PROCEEDINGS VOLUME 4068
SIOEL: SIXTH SYMPOSIUM OF OPTOELECTRONICS | 22-24 SEPTEMBER 1999
SIOEL '99: Sixth Symposium on Optoelectronics
SIOEL: SIXTH SYMPOSIUM OF OPTOELECTRONICS
22-24 September 1999
Bucharest, Romania
Materials for Optoelectronics and Related Fields
Lasers and Applications
Proc. SPIE 4068, Upconversion violet emission in diluted Er:YAG crystals, 0000 (23 February 2000); doi: 10.1117/12.378663
Proc. SPIE 4068, Resonant photodetection with long-wavelength double-fused InGaAsP/AlGaAs vertical-cavity lasers, 0000 (23 February 2000); doi: 10.1117/12.378664
Proc. SPIE 4068, High-precision towers for support of an optoelectronic detector, 0000 (23 February 2000); doi: 10.1117/12.378665
Proc. SPIE 4068, Launch of the LP01 mode on an optical fiber: a model based on Gaussian beam notion, 0000 (23 February 2000); doi: 10.1117/12.378666
Proc. SPIE 4068, Launch of the guided modes on an optical fiber: a model based on Gaussian beam notion, 0000 (23 February 2000); doi: 10.1117/12.378667
Proc. SPIE 4068, Power-related frequency shift determinations of an iodine-stabilized He-Ne laser at 633-nm wavelength by using a master-slave laser system, 0000 (23 February 2000); doi: 10.1117/12.378668
Proc. SPIE 4068, Evaluation method for the dynamics of an erbium-doped fiber laser, 0000 (23 February 2000); doi: 10.1117/12.378669
Proc. SPIE 4068, Influence of cross-relaxation parameter on the sensitized photon avalanche, 0000 (23 February 2000); doi: 10.1117/12.378671
Proc. SPIE 4068, Characterization of coated optical components by laser calorimetry, 0000 (23 February 2000); doi: 10.1117/12.378672
Proc. SPIE 4068, Execution of chemical metallizing of the inlet opening of a puncture in material, 0000 (23 February 2000); doi: 10.1117/12.378673
Proc. SPIE 4068, Plasma analysis in the process of pulsed laser deposition of aluminium nitride and titan nitride thin films, 0000 (23 February 2000); doi: 10.1117/12.378674
Proc. SPIE 4068, Optical phonon effects on linewidth of several laser active ions in YAG, 0000 (23 February 2000); doi: 10.1117/12.378675
Proc. SPIE 4068, Evaluation of some nonlinear parameters of Er3+:Ti:LiNbO3 waveguides from interferometric and near-field measurements, 0000 (23 February 2000); doi: 10.1117/12.378676
Proc. SPIE 4068, He-Ne laser gain dependence on discharge current and gas pressure from resonant Faraday effect, 0000 (23 February 2000); doi: 10.1117/12.378677
Proc. SPIE 4068, Global symmetries for laser radiation, 0000 (23 February 2000); doi: 10.1117/12.378678
Proc. SPIE 4068, Characterization of a resonant photoacoustic cell using the acoustic transmission line model, 0000 (23 February 2000); doi: 10.1117/12.378679
Proc. SPIE 4068, Accurate method to calculate some periodic integrals occurring in electromagnetic field analysis, 0000 (23 February 2000); doi: 10.1117/12.378680
Proc. SPIE 4068, Absorption in a self-heating He-Se laser tube, 0000 (23 February 2000); doi: 10.1117/12.378682
Proc. SPIE 4068, Simple method for characterizing the up-conversion processes governing 3-um generation in concentrated erbium crystals, 0000 (23 February 2000); doi: 10.1117/12.378683
Proc. SPIE 4068, 1D algorithm for automatic fringe spacing measurement in a straight equispaced parallel fringe pattern, 0000 (23 February 2000); doi: 10.1117/12.378684
Proc. SPIE 4068, Ultrashort-pulse generation and subharmonic bifurcation in directly modulated MQW lasers, 0000 (23 February 2000); doi: 10.1117/12.378685
Proc. SPIE 4068, Metal grating efficiencies for Smith-Purcell radiation in a relativistic regime, 0000 (23 February 2000); doi: 10.1117/12.378686
Proc. SPIE 4068, High-performance 980-nm emission wavelength InGaAs/AlGaAs/GaAs laser diodes, 0000 (23 February 2000); doi: 10.1117/12.378687
Proc. SPIE 4068, Tunable laser diode sources for 830-nm and 980-nm wavelength range, 0000 (23 February 2000); doi: 10.1117/12.378688
Optoelectronic Components: Analysis and Control Methods
Proc. SPIE 4068, Solar cell optimization from spectral response, 0000 (23 February 2000); doi: 10.1117/12.378689
Proc. SPIE 4068, Improved measurement precision through continuous optical focusing on optoelectronic detection devices, 0000 (23 February 2000); doi: 10.1117/12.378690
Proc. SPIE 4068, Photoconductive frequency-resolved spectrometer, 0000 (23 February 2000); doi: 10.1117/12.378691
Proc. SPIE 4068, Improved method for processing Newton's rings fringe patterns, 0000 (23 February 2000); doi: 10.1117/12.378693
Proc. SPIE 4068, Computer-assisted electropneumatic system to compensate for the sag of an optoelectronic detector, 0000 (23 February 2000); doi: 10.1117/12.378694
Proc. SPIE 4068, Optoelectronic systems: design of world-class products, 0000 (23 February 2000); doi: 10.1117/12.378695
Proc. SPIE 4068, Quality control of product/process using nondestructive control and possibilities of robotic investigation, 0000 (23 February 2000); doi: 10.1117/12.378696
Proc. SPIE 4068, Precision improvement in ellipsometric-type measurements for the refraction index using numerical code processing, 0000 (23 February 2000); doi: 10.1117/12.378697
Proc. SPIE 4068, Temperature and dopant concentration in single-mode 5-um diameter optical fiber--cooling through the die: implications for Laguerre orders in optical refractive synchronization, 0000 (23 February 2000); doi: 10.1117/12.378698
Proc. SPIE 4068, Joined optical channels, 0000 (23 February 2000); doi: 10.1117/12.378699
Proc. SPIE 4068, Thermovision used for determination of thermal losses in thermoelectric plants, 0000 (23 February 2000); doi: 10.1117/12.378700
Proc. SPIE 4068, Simple effective tests for beam propagation method programs, 0000 (23 February 2000); doi: 10.1117/12.378701
Proc. SPIE 4068, Growth and spectral characteristics of Nd3+ in calcium lithium niobium gallium garnet (CLNGG) crystals, 0000 (23 February 2000); doi: 10.1117/12.378702