PROCEEDINGS VOLUME 4317
SECOND INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS | 29 NOVEMBER - 1 DECEMBER 2000
Second International Conference on Experimental Mechanics
SECOND INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS
29 November - 1 December 2000
Singapore, Singapore
Speckle I
Proc. SPIE 4317, Some new developments in experimental mechanics using random particles and fractal dimension, 0000 (13 June 2001); doi: 10.1117/12.429541
Proc. SPIE 4317, Analysis of wavy propagation of plastic deformation field by dynamic ESPI, 0000 (13 June 2001); doi: 10.1117/12.429557
Proc. SPIE 4317, Digital speckle correlation method with compensation technique for strain field measurements, 0000 (13 June 2001); doi: 10.1117/12.429568
Proc. SPIE 4317, Combined digital speckle photography (DSP) and interferometry, 0000 (13 June 2001); doi: 10.1117/12.429579
Proc. SPIE 4317, Stress analysis of mixed-mode crack of homogeneous and dissimilar materials by speckle photography, 0000 (13 June 2001); doi: 10.1117/12.429589
Proc. SPIE 4317, Study of the fractal correlation method in displacement measurement, 0000 (13 June 2001); doi: 10.1117/12.429600
Experimental Techniques I
Proc. SPIE 4317, Noncontact strain-controlled fatigue test with digital image measurement system, 0000 (13 June 2001); doi: 10.1117/12.429611
Proc. SPIE 4317, Development of a general-purpose spacecraft structural test system, 0000 (13 June 2001); doi: 10.1117/12.429622
Proc. SPIE 4317, Shearing interferometer using a beam displacer, 0000 (13 June 2001); doi: 10.1117/12.429632
Proc. SPIE 4317, Attitude and position monitoring system of a cube corner prism used in an optical interferometer, 0000 (13 June 2001); doi: 10.1117/12.429542
Proc. SPIE 4317, Investigation on residual stresses induced by self-drilling screw on polycarbonate plates, 0000 (13 June 2001); doi: 10.1117/12.429548
Proc. SPIE 4317, Measurement of angle of rotation using circular optical grating, 0000 (13 June 2001); doi: 10.1117/12.429549
Testing and Materials I
Proc. SPIE 4317, Experimental research on fatigue performance of a material by temperature change, 0000 (13 June 2001); doi: 10.1117/12.429550
Proc. SPIE 4317, Modification of SHPB setup based on wave separation technique and dynamic Saint-Venant's principle, 0000 (13 June 2001); doi: 10.1117/12.429551
Proc. SPIE 4317, Dynamic three-point bending tester using inertial mass and optical interferometer, 0000 (13 June 2001); doi: 10.1117/12.429552
Proc. SPIE 4317, Dynamic tensile response of a carbon-fiber-reinforced LCP composite and its temperature sensitivity, 0000 (13 June 2001); doi: 10.1117/12.429553
Proc. SPIE 4317, High-strain-rate characterization of TPOs and graphite/epoxy and graphite/peek composites, 0000 (13 June 2001); doi: 10.1117/12.429554
Proc. SPIE 4317, Mixed-mode fracture behavior of PC/ABS blends, 0000 (13 June 2001); doi: 10.1117/12.429555
Photoelasticity I (Techniques)
Proc. SPIE 4317, Frequency domain methods in digital photoelasticity, 0000 (13 June 2001); doi: 10.1117/12.429556
Proc. SPIE 4317, Whole-field stress separation by oblique incidence using phase-shifting technique, 0000 (13 June 2001); doi: 10.1117/12.429558
Proc. SPIE 4317, Determination of the normalized Jones matrix of elliptical retarder, 0000 (13 June 2001); doi: 10.1117/12.429559
Proc. SPIE 4317, 3D stress analysis by scattered light photoelasticity, 0000 (13 June 2001); doi: 10.1117/12.429560
Proc. SPIE 4317, Dynamic photoelasticity by TDI imaging, 0000 (13 June 2001); doi: 10.1117/12.429561
Proc. SPIE 4317, Elliptically polarized white-light photoviscoelastic technique and its application, 0000 (13 June 2001); doi: 10.1117/12.429562
Digital Imaging and Image Processing I
Proc. SPIE 4317, Effects of image compression on digital specklegrams, 0000 (13 June 2001); doi: 10.1117/12.429563
Proc. SPIE 4317, Analysis of oblique fringes by fringe pattern matching, 0000 (13 June 2001); doi: 10.1117/12.429564
Proc. SPIE 4317, Exact solution of the photoelastic experiment of a composite model by oblique incidence method, 0000 (13 June 2001); doi: 10.1117/12.429565
Moire
Proc. SPIE 4317, Phase-shifting projection moire for out-of-plane displacement measurement, 0000 (13 June 2001); doi: 10.1117/12.429566
