Optical Interferometry: Analysis
Proc. SPIE 3740, Laser diode phase-shifting interferometer operating at a frame rate, 0000 (7 May 1999); doi: 10.1117/12.347703
Proc. SPIE 3740, Improved phase unwrapping of a phase-shift interferometer using a precision XY-scanner, 0000 (7 May 1999); doi: 10.1117/12.347772
Proc. SPIE 3740, White light phase-shifting interferometry with self-compensation of PZT scanning errors, 0000 (7 May 1999); doi: 10.1117/12.347782
Optical Interferometry: Low Coherence
Proc. SPIE 3740, High-sensitivity surface measurements by a heterodyne white-light interferometer, 0000 (7 May 1999); doi: 10.1117/12.347802
Proc. SPIE 3740, Practical measurement system for determination of refractive index and thickness using low-coherence interferometry, 0000 (7 May 1999); doi: 10.1117/12.347811
Proc. SPIE 3740, Wavelength scanning confocal interference microscope for separate measurement of refractive index and geometrical thickness, 0000 (7 May 1999); doi: 10.1117/12.347819
Proc. SPIE 3740, Dispersive coherence spectrotomography of a layered medium, 0000 (7 May 1999); doi: 10.1117/12.347829
Optical Interferometry: Polarization
Proc. SPIE 3740, Measurements of the effective optical constants and the flying height of read-write sliders by heterodyne inteferometry, 0000 (7 May 1999); doi: 10.1117/12.347839
Proc. SPIE 3740, Referenced polarization imaging for surface displacement measurements, 0000 (7 May 1999); doi: 10.1117/12.347704
Proc. SPIE 3740, Birefringence measurement by scattered light method with a phase-shifting technique, 0000 (7 May 1999); doi: 10.1117/12.347713
Proc. SPIE 3740, Heterodyne interferometers using orthogonally polarized and two-frequency shifted light sources with superhigh extinction ratio, 0000 (7 May 1999); doi: 10.1117/12.347720
Optical Interferometry: Deformation Measurement I
Proc. SPIE 3740, Combined measurement of shape and deformation of microcomponents by holographic interferometry and multiple-wavelength contouring, 0000 (7 May 1999); doi: 10.1117/12.347730
Proc. SPIE 3740, Adaptive speckle pattern interferometry, 0000 (7 May 1999); doi: 10.1117/12.347739
Proc. SPIE 3740, Stereovision setup for accurate 3D deformation measurements, 0000 (7 May 1999); doi: 10.1117/12.347750
Proc. SPIE 3740, Industrial applications of residual stress determination using 2D in-plane sensitive fiber ESPI and hole drilling, 0000 (7 May 1999); doi: 10.1117/12.347761
Optical Interferometry: Deformation Measurement II
Proc. SPIE 3740, Whole-field speckle strain sensor, 0000 (7 May 1999); doi: 10.1117/12.347769
Proc. SPIE 3740, Laser speckle interferometry for welding inspection, 0000 (7 May 1999); doi: 10.1117/12.347770
Proc. SPIE 3740, Measurement for thickness variation of a latex membrane by ESPI method, 0000 (7 May 1999); doi: 10.1117/12.347771
Optical Interferometry and Moire Techniques
Proc. SPIE 3740, Sinusoidal phase-modulating laser diode interferometer using photothermal modulation, 0000 (7 May 1999); doi: 10.1117/12.347774
Proc. SPIE 3740, Direct distributed velocity sensing using a low-coherence interferometer, 0000 (7 May 1999); doi: 10.1117/12.347775
Proc. SPIE 3740, Optoelectronic interferometric vibration sensor, 0000 (7 May 1999); doi: 10.1117/12.347776
Proc. SPIE 3740, Shadow moire profilometry using a phase-shifting method, 0000 (7 May 1999); doi: 10.1117/12.347777
Proc. SPIE 3740, Three-dimensional surface measurement using grating projection method by detecting phase and contrast, 0000 (7 May 1999); doi: 10.1117/12.347778
Proc. SPIE 3740, Residual stresses in unsymmetric laminated carbon fiber composites, 0000 (7 May 1999); doi: 10.1117/12.347779
Optical Encoders
Proc. SPIE 3740, New error-compensation method in a linear encoder using phase-shifted grating, 0000 (7 May 1999); doi: 10.1117/12.347780
Proc. SPIE 3740, High-performance encoder using the encoder model in a computer, 0000 (7 May 1999); doi: 10.1117/12.347781
Proc. SPIE 3740, Compact optical encoder using modulated-pitch phase grating: suppression of harmonic noise and contrast change, 0000 (7 May 1999); doi: 10.1117/12.347783
Proc. SPIE 3740, Rotation angle measurement using an imaging method, 0000 (7 May 1999); doi: 10.1117/12.347784
Scatterometry
Proc. SPIE 3740, Independent component analysis based on a scatter diagram, 0000 (7 May 1999); doi: 10.1117/12.347785
