PROCEEDINGS VOLUME 4222
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS | 8-10 NOVEMBER 2000
Process Control and Inspection for Industry
IN THIS VOLUME

0 Sessions, 84 Papers, 0 Presentations
Papers  (84)
OPTICS AND OPTOELECTRONIC INSPECTION AND CONTROL: TECHNIQUES, APPLICATIONS, AND INSTRUMENTS
8-10 November 2000
Beijing, China
Papers
Proc. SPIE 4222, Novel high-resolution vibration sensor based on laser frequency splitting technology, 0000 (10 October 2000); doi: 10.1117/12.403845
Proc. SPIE 4222, Position and attitude measurement of moving target using laser tracking system with multiple measuring stations, 0000 (10 October 2000); doi: 10.1117/12.403864
Proc. SPIE 4222, Measuring particulate concentration by means of scattered light scintillation, 0000 (10 October 2000); doi: 10.1117/12.403873
Proc. SPIE 4222, High-precision measurement of the wavelength shift of in-fiber Bragg grating with strain gauge, 0000 (10 October 2000); doi: 10.1117/12.403889
Proc. SPIE 4222, Processing application used in beam characterization, 0000 (10 October 2000); doi: 10.1117/12.403897
Proc. SPIE 4222, Modal characteristics of quartz tuning-fork angular rate microsensor by means of FEM, 0000 (10 October 2000); doi: 10.1117/12.403906
Proc. SPIE 4222, Interferogram processing with wavelet analysis and spectrogram reconstruction, 0000 (10 October 2000); doi: 10.1117/12.403916
Proc. SPIE 4222, Online measuring system for amorphous strip thickness, 0000 (10 October 2000); doi: 10.1117/12.403835
Proc. SPIE 4222, Digital simulation for low-light-level night vision imaging system, 0000 (10 October 2000); doi: 10.1117/12.403836
Proc. SPIE 4222, Image simulation for photoelectric imaging system, 0000 (10 October 2000); doi: 10.1117/12.403837
Proc. SPIE 4222, Quick and dynamic measurements of geometric errors of CNC machines, 0000 (10 October 2000); doi: 10.1117/12.403838
Proc. SPIE 4222, Remote sensing to ocean by using Brillouin scattering: test of sound speed and submerged object, 0000 (10 October 2000); doi: 10.1117/12.403839
Proc. SPIE 4222, Approach to application of segment and its deformation measurement, 0000 (10 October 2000); doi: 10.1117/12.403840
Proc. SPIE 4222, Computer simulation of laser drilling in permanent magnetic material, 0000 (10 October 2000); doi: 10.1117/12.403841
Proc. SPIE 4222, Three-dimensional welding and cutting using high-power CO2 or YAG laser, 0000 (10 October 2000); doi: 10.1117/12.403842
Proc. SPIE 4222, Optoelectronic inspection method for IC shell blanks, 0000 (10 October 2000); doi: 10.1117/12.403843
Proc. SPIE 4222, Novel image connection method used in the measurement of geometrical parameters, 0000 (10 October 2000); doi: 10.1117/12.403844
Proc. SPIE 4222, Fast integrated multiparameter detecting system for shaft parts, 0000 (10 October 2000); doi: 10.1117/12.403846
Proc. SPIE 4222, Defect inspection in optical fibers based on a quasi-joint transform correlator, 0000 (10 October 2000); doi: 10.1117/12.403847
Proc. SPIE 4222, Mapping matrices and weight function in high-precision EST of flatness by optical probe, 0000 (10 October 2000); doi: 10.1117/12.403849
Proc. SPIE 4222, Fiber optic sensors for safety control of civil structures, 0000 (10 October 2000); doi: 10.1117/12.403852
Proc. SPIE 4222, Detection and estimation of signal time of arrival (TOA) for wireless location based on mobile telecommunication network, 0000 (10 October 2000); doi: 10.1117/12.403855
Proc. SPIE 4222, Fast algorithm of calculating invariant features for image matching, 0000 (10 October 2000); doi: 10.1117/12.403860
Proc. SPIE 4222, Adaptive Sobel operator and its uses, 0000 (10 October 2000); doi: 10.1117/12.403862
Proc. SPIE 4222, Computer control system based on fuzzy control for boilers, 0000 (10 October 2000); doi: 10.1117/12.403863
Proc. SPIE 4222, Minimum stable speed for Ground Servo System launching laser beam to interfere with an air target, 0000 (10 October 2000); doi: 10.1117/12.403865
Proc. SPIE 4222, Low-speed jitter adaptive control in an optoelectronic tracking system, 0000 (10 October 2000); doi: 10.1117/12.403866
Proc. SPIE 4222, Chaos self-adapting parameter modulate system based on electro-optics device, 0000 (10 October 2000); doi: 10.1117/12.403867
