PROCEEDINGS VOLUME 3739
OPTICAL SYSTEMS DESIGN AND PRODUCTION | 26-29 MAY 1999
Optical Fabrication and Testing
OPTICAL SYSTEMS DESIGN AND PRODUCTION
26-29 May 1999
Berlin, Germany
Fabrication I
Proc. SPIE 3739, Aspheric optics at different quality levels and functional need, 0000 (6 September 1999); doi: 10.1117/12.360130
Proc. SPIE 3739, Approach for axisymmetrical asphere polishing with full-area tools, 0000 (6 September 1999); doi: 10.1117/12.360140
Proc. SPIE 3739, REOSC contribution to VLT and Gemini, 0000 (6 September 1999); doi: 10.1117/12.360150
Proc. SPIE 3739, Polishing of a 6.5-m f/1.25 mirror for the first Magellan telescope, 0000 (6 September 1999); doi: 10.1117/12.360161
Proc. SPIE 3739, Fabrication and test of high-performance wide-angle lens assemblies for ocean color monitor, 0000 (6 September 1999); doi: 10.1117/12.360176
Proc. SPIE 3739, Polishing and testing laser amplifier disks and spatial filtering lenses for the LIL-LMJ, 0000 (6 September 1999); doi: 10.1117/12.360188
Fabrication II
Proc. SPIE 3739, Fluid jet polishing: removal process analysis, 0000 (6 September 1999); doi: 10.1117/12.360189
Proc. SPIE 3739, Precision optics manufacturing using magnetorheological finishing (MRF), 0000 (6 September 1999); doi: 10.1117/12.360131
Proc. SPIE 3739, Banana technology, 0000 (6 September 1999); doi: 10.1117/12.360132
Proc. SPIE 3739, Manufacturing and applications of nonrotationally symmetric optics, 0000 (6 September 1999); doi: 10.1117/12.360133
Proc. SPIE 3739, Cylindrical "allipse", 0000 (6 September 1999); doi: 10.1117/12.360134
Proc. SPIE 3739, Manufacture of optical components under statistical process control, 0000 (6 September 1999); doi: 10.1117/12.360135
Ion Beams
Proc. SPIE 3739, Ion beam figuring of small BK7 and Zerodur optics: thermal effects, 0000 (6 September 1999); doi: 10.1117/12.360136
Proc. SPIE 3739, Figuring sequences on a supersmooth sample using ion beam technique, 0000 (6 September 1999); doi: 10.1117/12.360137
Proc. SPIE 3739, Ion beam figuring of SiC mirrors provides ultimate WFE performances for any type of telescope, 0000 (6 September 1999); doi: 10.1117/12.360138
Proc. SPIE 3739, High-precision cylindrical and quasi-cylindrical aspherization of small surfaces by ion beam figuring, 0000 (6 September 1999); doi: 10.1117/12.360139
Proc. SPIE 3739, Large optics ion figuring, 0000 (6 September 1999); doi: 10.1117/12.360141
Proc. SPIE 3739, Reactive ion beam etching: a fabrication process for the figuring of precision aspheric optical surfaces in fused silica, 0000 (6 September 1999); doi: 10.1117/12.360142
Micro-optics Fabrication
Proc. SPIE 3739, Realization of fabricating microlens array in mass production, 0000 (6 September 1999); doi: 10.1117/12.360143
Proc. SPIE 3739, Excimer laser fabrication and optical properties of polymer prismatic microstructures, 0000 (6 September 1999); doi: 10.1117/12.360144
Proc. SPIE 3739, Fabrication of surface gratings in GaAs and AlGaAs by electron beam lithography and chemically assisted ion beam etching, 0000 (6 September 1999); doi: 10.1117/12.360145
Proc. SPIE 3739, High-precision micro-optic elements by wafer-scale replication on arbitrary substrates, 0000 (6 September 1999); doi: 10.1117/12.360146
Proc. SPIE 3739, Micro-optical silicon elements fabricated by wet chemical etching, 0000 (6 September 1999); doi: 10.1117/12.360147
Proc. SPIE 3739, Manufacturing microcomponents for optical information technology using the LIGA technique, 0000 (6 September 1999); doi: 10.1117/12.360148
Testing I
Proc. SPIE 3739, XMM x-ray mirrors: metrology and optical performance, 0000 (6 September 1999); doi: 10.1117/12.360149
Proc. SPIE 3739, Phase-step calibration, 0000 (6 September 1999); doi: 10.1117/12.360151
Proc. SPIE 3739, Measuring the absolute planarity of test plates with a modified Fritz's method, 0000 (6 September 1999); doi: 10.1117/12.360152
Proc. SPIE 3739, Stitching interferometry: how and why it works, 0000 (6 September 1999); doi: 10.1117/12.360153
Proc. SPIE 3739, Novel scanning technique for ultraprecise measurement of slope and topography of flats, aspheres, and complex surfaces, 0000 (6 September 1999); doi: 10.1117/12.360154
Proc. SPIE 3739, Optical figure testing by scanning deflectometry, 0000 (6 September 1999); doi: 10.1117/12.360155
