and photoleakage in high-resolution TFT LCDs, 0000 (12 April 1999); doi: 10.1117/12.344647
Proc. SPIE 3636, Degradation of the reproduction of the high-order sensation caused by halation, 0000 (12 April 1999); doi: 10.1117/12.344649
Proc. SPIE 3636, Time-domain flicker measurement technique, 0000 (12 April 1999); doi: 10.1117/12.344650
Proc. SPIE 3636, Stray light elimination in making projection display measurements, 0000 (12 April 1999); doi: 10.1117/12.344651
Proc. SPIE 3636, NIST display interface testbed: the development of a centrally controlled testing system for the automated generation of stimuli and control feedback, 0000 (12 April 1999); doi: 10.1117/12.344652
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