PROCEEDINGS VOLUME 3945
SYMPOSIUM ON INTEGRATED OPTOELECTRONICS | 20-26 JANUARY 2000
Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
SYMPOSIUM ON INTEGRATED OPTOELECTRONICS
20-26 January 2000
San Jose, CA, United States
High-Power and High-Brightness Diode Lasers
Proc. SPIE 3945, Apparatus for spin-polarized inverse photoemission and spin scattering, 0000 (29 March 2000); doi: 10.1117/12.380522
Proc. SPIE 3945, Compact high-brightness and high-power diode laser source for materials processing, 0000 (29 March 2000); doi: 10.1117/12.380541
Proc. SPIE 3945, Description and applications of high-brightness multi-laser-diode system, 0000 (29 March 2000); doi: 10.1117/12.380550
Proc. SPIE 3945, Fiber-coupled diode laser systems up to 2-kW output power, 0000 (29 March 2000); doi: 10.1117/12.380554
Proc. SPIE 3945, Scaling diode-pumped Nd3+ and Yb3+-doped YCa4O(BO3)3 (YCOB) self-frequency doubling lasers, 0000 (29 March 2000); doi: 10.1117/12.380555
Proc. SPIE 3945, Hardening and welding with high-power diode lasers, 0000 (29 March 2000); doi: 10.1117/12.380556
Proc. SPIE 3945, Enhancement of brightness of multilaser diode systems, 0000 (29 March 2000); doi: 10.1117/12.380557
Beam Forming and Displays
Proc. SPIE 3945, Anamorphic lenses for laser diode circularization, 0000 (29 March 2000); doi: 10.1117/12.380523
Proc. SPIE 3945, Accuracy enhancement of point triangulation probes for linear displacement measurement, 0000 (29 March 2000); doi: 10.1117/12.380524
Analytical Measurements and Spectroscopy
Proc. SPIE 3945, Wavelength modulation spectroscopy of water vapor and line center stabilization at 1.462 um for lidar applications, 0000 (29 March 2000); doi: 10.1117/12.380525
Proc. SPIE 3945, High-spectral-purity VCSELs for spectroscopy and sensors, 0000 (29 March 2000); doi: 10.1117/12.380526
Proc. SPIE 3945, Tunable diode laser systems from the UV to the NIR with up to 1 W, 0000 (29 March 2000); doi: 10.1117/12.380527
Proc. SPIE 3945, Application of laser wavelength standard to interferometry measurements in air with nanometric accuracy, 0000 (29 March 2000); doi: 10.1117/12.380528
Proc. SPIE 3945, Wavelength modulation of semiconductor lasers for absorption spectroscopy employing harmonic detection, 0000 (29 March 2000); doi: 10.1117/12.380529
Proc. SPIE 3945, Determination of glucose in a stopped-flow cell using the diode laser/fiber colorimetric spectrometer, 0000 (29 March 2000); doi: 10.1117/12.380530
Sensing and Measurement
Proc. SPIE 3945, Multi-degree-of-freedom displacement measurement system using a diffraction grating, 0000 (29 March 2000); doi: 10.1117/12.380531
Proc. SPIE 3945, Vibrations and small displacements measurements using self-mixing techniques with multimode diode lasers, 0000 (29 March 2000); doi: 10.1117/12.380532
Proc. SPIE 3945, Fiber optic sensor system for controlling salt contents in the near-coastal shrimp farms, 0000 (29 March 2000); doi: 10.1117/12.380533
Proc. SPIE 3945, Raman probe of new laser materials GaAs1-xBix and InAs1-xBix, 0000 (29 March 2000); doi: 10.1117/12.380534
Proc. SPIE 3945, Fiber optic sensor for diffusible hydrogen determination in high-strength steel, 0000 (29 March 2000); doi: 10.1117/12.380535
Testing and Packaging I
Proc. SPIE 3945, Optical demultiplexing using semiconductor amplifiers, 0000 (29 March 2000); doi: 10.1117/12.380536
Proc. SPIE 3945, Selective-proton-bombarded buried stripe laser and its modulation response, 0000 (29 March 2000); doi: 10.1117/12.380537
Proc. SPIE 3945, Oscillation wavelength shifts of laser diodes with or without a package in a magnetic field, 0000 (29 March 2000); doi: 10.1117/12.380539
Testing and Packaging II
Proc. SPIE 3945, High-power fiber laser/amplifier: present and future, 0000 (29 March 2000); doi: 10.1117/12.380540
Proc. SPIE 3945, Low-cost environmentally proven high-brightness fiber-coupled laser diode, 0000 (29 March 2000); doi: 10.1117/12.380542
Proc. SPIE 3945, Tolerant low-loss three-lens coupling system for 1.48-um unstable-cavity lasers, 0000 (29 March 2000); doi: 10.1117/12.380543
Proc. SPIE 3945, Packaging and characterization of high-power diode lasers, 0000 (29 March 2000); doi: 10.1117/12.380544
Reliability Testing
Proc. SPIE 3945, Highly reliable buried-stripe type 980-nm laser diodes for practical optical communications, 0000 (29 March 2000); doi: 10.1117/12.380545
Proc. SPIE 3945, High-power high-reliability cw and qcw operation of single AlGaAs laser diode array design, 0000 (29 March 2000); doi: 10.1117/12.380546
Proc. SPIE 3945, Al-free 950-nm BA diode lasers with high efficiency and reliability at 50 degrees C ambient temperature, 0000 (29 March 2000); doi: 10.1117/12.380547
Proc. SPIE 3945, Microphotoluminescence mapping of packaging-induced stress distribution in high-power AlGaAs laser diodes, 0000 (29 March 2000); doi: 10.1117/12.380548
Sensing and Measurement
Proc. SPIE 3945, Self-mixing interferometry for distance and displacement measurement by Fourier transform method, 0000 (29 March 2000); doi: 10.1117/12.380549
High-Power and High-Brightness Diode Lasers
Proc. SPIE 3945, 267-W cw AlGaAs/GaInAs diode laser bars, 0000 (29 March 2000); doi: 10.1117/12.380551
Sensing and Measurement
Proc. SPIE 3945, Low-cost high-response fiber optic strain/temperature sensor with stabilization, 0000 (29 March 2000); doi: 10.1117/12.380552
Testing and Packaging I
Proc. SPIE 3945, High-performance GaInP/AlGaInP visible laser diodes grown by multiwafer MOCVD, 0000 (29 March 2000); doi: 10.1117/12.380553
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