Proc. SPIE 3739, Application of a deflectometry method to deep aspheric ophthalmic surface testing, 0000 (6 September 1999); doi: 10.1117/12.360156
Testing II
Proc. SPIE 3739, XMM flight model mirror effective area measurements, 0000 (6 September 1999); doi: 10.1117/12.360157
Proc. SPIE 3739, Metrological challenges of synchrotron radiation optics, 0000 (6 September 1999); doi: 10.1117/12.360158
Proc. SPIE 3739, Critical aspects of testing aspheres in interferometric setups, 0000 (6 September 1999); doi: 10.1117/12.360159
Proc. SPIE 3739, Testing of the Gemini secondary mirrors, 0000 (6 September 1999); doi: 10.1117/12.360160
Proc. SPIE 3739, Testing large plane mirrors with the Ritchey-Common test in two angular positions, 0000 (6 September 1999); doi: 10.1117/12.360162
Proc. SPIE 3739, Interferometric method for testing focal lengths using a digital Fourier transform, 0000 (6 September 1999); doi: 10.1117/12.360163
Proc. SPIE 3739, Testing of off-axis parabola by holo-shear lens, 0000 (6 September 1999); doi: 10.1117/12.360164
Textures
Proc. SPIE 3739, Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods, 0000 (6 September 1999); doi: 10.1117/12.360165
Proc. SPIE 3739, Wide-scale surface characterization by combination of scanning force microscopy, white light interferometry, and light scattering, 0000 (6 September 1999); doi: 10.1117/12.360166
Proc. SPIE 3739, Minideflectometer for measuring optical finish quality, 0000 (6 September 1999); doi: 10.1117/12.360167
Proc. SPIE 3739, Surface roughness and subsurface damage characterization of fused silica substrates, 0000 (6 September 1999); doi: 10.1117/12.360168
Proc. SPIE 3739, Metrology of precision optical surfaces and laser mirrors: I, 0000 (6 September 1999); doi: 10.1117/12.360169
Poster Session I
Proc. SPIE 3739, Using a design of experiment method to improve KDP crystal machining process, 0000 (6 September 1999); doi: 10.1117/12.360170
Proc. SPIE 3739, X-ray study of concave surface roughness, 0000 (6 September 1999); doi: 10.1117/12.360171
Proc. SPIE 3739, Centering of optical components by using stick-slip effect, 0000 (6 September 1999); doi: 10.1117/12.360172
Generic Issues in Specifications and Tolerancing
Proc. SPIE 3739, SLIOS: a contribution to standard procedures in stray light measurements, 0000 (6 September 1999); doi: 10.1117/12.360173
Proc. SPIE 3739, New statistical approach for design optimization and performance assessment of spaceborne optical systems, 0000 (6 September 1999); doi: 10.1117/12.360174
Tolerancing
Proc. SPIE 3739, Design, tolerancing, and certification of a null corrector to test 8.4-m mirrors, 0000 (6 September 1999); doi: 10.1117/12.360175
Proc. SPIE 3739, Laser megajoule optics: I. New methods of optical specification, 0000 (6 September 1999); doi: 10.1117/12.360177
Proc. SPIE 3739, Laser megajoule optics: II. Wavefront analysis in the testing of large components, 0000 (6 September 1999); doi: 10.1117/12.360178
Optical Surface Assessment
Proc. SPIE 3739, Evaluation of rotational symmetric surface deviations by means of average radial profile, 0000 (6 September 1999); doi: 10.1117/12.360179
Proc. SPIE 3739, Optical surface assessment: parametric characterization of imperfections, 0000 (6 September 1999); doi: 10.1117/12.360180
Standards and Specifications
Proc. SPIE 3739, Recent progress in optical standards with particular reference to those for electronic exchange of optical data, 0000 (6 September 1999); doi: 10.1117/12.360181
Proc. SPIE 3739, Interferometric optical testing: considerations for the proposed new international standard, 0000 (6 September 1999); doi: 10.1117/12.360182
Proc. SPIE 3739, Experimental measurements for passive athermalization of a satelliteborne MWIR telescope including dn/dT, CTE, and final evaluation, 0000 (6 September 1999); doi: 10.1117/12.360183
Poster Session II
Proc. SPIE 3739, Analytical criteria for cosmetic tolerancing of optical surfaces in the infrared system, 0000 (6 September 1999); doi: 10.1117/12.360184
Proc. SPIE 3739, High-definition illuminated table for optical testing, 0000 (6 September 1999); doi: 10.1117/12.360185
Proc. SPIE 3739, Interferometric signal and image processing by autoconvolution method, 0000 (6 September 1999); doi: 10.1117/12.360186