PROCEEDINGS VOLUME 4190
INTELLIGENT SYSTEMS AND SMART MANUFACTURING | 5-8 NOVEMBER 2000
Optomechatronic Systems
INTELLIGENT SYSTEMS AND SMART MANUFACTURING
5-8 November 2000
Boston, MA, United States
Optical Sensors
Proc. SPIE 4190, High-precision encoder using moire fringe and neural network, 0000 (12 February 2001); doi: 10.1117/12.417214
Proc. SPIE 4190, Optoelectronic biosensor for remote monitoring of toxins, 0000 (12 February 2001); doi: 10.1117/12.417224
Proc. SPIE 4190, Development of a noncontact optical sensor for measuring the shape of a surface and thh thickness of transparent objects, 0000 (12 February 2001); doi: 10.1117/12.417230
Industrial Vision: Inspection and Pattern Recognition
Proc. SPIE 4190, Adaptive tracking of weld joints using active contour model in arc-welding processes, 0000 (12 February 2001); doi: 10.1117/12.417231
Proc. SPIE 4190, Welding bead and chamfer inspection by means of laser vision, 0000 (12 February 2001); doi: 10.1117/12.417232
Proc. SPIE 4190, Enhancement of placement accuracy for SMD via development of a new illumination system, 0000 (12 February 2001); doi: 10.1117/12.417233
Optical Precision Measurements and Systems
Proc. SPIE 4190, Optimal rejection of the image extinction in confocal scanning microscopy, 0000 (12 February 2001); doi: 10.1117/12.417234
Proc. SPIE 4190, Micromotion measurement system for millistructure using diffraction grating, 0000 (12 February 2001); doi: 10.1117/12.417235
Proc. SPIE 4190, Measurement of 6-DOF displacement of rigid bodies through splitting a laser beam: experimental investigation, 0000 (12 February 2001); doi: 10.1117/12.417236
Proc. SPIE 4190, Analysis of error and development of calibration's method to design precision rotating analyzer ellipsometer, 0000 (12 February 2001); doi: 10.1117/12.417215
Proc. SPIE 4190, Surface-geometry measurement using an untracked range-sensor head, 0000 (12 February 2001); doi: 10.1117/12.417216
Proc. SPIE 4190, Uniaxis rangefinder using contrast detection of a projected pattern, 0000 (12 February 2001); doi: 10.1117/12.417217
Proc. SPIE 4190, Full-field time-dependent heterodyne interferometer for shape measurement: theory and experiment, 0000 (12 February 2001); doi: 10.1117/12.417218
Proc. SPIE 4190, Design and fabrication of near-field microscope using solid immersion lens, 0000 (12 February 2001); doi: 10.1117/12.417219
Proc. SPIE 4190, Novel precision mechanical design for ellipsometer, 0000 (12 February 2001); doi: 10.1117/12.417220
Optomechatronic Devices
Proc. SPIE 4190, Area scanning vision inspection system by using mirror control, 0000 (12 February 2001); doi: 10.1117/12.417221
Proc. SPIE 4190, Velocity profile analysis to reduce residual vibration in optical pick-up, 0000 (12 February 2001); doi: 10.1117/12.417222
Image Processing and Synthesis
Proc. SPIE 4190, Depth estimation via parallel coevolution of disparity functions for area-based stereo, 0000 (12 February 2001); doi: 10.1117/12.417223
Proc. SPIE 4190, Three-dimensional volume reconstruction of an object from x-ray images, 0000 (12 February 2001); doi: 10.1117/12.417225
Vision-based Perception and Robot Navigation
Mechatronic Systems Motion Control
Proc. SPIE 4190, Optical driving of a miniature machine composed of temperature-sensitive ferrite and shape memory alloy, 0000 (12 February 2001); doi: 10.1117/12.417228
Proc. SPIE 4190, Cellular neural networks and biologically inspired motion control, 0000 (12 February 2001); doi: 10.1117/12.417229
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