PROCEEDINGS VOLUME 3824
INDUSTRIAL LASERS AND INSPECTION (EUROPTO SERIES) | 14-18 JUNE 1999
Optical Measurement Systems for Industrial Inspection
INDUSTRIAL LASERS AND INSPECTION (EUROPTO SERIES)
14-18 June 1999
Munich, Germany
New Measurement Systems and Principles
Proc. SPIE 3824, Active vision approach for optimizing illumination in critical surface inspection by machine vision, 0000 (21 September 1999); doi: 10.1117/12.364248
Proc. SPIE 3824, Active approach for holographic nondestructive testing of satellite fuel tanks, 0000 (21 September 1999); doi: 10.1117/12.364258
Proc. SPIE 3824, Compact optical sensors for measuring linear and angular velocities, 0000 (21 September 1999); doi: 10.1117/12.364268
Proc. SPIE 3824, Miniaturization of speckle interferometry for rapid strain analysis, 0000 (21 September 1999); doi: 10.1117/12.364278
Proc. SPIE 3824, Shearography for determination of 2D strain distributions, 0000 (21 September 1999); doi: 10.1117/12.364286
Proc. SPIE 3824, Theoretical modeling of the laser feedback technique for length measurement of moving materials, 0000 (21 September 1999); doi: 10.1117/12.364287
Systems for the Acquisition of Metrological Data
Proc. SPIE 3824, Shape measurement by multiple-wavelength interferometry, 0000 (21 September 1999); doi: 10.1117/12.364288
Proc. SPIE 3824, Flexible autocalibrating full-body 3D measurement system using digital light projection, 0000 (21 September 1999); doi: 10.1117/12.364241
Proc. SPIE 3824, New approach: intelligent digitization with AutoScan, 0000 (21 September 1999); doi: 10.1117/12.364242
Proc. SPIE 3824, Three-dimensional micromeasurements on smooth and rough surfaces with a new confocal optical profiler, 0000 (21 September 1999); doi: 10.1117/12.364243
Proc. SPIE 3824, High-speed optical 3D roughness measurements, 0000 (21 September 1999); doi: 10.1117/12.364244
Proc. SPIE 3824, Compact system for measuring rotational speed in two dimensions, 0000 (21 September 1999); doi: 10.1117/12.364245
Proc. SPIE 3824, Digital refinement of interferograms obtained by double-pulse interferometry and automatic sign correction of phase gradients after FFT evaluation, 0000 (21 September 1999); doi: 10.1117/12.364246
Proc. SPIE 3824, Object pose monitoring for multifinger grippers by laser scanning, 0000 (21 September 1999); doi: 10.1117/12.364247
New Measurement Systems and Principles
Proc. SPIE 3824, Three-dimensional pulsed ESPI technique of analysis of dynamic problems, 0000 (21 September 1999); doi: 10.1117/12.364249
Proc. SPIE 3824, Signal-to-noise ratio of differential interferometer and reference beam interferometer: a comparative study, 0000 (21 September 1999); doi: 10.1117/12.364250
Systems for the Acquisition of Metrological Data
Proc. SPIE 3824, Detection of hydrogen isotope atoms by mass spectrometry combined with resonant ionization, 0000 (21 September 1999); doi: 10.1117/12.364251
Proc. SPIE 3824, Measurement of depth profile of hydrogen isotope atom contained in solid material using resonant laser ablation, 0000 (21 September 1999); doi: 10.1117/12.364252
Proc. SPIE 3824, Time-resolved measurements of the spectra of a broadband laser used as light source for the coherence radar, 0000 (21 September 1999); doi: 10.1117/12.364253
Proc. SPIE 3824, Metrological features of laser interferometers with frequency conversion in supporting channel, 0000 (21 September 1999); doi: 10.1117/12.364254
Proc. SPIE 3824, Adaptive optical 3D measurement with structured light, 0000 (21 September 1999); doi: 10.1117/12.364255
Proc. SPIE 3824, Laser system for wavelength of laser interferometer calibration, 0000 (21 September 1999); doi: 10.1117/12.364256
Proc. SPIE 3824, New particle tracking velocimetry, 0000 (21 September 1999); doi: 10.1117/12.364257
Systems for Nondestructive Evaluation and Inspection
