PROCEEDINGS VOLUME 4221
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS | 8-10 NOVEMBER 2000
Optical Measurement and Nondestructive Testing: Techniques and Applications
IN THIS VOLUME

0 Sessions, 98 Papers, 0 Presentations
Papers  (98)
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS
8-10 November 2000
Beijing, China
Papers
Proc. SPIE 4221, AC stark interference effect in optical Ramsey atomic interferometer, 0000 (9 October 2000); doi: 10.1117/12.402558
Proc. SPIE 4221, Approach for the measurement of phase retardation of wave plates based on laser frequency splitting technology, 0000 (9 October 2000); doi: 10.1117/12.402580
Proc. SPIE 4221, Experimental research on laser tracking system with galvanometer scanner for measuring spatial coordinates of moving target, 0000 (9 October 2000); doi: 10.1117/12.402600
Proc. SPIE 4221, Automatic inspection system for wheel-aligning parameters, 0000 (9 October 2000); doi: 10.1117/12.402610
Proc. SPIE 4221, New advance in laser interferometry, 0000 (9 October 2000); doi: 10.1117/12.402620
Proc. SPIE 4221, Fringe projection method for measuring 3D profile and position of a moving object, 0000 (9 October 2000); doi: 10.1117/12.402627
Proc. SPIE 4221, 3D en face imaging by OCT, 0000 (9 October 2000); doi: 10.1117/12.402635
Proc. SPIE 4221, Application of wavelet de-noise in digital speckle correlation method, 0000 (9 October 2000); doi: 10.1117/12.402643
Proc. SPIE 4221, Aberration measurement of focal mirror by the phase shift in high-power CO2 laser processing, 0000 (9 October 2000); doi: 10.1117/12.402559
Proc. SPIE 4221, Key factors in accurate beam characterization application, 0000 (9 October 2000); doi: 10.1117/12.402568
Proc. SPIE 4221, Physical experimental simulation of indirect surface display caused by buried geological anomaly, 0000 (9 October 2000); doi: 10.1117/12.402572
Proc. SPIE 4221, Selection of pattern in slit diffraction measurement and its influence on measurement accuracy, 0000 (9 October 2000); doi: 10.1117/12.402573
Proc. SPIE 4221, Stereo vision measurement technique using artifical neural network, 0000 (9 October 2000); doi: 10.1117/12.402574
Proc. SPIE 4221, Solar panel substrate planeness measuring system by an optical triangulation method, 0000 (9 October 2000); doi: 10.1117/12.402575
Proc. SPIE 4221, Application of optical fiber grating (OFG) pressure sensor on train real-time tracing system, 0000 (9 October 2000); doi: 10.1117/12.402576
Proc. SPIE 4221, New application of holography and interferometry in temperature sensing, 0000 (9 October 2000); doi: 10.1117/12.402577
Proc. SPIE 4221, Principle demonstration of 3D volumetric display achieved by PrYb co-doped material, 0000 (9 October 2000); doi: 10.1117/12.402578
Proc. SPIE 4221, Basic optical property of Tm-doped oxyfluoride vitroceramics and glass, 0000 (9 October 2000); doi: 10.1117/12.402579
Proc. SPIE 4221, Raman and x-ray diffraction study on the material property of oxyfluoride vitroceramics, 0000 (9 October 2000); doi: 10.1117/12.402581
Proc. SPIE 4221, Oxyfluoride vitroceramics material and up-conversion luminescence enhancement of Er3+ion, 0000 (9 October 2000); doi: 10.1117/12.402583
Proc. SPIE 4221, Modulation inspection: best lifetime measurement method of delicacy material, 0000 (9 October 2000); doi: 10.1117/12.402586
Proc. SPIE 4221, Color-coded grating 3D profile measurement and its application, 0000 (9 October 2000); doi: 10.1117/12.402587
Proc. SPIE 4221, Structural resonances in the Raman spectrum of glass microsphere, 0000 (9 October 2000); doi: 10.1117/12.402591
Proc. SPIE 4221, Polarization properties of volume hologram, 0000 (9 October 2000); doi: 10.1117/12.402593
Proc. SPIE 4221, 3D computer vision system based on spatial phase mapping, 0000 (9 October 2000); doi: 10.1117/12.402594
Proc. SPIE 4221, New method for multiview range image fusion, 0000 (9 October 2000); doi: 10.1117/12.402595
Proc. SPIE 4221, Wavelet analysis and its application in PDA signal processing, 0000 (9 October 2000); doi: 10.1117/12.402598
Proc. SPIE 4221, Surface 3D topography measurement of roller, 0000 (9 October 2000); doi: 10.1117/12.402599
Proc. SPIE 4221, Highly sensitive method for concentration and absorption measurements by guided-wave resonance, 0000 (9 October 2000); doi: 10.1117/12.402601