Proc. SPIE 4317, Thermal deformation measurement of electronic packaging component using AFM scanning moire method, 0000 (13 June 2001); doi: 10.1117/12.429567
Proc. SPIE 4317, New moire method for industry online measurement, 0000 (13 June 2001); doi: 10.1117/12.429569
Proc. SPIE 4317, Deformation study on carbon-fiber-braided composite subjected to low-temperature cycle, 0000 (13 June 2001); doi: 10.1117/12.429570
Proc. SPIE 4317, Measurement of residual stresses in polymer composites using moire interferometry, 0000 (13 June 2001); doi: 10.1117/12.429571
Fiber Optic Sensors I
Proc. SPIE 4317, Optical 3D shape, surface, and material analysis, 0000 (13 June 2001); doi: 10.1117/12.429572
Proc. SPIE 4317, FEM analysis of surface-mounted distributed optical fiber sensors, 0000 (13 June 2001); doi: 10.1117/12.429573
Proc. SPIE 4317, FMCW reflectometric optical fiber strain sensor, 0000 (13 June 2001); doi: 10.1117/12.429574
Proc. SPIE 4317, Interrogation of fiber Bragg grating sensors with a fiber grating filter tuned by a cantilever beam, 0000 (13 June 2001); doi: 10.1117/12.429575
Proc. SPIE 4317, Optical gage for high-temperature strain measurement by using quartz optical fiber, 0000 (13 June 2001); doi: 10.1117/12.429576
Proc. SPIE 4317, Polarimetric sensors for damage detection of aluminum materials, 0000 (13 June 2001); doi: 10.1117/12.429577
Proc. SPIE 4317, Experiences with fiber optic Bragg grating sensors in civil engineering, 0000 (13 June 2001); doi: 10.1117/12.429578
Micromeasurement
Proc. SPIE 4317, Micromechanics experimental study for the interphase of composite materials, 0000 (13 June 2001); doi: 10.1117/12.429580
Proc. SPIE 4317, New instrument for measuring mechanical compliance of microsystems, 0000 (13 June 2001); doi: 10.1117/12.429581
Proc. SPIE 4317, Electronic holographic moire in the micron range, 0000 (13 June 2001); doi: 10.1117/12.429582
Proc. SPIE 4317, Evaluation of microbeam deflection using interferometry, 0000 (13 June 2001); doi: 10.1117/12.429583
Proc. SPIE 4317, Diffraction strain sensor for micromeasurements, 0000 (13 June 2001); doi: 10.1117/12.429584
Testing and Materials II
Proc. SPIE 4317, New approach to evaluation of fiber/matrix interface, 0000 (13 June 2001); doi: 10.1117/12.429585
Proc. SPIE 4317, Measuring toughness of copper-bismaleimide traizine interface by peel test, 0000 (13 June 2001); doi: 10.1117/12.429586
Proc. SPIE 4317, Test method for fatigue crack propagation along interface between ceramic coating and substrate, 0000 (13 June 2001); doi: 10.1117/12.429587
Proc. SPIE 4317, AFM observations of grain boundary step in low-cycle fatigue in copper, 0000 (13 June 2001); doi: 10.1117/12.429588
Nondestructive Testing
Proc. SPIE 4317, Fatigue evaluation of metals using infrared thermography, 0000 (13 June 2001); doi: 10.1117/12.429590
Proc. SPIE 4317, Inspection of defects in wineglasses using Gabor-filter demodulation method, 0000 (13 June 2001); doi: 10.1117/12.429591
Proc. SPIE 4317, Modified electrochemical emission spectroscopy (MEES) as NDT method of detection of SCC of metallic glasses, 0000 (13 June 2001); doi: 10.1117/12.429592
Proc. SPIE 4317, Optical NDT of delaminated plates under shear wave excitation, 0000 (13 June 2001); doi: 10.1117/12.429593
Proc. SPIE 4317, Shearographic NDT of joined surfaces using multiple-frequency sweep, 0000 (13 June 2001); doi: 10.1117/12.429594
Hybrid Techniques
Proc. SPIE 4317, Extraction of isotropic points using simulated isoclinics obtained by photoelasticity-assisted finite element analysis, 0000 (13 June 2001); doi: 10.1117/12.429595
Proc. SPIE 4317, Hybridizing experimental, numerical, and analytical stress analysis techniques, 0000 (13 June 2001); doi: 10.1117/12.429596
Proc. SPIE 4317, Integrating experimental and analytical data for validating finite element models, 0000 (13 June 2001); doi: 10.1117/12.429597
Proc. SPIE 4317, Numerical simulation of carbon reflection on silicon substrate in chemical vapor deposition method by molecular dynamics, 0000 (13 June 2001); doi: 10.1117/12.429598
Experimental Techniques II
Proc. SPIE 4317, Development of displacement and force measurement system for punching test of rigid copper clad laminates, 0000 (13 June 2001); doi: 10.1117/12.429599
Proc. SPIE 4317, Experimental investigation of T-tubular joint subjected to complex loading conditions, 0000 (13 June 2001); doi: 10.1117/12.429601