Proc. SPIE 3824, Optical inspection of large-scale technical components, 0000 (21 September 1999); doi: 10.1117/12.364259
Proc. SPIE 3824, Toward robust and distant estimation of the wear on a track vehicle's wheels, 0000 (21 September 1999); doi: 10.1117/12.364260
Proc. SPIE 3824, Analysis of interferometric fringe patterns by optical wavelet transform, 0000 (21 September 1999); doi: 10.1117/12.364261
Proc. SPIE 3824, Application of digital speckle photography for local strain analysis, 0000 (21 September 1999); doi: 10.1117/12.364262
Proc. SPIE 3824, Determination of mechanical joint properties by automated moire interferometry, 0000 (21 September 1999); doi: 10.1117/12.364263
Proc. SPIE 3824, Nondestructive large-area composite testing using shearography, 0000 (21 September 1999); doi: 10.1117/12.364264
Proc. SPIE 3824, Rapid defect inspection of display devices with optical spatial filtering, 0000 (21 September 1999); doi: 10.1117/12.364265
Industrial Applications
Proc. SPIE 3824, Application of optical spectroscopy to paper production, 0000 (21 September 1999); doi: 10.1117/12.364266
Proc. SPIE 3824, Automatic shearography inspection systems for aircraft components in production, 0000 (21 September 1999); doi: 10.1117/12.364267
Proc. SPIE 3824, Surface inspection on bodies in white in the automotive industry, 0000 (21 September 1999); doi: 10.1117/12.364269
Proc. SPIE 3824, WinGS: optical measurement and inspection system for aircraft wind tunnel models, 0000 (21 September 1999); doi: 10.1117/12.364270
Proc. SPIE 3824, Shape measurement in sheet metal formation: requirements and solutions, 0000 (21 September 1999); doi: 10.1117/12.364271
Proc. SPIE 3824, Determination of technological parameters in strip mining by time-of-flight and image processing, 0000 (21 September 1999); doi: 10.1117/12.364272
Proc. SPIE 3824, Real-time defect detection on cloths, 0000 (21 September 1999); doi: 10.1117/12.364273
Proc. SPIE 3824, High-resolution linear sensor system for sheet metal width measurement, 0000 (21 September 1999); doi: 10.1117/12.364274
Proc. SPIE 3824, Laser diffraction wire diameter measurements: correction of diffraction models by interferometric calibration, 0000 (21 September 1999); doi: 10.1117/12.364275
Proc. SPIE 3824, Quality monitoring and assurance for laser beam cutting using a thermographic process control, 0000 (21 September 1999); doi: 10.1117/12.364276
Systems for Nondestructive Evaluation and Inspection
Proc. SPIE 3824, ESPI with holographically stored waves and other innovative ESPI methods used for real-time monitoring of dynamic thermal deformations in a practical industrial environment, 0000 (21 September 1999); doi: 10.1117/12.364277
Proc. SPIE 3824, Optical frequency domain reflectometer for fiber structural testing, 0000 (21 September 1999); doi: 10.1117/12.364279
Proc. SPIE 3824, NDT on wide-scale aircraft structures with digital speckle shearography, 0000 (21 September 1999); doi: 10.1117/12.364280
Proc. SPIE 3824, Particle image velocimetry (PIV) as a tool in optimization of fan-based cooling systems in cars, 0000 (21 September 1999); doi: 10.1117/12.364281
Proc. SPIE 3824, Prototype of a fiber optic sensor for online measurement of coating thickness, 0000 (21 September 1999); doi: 10.1117/12.364282
Proc. SPIE 3824, DSPI applied to rubber viscoelastic behavior at low stresses study, 0000 (21 September 1999); doi: 10.1117/12.364283
Proc. SPIE 3824, One-point-of-view high-precision and versatile optical measurement of different sides of objects, 0000 (21 September 1999); doi: 10.1117/12.364284
Systems for the Acquisition of Metrological Data
Proc. SPIE 3824, Optical sensor for measurement of roll + pitch + yaw angles over large distances with high accuracy, 0000 (21 September 1999); doi: 10.1117/12.364285
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