Proc. SPIE 4221, Real-time measurement for the electro-optic coefficient of a poled-polymer film in ATR configuration, 0000 (9 October 2000); doi: 10.1117/12.402602
Proc. SPIE 4221, New method for the recovery of the refractive-index profile of an optical waveguide from the measured coupling angles, 0000 (9 October 2000); doi: 10.1117/12.402603
Proc. SPIE 4221, Correlative stitching technique for measuring flatness, 0000 (9 October 2000); doi: 10.1117/12.402604
Proc. SPIE 4221, Measurement of group time delay of a chirped fiber grating, 0000 (9 October 2000); doi: 10.1117/12.402605
Proc. SPIE 4221, Testing optical aspheric surfaces by aspheric characteristic interferogram, 0000 (9 October 2000); doi: 10.1117/12.402606
Proc. SPIE 4221, Laser microprobe emission spectrum in argon atmosphere at reduced pressure, 0000 (9 October 2000); doi: 10.1117/12.402607
Proc. SPIE 4221, Real-time algorithm in the virtual environment, 0000 (9 October 2000); doi: 10.1117/12.402608
Proc. SPIE 4221, Study of atmospheric CO2 concentration based on the technology of infrared measurement, 0000 (9 October 2000); doi: 10.1117/12.402609
Proc. SPIE 4221, Optical fiber sensor system for oil contamination measurement based on 3D fluorescence spectrum parameterization, 0000 (9 October 2000); doi: 10.1117/12.402611
Proc. SPIE 4221, PIV measurements and data accuracy analysis of flow in complex terrain, 0000 (9 October 2000); doi: 10.1117/12.402612
Proc. SPIE 4221, Diffraction analysis and evaluation of a focus-error detection scheme for an optical profilometer, 0000 (9 October 2000); doi: 10.1117/12.402613
Proc. SPIE 4221, Nondestructive survey of a buried surface and interface structure by x-ray scattering, 0000 (9 October 2000); doi: 10.1117/12.402614
Proc. SPIE 4221, Submicron electro-optic measurement technique using an external hemispherical probe, 0000 (9 October 2000); doi: 10.1117/12.402615
Proc. SPIE 4221, Parameter analysis of the photon counting technique for detecting fluorescent emission, 0000 (9 October 2000); doi: 10.1117/12.402616
Proc. SPIE 4221, New application of integrating sphere, 0000 (9 October 2000); doi: 10.1117/12.402617
Proc. SPIE 4221, Measurement of a large 3D curved surface, 0000 (9 October 2000); doi: 10.1117/12.402618
Proc. SPIE 4221, Second harmonic generation in B-BaB2O4 thin films, 0000 (9 October 2000); doi: 10.1117/12.402619
Proc. SPIE 4221, Photoluminescence measurement of SrAl2O4:Eu2+,Dy3+ incorporated in glass frits, 0000 (9 October 2000); doi: 10.1117/12.402621
Proc. SPIE 4221, Noncontact measuring technique of spline bouncing error, 0000 (9 October 2000); doi: 10.1117/12.402622
Proc. SPIE 4221, Closed-loop dynamic inspections by two-dimensional laser scan, 0000 (9 October 2000); doi: 10.1117/12.402623
Proc. SPIE 4221, Rainbow hologram reconstruction using white light for nondestructive testing of GFRP cylinder, 0000 (9 October 2000); doi: 10.1117/12.402624
Proc. SPIE 4221, Stereo matching algorithm using wavelet transform, 0000 (9 October 2000); doi: 10.1117/12.402625
Proc. SPIE 4221, Image-based recognition of the chip shape, 0000 (9 October 2000); doi: 10.1117/12.402626
Proc. SPIE 4221, Microarray imaging system for measuring the properties of a moving object, 0000 (9 October 2000); doi: 10.1117/12.402628
Proc. SPIE 4221, Laser measurement for slight deformation of a large-scale structure, 0000 (9 October 2000); doi: 10.1117/12.402629
Proc. SPIE 4221, Dynamic IR scene projection using the single-crystal silicon liquid crystal light valve, 0000 (9 October 2000); doi: 10.1117/12.402630
Proc. SPIE 4221, Digital Fourier analysis method for measuring the optical MTF of an IR imaging scanner, 0000 (9 October 2000); doi: 10.1117/12.402631
Proc. SPIE 4221, Measurement and comparison of modulation transfer function and signal transfer function of image intensifiers, 0000 (9 October 2000); doi: 10.1117/12.402632
Proc. SPIE 4221, Three-dimensional optical tomography of incomplete data, 0000 (9 October 2000); doi: 10.1117/12.402633
Proc. SPIE 4221, Self-diagnosis and self-repair using hollow-center optical fiber in smart structure, 0000 (9 October 2000); doi: 10.1117/12.402634
Proc. SPIE 4221, New inverse computation for optical-absorption coefficient in semiconductor material, 0000 (9 October 2000); doi: 10.1117/12.402636