Proc. SPIE 3740, Ultrasound-assisted optical measurement for observation inside a scattering medium, 0000 (7 May 1999); doi: 10.1117/12.347786
Proc. SPIE 3740, Angular correlation properties of multiply scattered light in random media with buried objects, 0000 (7 May 1999); doi: 10.1117/12.347787
Proc. SPIE 3740, Scattering characteristics of Si3N4 mixture surface under laser illumination, 0000 (7 May 1999); doi: 10.1117/12.347788
Image Processing and Analysis
Proc. SPIE 3740, Global wavefront reconstruction from its image in focal plane and Shack-Hartmann sensor images, 0000 (7 May 1999); doi: 10.1117/12.347789
Proc. SPIE 3740, Plastic-fiber-bundle-based metrology for two-dimension mapping of the dissolution rate of photoresist film, 0000 (7 May 1999); doi: 10.1117/12.347790
Proc. SPIE 3740, Spectrum-enhanced correlator by two-wave mixing in a photorefractive crystal, 0000 (7 May 1999); doi: 10.1117/12.347791
Proc. SPIE 3740, Neural-network-based analysis of photoelastic color using a spectral synthesizer, 0000 (7 May 1999); doi: 10.1117/12.347792
Machine Vision and Environmental Monitoring
Proc. SPIE 3740, Open, intelligent, and scalable optical part-recognition system, 0000 (7 May 1999); doi: 10.1117/12.347793
Proc. SPIE 3740, Using field bus for optical gas monitoring, 0000 (7 May 1999); doi: 10.1117/12.347794
Proc. SPIE 3740, Fiber optic spectrophotometry monitoring of plant nutrient deficiency under hydroponic culture conditions, 0000 (7 May 1999); doi: 10.1117/12.347795
Proc. SPIE 3740, Optical monitoring of the concentration profile of submicron latex particles in flow through a translucent water-permeable tube: demonstration of flow-dependent concentration polarization of plasma, 0000 (7 May 1999); doi: 10.1117/12.347796
Proc. SPIE 3740, Optical remote sensing information modeling for monitoring rural land use, 0000 (7 May 1999); doi: 10.1117/12.347797
Environmental Monitoring
Proc. SPIE 3740, Oxy-fuel combustion emission monitoring using tunable diode laser sensors, 0000 (7 May 1999); doi: 10.1117/12.347798
Proc. SPIE 3740, Spectral measurements of two-dimensional color images, 0000 (7 May 1999); doi: 10.1117/12.347799
Proc. SPIE 3740, Intelligent optical sensor concept: a new approach using interconnecting sensors, 0000 (7 May 1999); doi: 10.1117/12.347800
Proc. SPIE 3740, Remote sensing analysis of surface water in a mining area, 0000 (7 May 1999); doi: 10.1117/12.347801
Diffractive Optics: Design
Proc. SPIE 3740, Planar binary optical see-through visor design, 0000 (7 May 1999); doi: 10.1117/12.347803
Proc. SPIE 3740, Optimization design of diffractive optical elements by genetic local search algorithms, 0000 (7 May 1999); doi: 10.1117/12.347804
Diffractive Optics: Manufacturing
Proc. SPIE 3740, Fabrication of multilevel diffractive elements in SiO2 by electron-beam lithography and proportional etching, 0000 (7 May 1999); doi: 10.1117/12.347805
Proc. SPIE 3740, Electron-beam lithography fabrication of phase holograms to generate Laguerre-Gaussian beams, 0000 (7 May 1999); doi: 10.1117/12.347806
Proc. SPIE 3740, Diffractive optical element array to realize uniform focal spot with any geometrical shape transform, 0000 (7 May 1999); doi: 10.1117/12.347807
Proc. SPIE 3740, Narrowband holographic spectral filters: principles, manufacturing, and applications, 0000 (7 May 1999); doi: 10.1117/12.347808
Diffractive Optics: Applications
Proc. SPIE 3740, Diffractive-optics-based sensor for simultaneous inspection of reflected and transmitted light from porous materials, 0000 (7 May 1999); doi: 10.1117/12.347809
Proc. SPIE 3740, Improvements of quantized kinoform reconstruction by changing the position of the desired image, 0000 (7 May 1999); doi: 10.1117/12.347810
Proc. SPIE 3740, Diffractive optical concentrator for an infrared detector, 0000 (7 May 1999); doi: 10.1117/12.347812
Proc. SPIE 3740, Holographic optical elements with high spectral and angular selectivity, 0000 (7 May 1999); doi: 10.1117/12.347813
Optical Fibers I
Proc. SPIE 3740, Pigtail-type CO laser using As2S3 optical fiber, 0000 (7 May 1999); doi: 10.1117/12.347814
Optical Fibers II
Proc. SPIE 3740, Multipoint detection of an acoustic wave in water with a WDM fiber-Bragg-grating sensor, 0000 (7 May 1999); doi: 10.1117/12.347815
Proc. SPIE 3740, Optical wavelength switch using strain-controlled fiber Bragg gratings, 0000 (7 May 1999); doi: 10.1117/12.347816