Theoretical Aspects of Laser-Matter Interaction: Application to Laser Microtechnology
Proc. SPIE 4157, Universal numerical solver for solid, liquid, and gas: application to laser-induced melting and evaporation, 0000 (30 January 2001); doi: 10.1117/12.413739
Proc. SPIE 4157, Theoretic description of the nature of acoustic emission in laser welding, 0000 (30 January 2001); doi: 10.1117/12.413750
Proc. SPIE 4157, Gas dynamics of laser ablation: two-dimensional expansion of the vapor in an ambient atmosphere, 0000 (30 January 2001); doi: 10.1117/12.413761
Proc. SPIE 4157, Breakdown kinetics and plasma evolution induced by IR and UV laser radiation, 0000 (30 January 2001); doi: 10.1117/12.413772
Proc. SPIE 4157, Initial stage of Al2O3-TiC laser processing: numerical investigation with axisymmetric finite-volume scheme, 0000 (30 January 2001); doi: 10.1117/12.413773
Experimental Aspects of Laser-Matter Interaction: Application to Laser Microtechnology and in-situ Measurements of Laser Processing
Proc. SPIE 4157, Pyrometry applications in laser machining, 0000 (30 January 2001); doi: 10.1117/12.413774
Proc. SPIE 4157, Vapor density measurements inside laser-induced cavitation bubbles, 0000 (30 January 2001); doi: 10.1117/12.413775
Proc. SPIE 4157, Time-resolved temperature and reflectivity measurements of nanosecond laser-induced melting and crystallization of silicon, 0000 (30 January 2001); doi: 10.1117/12.413776
Proc. SPIE 4157, Thermo-optical feedback in laser medical systems: control algorithms, 0000 (30 January 2001); doi: 10.1117/12.413777
Proc. SPIE 4157, Development of information-measuring channels of the monitoring system of quality cut for technological process laser cutting of materials, 0000 (30 January 2001); doi: 10.1117/12.413740
Microshaping by Laser Ablation
Proc. SPIE 4157, Laser-assisted microshaping, 0000 (30 January 2001); doi: 10.1117/12.413741
Proc. SPIE 4157, Laser microstructuring of surfaces for improving their tribological performance, 0000 (30 January 2001); doi: 10.1117/12.413742
Proc. SPIE 4157, Industrial aspects of Nd-YAG laser microprocessing, 0000 (30 January 2001); doi: 10.1117/12.413743
Proc. SPIE 4157, Application of an image onto a material surface by a method of laser marking, 0000 (30 January 2001); doi: 10.1117/12.413744
Proc. SPIE 4157, Laser perforator of passports, 0000 (30 January 2001); doi: 10.1117/12.413745
Laser-based Stratification (Rapid Prototyping) in Microdomain
Proc. SPIE 4157, Overview of laser-based rapid prototyping in a microdomain, 0000 (30 January 2001); doi: 10.1117/12.413746
Proc. SPIE 4157, Microfabrication using laser-induced photopolymerization, 0000 (30 January 2001); doi: 10.1117/12.413747
Proc. SPIE 4157, New schematic decisions and materials for 3D laser synthesis, 0000 (30 January 2001); doi: 10.1117/12.413748
Laser Fabrication of Micro-optical Components
Proc. SPIE 4157, Overview of novel approaches for laser microfabrication of advanced materials, 0000 (30 January 2001); doi: 10.1117/12.413749
Proc. SPIE 4157, Micromachining of optically transparent materials by laser ablation of a solution containing pyrene, 0000 (30 January 2001); doi: 10.1117/12.413751
Proc. SPIE 4157, Laser technology of shaping near-field optical probes with submicron scale tip, 0000 (30 January 2001); doi: 10.1117/12.413752
Proc. SPIE 4157, Laser-based micropipettes: design, technology and applications, 0000 (30 January 2001); doi: 10.1117/12.413753
Proc. SPIE 4157, Optoelectronic methods for detecting a surface defect and estimation of their parameters by coherent illumination, 0000 (30 January 2001); doi: 10.1117/12.413754
Laser Technology in Microelectronics
Proc. SPIE 4157, Laser microprocessing and its applications in the microelectronics industry, 0000 (30 January 2001); doi: 10.1117/12.413755
Proc. SPIE 4157, Two-beam laser heating and melting of GaAs crystal layers, 0000 (30 January 2001); doi: 10.1117/12.413756
Proc. SPIE 4157, Influence of laser-induced centers on oxygen precipitation in silicon, 0000 (30 January 2001); doi: 10.1117/12.413757
Proc. SPIE 4157, Laser-pulse-induced chemical reactions and surface patterning in Co-Si and Co-Ti-Si films: investigations by x-ray diffraction and atomic force microscopy, 0000 (30 January 2001); doi: 10.1117/12.413758
Proc. SPIE 4157, Intracavity processing of semiconductor monocrystalline surface, 0000 (30 January 2001); doi: 10.1117/12.413759
Proc. SPIE 4157, Low-frequency noncontact photothermal measurements of metal film thickness on a dielectric surface, 0000 (30 January 2001); doi: 10.1117/12.413760
Laser-Plasma Deposition
Proc. SPIE 4157, Pulsed-laser deposition and characterization of high-temperature superconducting films, 0000 (30 January 2001); doi: 10.1117/12.413762
Proc. SPIE 4157, Laser-induced liquid phase deposition (LCLD): state of the art, 0000 (30 January 2001); doi: 10.1117/12.413763
Proc. SPIE 4157, Progress in carbon nitride synthesis by pulsed-laser deposition, 0000 (30 January 2001); doi: 10.1117/12.413764
Proc. SPIE 4157, Structural peculiarities of metal alloy and multilayer films synthesized from laser erosion plasma, 0000 (30 January 2001); doi: 10.1117/12.413765
Proc. SPIE 4157, Laser synthesis of disilicides based on iron and their application for photothermal tensoconverters, 0000 (30 January 2001); doi: 10.1117/12.413766
Proc. SPIE 4157, Advances in laser-ablation-assisted processes, 0000 (30 January 2001); doi: 10.1117/12.413767
Laser Optics for Microfabrication
Proc. SPIE 4157, High-power diode lasers for materials processing: actual status and future aspects, 0000 (30 January 2001); doi: 10.1117/12.413768
Proc. SPIE 4157, Pump systems of solid state lasers with adjustable pike-temporary structure of radiation impulses, 0000 (30 January 2001); doi: 10.1117/12.413769
Proc. SPIE 4157, Laser systems with passive Q-switching for precision technology, 0000 (30 January 2001); doi: 10.1117/12.413770
Proc. SPIE 4157, New optical systems for holographic recordings of aberration-corrected diffraction gratings, 0000 (30 January 2001); doi: 10.1117/12.413771
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