Proc. SPIE 4222, Electronic parameter modulate hyperchaos system based on semiconductor laser, 0000 (10 October 2000); doi: 10.1117/12.403868
Proc. SPIE 4222, Method of real-time control and data processing of the laser roundness instrument, 0000 (10 October 2000); doi: 10.1117/12.403869
Proc. SPIE 4222, Fault diagnosis method using network and fuzziness, 0000 (10 October 2000); doi: 10.1117/12.403870
Proc. SPIE 4222, Development of research on super-precision measurement techniques for circle and cylindrical contour, 0000 (10 October 2000); doi: 10.1117/12.403871
Proc. SPIE 4222, Optical probe using differential confocal technique for surface profile, 0000 (10 October 2000); doi: 10.1117/12.403872
Proc. SPIE 4222, Optical fiber interference target flowmeter II: damper design, 0000 (10 October 2000); doi: 10.1117/12.403874
Proc. SPIE 4222, Visual servo control system of space robot, 0000 (10 October 2000); doi: 10.1117/12.403875
Proc. SPIE 4222, Auto-testing system for measuring optic characteristics of vehicular lamp, 0000 (10 October 2000); doi: 10.1117/12.403876
Proc. SPIE 4222, Fast 3D measurement method for multibeam confocal system and system error calibrating, 0000 (10 October 2000); doi: 10.1117/12.403877
Proc. SPIE 4222, Multisensor image fusion based on wavelet transform, 0000 (10 October 2000); doi: 10.1117/12.403878
Proc. SPIE 4222, Fuzzy feature matching between radar image and optical image, 0000 (10 October 2000); doi: 10.1117/12.403879
Proc. SPIE 4222, Estimation of navigation parameters from real-time aerial scene, 0000 (10 October 2000); doi: 10.1117/12.403880
Proc. SPIE 4222, Analysis of the effect on electron density along the laser path by adding magnetic field in laser beam welding, 0000 (10 October 2000); doi: 10.1117/12.403881
Proc. SPIE 4222, Computer platform for the analysis of the process of laser welding, 0000 (10 October 2000); doi: 10.1117/12.403882
Proc. SPIE 4222, Phase unwrapping algorithm based on fringe density analysis in Fourier transform profilometry, 0000 (10 October 2000); doi: 10.1117/12.403883
Proc. SPIE 4222, Fourier transform profilometry for dynamic 3D shape, 0000 (10 October 2000); doi: 10.1117/12.403884
Proc. SPIE 4222, Binary coded grating with error diffusion and its application in 3D sensing, 0000 (10 October 2000); doi: 10.1117/12.403885
Proc. SPIE 4222, New algorithm for fuzzy biomedical image segmentation, 0000 (10 October 2000); doi: 10.1117/12.403886
Proc. SPIE 4222, Core image acquiring and processing, 0000 (10 October 2000); doi: 10.1117/12.403887
Proc. SPIE 4222, Distributed optical fiber strain sensor based on a novel microbend structure, 0000 (10 October 2000); doi: 10.1117/12.403888
Proc. SPIE 4222, Fusion in frequency-domain of instantaneous laser assistant vision image and low-light-level image, 0000 (10 October 2000); doi: 10.1117/12.403890
Proc. SPIE 4222, Optimizing design of servo control in Infrared Search and Track (IRST) systems, 0000 (10 October 2000); doi: 10.1117/12.403891
Proc. SPIE 4222, DDGIPS: a general image processing system in robot vision, 0000 (10 October 2000); doi: 10.1117/12.403892
Proc. SPIE 4222, Pulsed laser/background light simulator, 0000 (10 October 2000); doi: 10.1117/12.403893
Proc. SPIE 4222, New soft-measuring system of polarized light, 0000 (10 October 2000); doi: 10.1117/12.403894
Proc. SPIE 4222, Low-power optoelectronic count, 0000 (10 October 2000); doi: 10.1117/12.403895
Proc. SPIE 4222, Simple image subtraction using phase shift property of photorefractive two-wave mixing, 0000 (10 October 2000); doi: 10.1117/12.403896
Proc. SPIE 4222, Three-dimensional view based on RS and GIS: three-dimensional simulation of Mount Taishan, 0000 (10 October 2000); doi: 10.1117/12.403898
Proc. SPIE 4222, Software solution to counting and subdivision of moire fringes with wide dynamic range, 0000 (10 October 2000); doi: 10.1117/12.403899
Proc. SPIE 4222, Reflective fiber optic displacement sensor with intensity compensation, 0000 (10 October 2000); doi: 10.1117/12.403900
Proc. SPIE 4222, Effect on intensity modulation caused by perpendicularity between the axes of fiber pair and reflector, 0000 (10 October 2000); doi: 10.1117/12.403901
Proc. SPIE 4222, Wide-range and high-resolution displacement measurement with grating, 0000 (10 October 2000); doi: 10.1117/12.403902