PROCEEDINGS VOLUME 4076
SYMPOSIUM ON APPLIED PHOTONICS | 21-25 MAY 2000
Optical Diagnostics for Industrial Applications
SYMPOSIUM ON APPLIED PHOTONICS
21-25 May 2000
Glasgow, United Kingdom
Optical Diagnostics in Fluid Mechanics I
Proc. SPIE 4076, Laser-cladding powder spray distribution using a laser sheet illumination and a CCD camera, 0000 (31 August 2000); doi: 10.1117/12.397938
Proc. SPIE 4076, Approach for particle sizing using DPIV, 0000 (31 August 2000); doi: 10.1117/12.397946
Proc. SPIE 4076, Optical tomography for concentration and velocity profiles in two component flows, 0000 (31 August 2000); doi: 10.1117/12.397956
Proc. SPIE 4076, Pulsed laser imaging in practical combustion systems from 2D to 4D, 0000 (31 August 2000); doi: 10.1117/12.397963
Proc. SPIE 4076, Optical measurement and visualization in high-pressure high-temperature aviation gas turbine combustors, 0000 (31 August 2000); doi: 10.1117/12.397964
Proc. SPIE 4076, Flow visualization by color schlieren and holographic interferometry, 0000 (31 August 2000); doi: 10.1117/12.397965
Optical Diagnostics in Fluid Mechanics II
Proc. SPIE 4076, Fundamental limitations to the spatial resolution and flow volume that can be mapped using holographic particle image velocimetry, 0000 (31 August 2000); doi: 10.1117/12.397966
Proc. SPIE 4076, Novel illumination system for off-axis holography of small particles, 0000 (31 August 2000); doi: 10.1117/12.397967
Proc. SPIE 4076, HoloCam: a subsea holographic camera for recording marine organisms and particles, 0000 (31 August 2000); doi: 10.1117/12.397939
Proc. SPIE 4076, Data extraction system for underwater particle holography, 0000 (31 August 2000); doi: 10.1117/12.397940
Proc. SPIE 4076, Visualization of very weak shock waves by digital phase-shift interferometry, 0000 (31 August 2000); doi: 10.1117/12.397941
Optical Diagnostics in Solid Mechanics I
Proc. SPIE 4076, In-plane error analysis in ESPSI: the effect of beam divergence, 0000 (31 August 2000); doi: 10.1117/12.397942
Proc. SPIE 4076, Online fluorescence-based coating thickness measurement in the production of hot stamping foils, 0000 (31 August 2000); doi: 10.1117/12.397943
Proc. SPIE 4076, Optical shape measurement technology: past, present, and future, 0000 (31 August 2000); doi: 10.1117/12.397944
Proc. SPIE 4076, Shape measurement using a fiber optic fringe projector with active homodyne phase stepping, 0000 (31 August 2000); doi: 10.1117/12.397945
Proc. SPIE 4076, Two-wavelength contouring for shape and deformation measurement, 0000 (31 August 2000); doi: 10.1117/12.397947
Optical Diagnostics in Solid Mechanics II
Proc. SPIE 4076, Experimental and numerical models of a field heterodyne interferometer: discussion on optical influences in measurements, 0000 (31 August 2000); doi: 10.1117/12.397950
Proc. SPIE 4076, Quality assessment of reverse engineering process based on full-field true-3D optical measurements, 0000 (31 August 2000); doi: 10.1117/12.397951
Proc. SPIE 4076, Novel laser full-field extensometer integrated with loading machine, 0000 (31 August 2000); doi: 10.1117/12.397952
Proc. SPIE 4076, Integrated optics in laser Doppler metrology, 0000 (31 August 2000); doi: 10.1117/12.397953
Proc. SPIE 4076, Study and design of a programmable silicon retina for real-time pattern recognition, 0000 (31 August 2000); doi: 10.1117/12.397954
Proc. SPIE 4076, X-ray scanner: a new device for rapid mapping of nanometer-scale roughness, 0000 (31 August 2000); doi: 10.1117/12.397955
Poster Session
Proc. SPIE 4076, Fiber optic gel point sensor for paper coating drying control and optimization, 0000 (31 August 2000); doi: 10.1117/12.397957
Proc. SPIE 4076, Applications of scanning laser source technique for detection of surface-breaking defects, 0000 (31 August 2000); doi: 10.1117/12.397958
Proc. SPIE 4076, Influence of self-absorption on the performance of laser-induced breakdown spectroscopy (LIBS), 0000 (31 August 2000); doi: 10.1117/12.397959
Proc. SPIE 4076, Intrinsic speckle noise in in-line particle holography due to polydisperse and continuous particle sizes, 0000 (31 August 2000); doi: 10.1117/12.397960
Proc. SPIE 4076, Simultaneous measurement of bulk and surface recombination lifetimes on asymmetrical silicon samples, 0000 (31 August 2000); doi: 10.1117/12.397961
Proc. SPIE 4076, Ultrafast digital camera for materials research, 0000 (31 August 2000); doi: 10.1117/12.397962
Optical Diagnostics in Fluid Mechanics I
Proc. SPIE 4076, Adaptive materials for optical applications: example of polymer/liquid crystal microcomposites, 0000 (31 August 2000); doi: 10.1117/12.397948
Proc. SPIE 4076, Micro-opto-electro-mechanical systems: recent developments and LETI's activities, 0000 (31 August 2000); doi: 10.1117/12.397949
Back to Top