PROCEEDINGS VOLUME 4295
PHOTONICS WEST 2001 - ELECTRONIC IMAGING | 20-26 JANUARY 2001
Flat Panel Display Technology and Display Metrology II
PHOTONICS WEST 2001 - ELECTRONIC IMAGING
20-26 January 2001
San Jose, CA, United States
Advanced p-Si Film Formation Techniques
Proc. SPIE 4295, Advanced excimer laser crystallization techniques of Si thin film for location control of large grain on glass, 0000 (30 April 2001); doi: 10.1117/12.424856
Proc. SPIE 4295, Excimer-laser-crystallized poly-Si thin film transistors, 0000 (30 April 2001); doi: 10.1117/12.424866
Advanced p-Si Film Processing
Proc. SPIE 4295, Excimer laser annealing system for AMLCDs: a long laser pulse for high-performance, uniform, and stable TFT, 0000 (30 April 2001); doi: 10.1117/12.424884
Proc. SPIE 4295, 1-J and 300-W excimer laser with exceptional pulse stability for poly-Si crystallization, 0000 (30 April 2001); doi: 10.1117/12.424885
Proc. SPIE 4295, Simulation of transient temperature profiles during ELA and relation to process parameters, 0000 (30 April 2001); doi: 10.1117/12.424886
p-Si Technology Trends
Proc. SPIE 4295, Technology trends in LPS technology and forecast for the future, 0000 (30 April 2001); doi: 10.1117/12.424887
Proc. SPIE 4295, Polysilicon TFT on plastics, 0000 (30 April 2001); doi: 10.1117/12.424888
Proc. SPIE 4295, Low-temperature polysilicon technology for active matrix addressing of LCDs and OLEDs, 0000 (30 April 2001); doi: 10.1117/12.424857
Low-Temperature p-Si Circuits and Technology
Proc. SPIE 4295, Alternatives to low-temperature poly-Si technology in active matrix displays, 0000 (30 April 2001); doi: 10.1117/12.424858
Proc. SPIE 4295, Switch-on transient behavior in low-temperature polysilicon thin film transistors, 0000 (30 April 2001); doi: 10.1117/12.424859
Proc. SPIE 4295, 6-bit multiresolution digital-to-analog converter for low-temperature polysilicon digital drivers, 0000 (30 April 2001); doi: 10.1117/12.424860
Proc. SPIE 4295, Modeling and performance of polysilicon thin film transistor circuits on stainless steel foil substrates, 0000 (30 April 2001); doi: 10.1117/12.424861
Proc. SPIE 4295, Polycrystalline silicon thin film transistor technology for flexible large-area electronics, 0000 (30 April 2001); doi: 10.1117/12.424862
Proc. SPIE 4295, Reliability of polysilicon thin film transistors on stainless steel foil substrates, 0000 (30 April 2001); doi: 10.1117/12.424863
Si-Driven Organic/Polymer LEDs
Proc. SPIE 4295, Novel multiple lateral polysilicon p+-n-n+ and p+-p-n+ diodes, 0000 (30 April 2001); doi: 10.1117/12.424865
Proc. SPIE 4295, Poly-Si driving circuits for organic EL displays, 0000 (30 April 2001); doi: 10.1117/12.424867
Proc. SPIE 4295, Passive and active matrix addressed polymer light-emitting diode displays, 0000 (30 April 2001); doi: 10.1117/12.424868
Proc. SPIE 4295, a-Si:H pixel electrode circuits for AM-OLEDs, 0000 (30 April 2001); doi: 10.1117/12.424869
Medical Display Requirements
Proc. SPIE 4295, Objective performance evaluation of medical image displays: a preliminary report of the AAPM TG18, 0000 (30 April 2001); doi: 10.1117/12.424870
Proc. SPIE 4295, Computed radiographic examinations of subtle bone pathology: implications for liquid crystal displays in radiology, 0000 (30 April 2001); doi: 10.1117/12.424871
Array Detector Measurements
Proc. SPIE 4295, Digital imaging colorimeter for fast measurement of chromaticity coordinate and luminance uniformity of displays, 0000 (30 April 2001); doi: 10.1117/12.424872
Proc. SPIE 4295, Image photometry applied to measuring visual displays, 0000 (30 April 2001); doi: 10.1117/12.424873
Proc. SPIE 4295, Measurements of static noise in display images, 0000 (30 April 2001); doi: 10.1117/12.424874
Display Characterization
Proc. SPIE 4295, Retinal scanning display (RSD) technology and the task of measuring contrast, 0000 (30 April 2001); doi: 10.1117/12.424875
Proc. SPIE 4295, Quantification of specular image distinction in avionics active matrix liquid crystal display (AMLCD) applications, 0000 (30 April 2001); doi: 10.1117/12.424876
Proc. SPIE 4295, Light-measuring device diagnostics for the photometric and colorimetric measurement of flying-spot displays, 0000 (30 April 2001); doi: 10.1117/12.424877
Proc. SPIE 4295, Characterization of crosstalk in high-resolution active matrix liquid crystal displays for medical imaging, 0000 (30 April 2001); doi: 10.1117/12.424878
Display Calibration
Proc. SPIE 4295, Tritium-activated RGB reference sources for the calibration of CRTs, 0000 (30 April 2001); doi: 10.1117/12.424879
Proc. SPIE 4295, Construction of a programmable light source for use as a display calibration artifact, 0000 (30 April 2001); doi: 10.1117/12.424880
Proc. SPIE 4295, Implementation of a color calibration method for liquid crystal displays, 0000 (30 April 2001); doi: 10.1117/12.424881
Proc. SPIE 4295, Standard illumination source for the evaluation of display measurement methods and instruments, 0000 (30 April 2001); doi: 10.1117/12.424882
Advanced p-Si Film Formation Techniques
Proc. SPIE 4295, Excimer-laser-produced two-dimensional arrays of large Si grains, 0000 (30 April 2001); doi: 10.1117/12.424883
Back to Top