PROCEEDINGS VOLUME 4398
LASERS IN METROLOGY AND ART CONSERVATION | 18-22 JUNE 2001
Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design
IN THIS VOLUME

0 Sessions, 35 Papers, 0 Presentations
Techniques I  (4)
Systems I  (5)
Systems II  (4)
Systems III  (4)
Systems IV  (3)
Applications  (2)
LASERS IN METROLOGY AND ART CONSERVATION
18-22 June 2001
Munich, Germany
Techniques I
Proc. SPIE 4398, Ultrashort-pulse interferometric sensors for optical shape and deformation measurement, 0000 (23 October 2001); doi: 10.1117/12.445537
Proc. SPIE 4398, Electronic speckle pattern interferometry based on spatial fringe analysis method, 0000 (23 October 2001); doi: 10.1117/12.445547
Proc. SPIE 4398, Projection of structured light in object planes of varying depths for absolute 3D profiling in a triangulation setup, 0000 (23 October 2001); doi: 10.1117/12.445556
Proc. SPIE 4398, Fringe pattern compensation by synthesis of phase-shifted interferograms, 0000 (23 October 2001); doi: 10.1117/12.445565
Techniques II
Proc. SPIE 4398, Long-base optical extensometer for tensile testing machines, 0000 (23 October 2001); doi: 10.1117/12.445567
Proc. SPIE 4398, Influence of depolarization effects in interferometric measurement methods, 0000 (23 October 2001); doi: 10.1117/12.445568
Proc. SPIE 4398, Combining finite element analysis with digital light-in-flight recording by holography, 0000 (23 October 2001); doi: 10.1117/12.445569
Proc. SPIE 4398, Specification of spectral line shape and dispersion of a medium by self-imaging and moire techniques, 0000 (23 October 2001); doi: 10.1117/12.445570
Systems I
Proc. SPIE 4398, Self-calibrating 360-degree shape measurement systems, 0000 (23 October 2001); doi: 10.1117/12.445571
Proc. SPIE 4398, Determining 3D shapes of hybrid surfaces by laser rangefinder, 0000 (23 October 2001); doi: 10.1117/12.445538
Proc. SPIE 4398, High-resolution dimensional measurement apparatus using optical scale with different grating pitches, 0000 (23 October 2001); doi: 10.1117/12.445539
Proc. SPIE 4398, Laser-doppler sensor system for speed and length measurements at moving surfaces, 0000 (23 October 2001); doi: 10.1117/12.445540
Proc. SPIE 4398, Absolute optical path difference measurement with angstrom accuracy over ranges of millimeters, 0000 (23 October 2001); doi: 10.1117/12.445541
Systems II
Proc. SPIE 4398, Study of relationships between roughness and lightness of precision-machined surfaces, 0000 (23 October 2001); doi: 10.1117/12.445542
Proc. SPIE 4398, Three-line rangefinder for shape, slope, and local curvature measurement from a robot arm, 0000 (23 October 2001); doi: 10.1117/12.445543
Proc. SPIE 4398, Novel laser grating interferometer (LES) for industrial applications, 0000 (23 October 2001); doi: 10.1117/12.445544
Proc. SPIE 4398, Plastic disk inspection system: an approach using two-dimensional birefringence distribution measurement, 0000 (23 October 2001); doi: 10.1117/12.445545
Systems III
Proc. SPIE 4398, 3D ESPI and 3D shearography measurements applied to NDT and FEM analysis validation for industrial quality control, 0000 (23 October 2001); doi: 10.1117/12.445546
Proc. SPIE 4398, Endoscopic electronic-speckle-pattern interferometry: application to nondestructive quality control in industry and medicine, 0000 (23 October 2001); doi: 10.1117/12.445548
Proc. SPIE 4398, 3D-PulsESPI technique for dynamic deformation measurement, 0000 (23 October 2001); doi: 10.1117/12.445549
Poster Session
Proc. SPIE 4398, Speckle index in dynamic processes: application to drying of paint, 0000 (23 October 2001); doi: 10.1117/12.445550
Systems IV
Proc. SPIE 4398, Application of digital holographic microscopy for inspection of micro-optical components, 0000 (23 October 2001); doi: 10.1117/12.445551
Proc. SPIE 4398, Three-dimensional profilometry using hybrid grating projection, 0000 (23 October 2001); doi: 10.1117/12.445552
Proc. SPIE 4398, Calibration techniques for fringe projectors, 0000 (23 October 2001); doi: 10.1117/12.445553
Applications
Proc. SPIE 4398, Strain measurement in curved industrial components using multicomponent shearography, 0000 (23 October 2001); doi: 10.1117/12.445554
Proc. SPIE 4398, Two-beam shearing interferometric method for testing a conical lens, 0000 (23 October 2001); doi: 10.1117/12.445555
Poster Session
Proc. SPIE 4398, Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer, 0000 (23 October 2001); doi: 10.1117/12.445557
Proc. SPIE 4398, Features of the subjective speckle field and their use for noise-immune unwrapping, 0000 (23 October 2001); doi: 10.1117/12.445558
Proc. SPIE 4398, Detection of microbumps in aeronautic surfaces by means of an elastical moire system, 0000 (23 October 2001); doi: 10.1117/12.445559
Proc. SPIE 4398, Distorted noisy interferogram enhancement and evaluation by nonlinear 2D data-dependent fringe processing, 0000 (23 October 2001); doi: 10.1117/12.445560
Systems III
Proc. SPIE 4398, Study of parameters affecting the sensitivity of a 3D measurement system using the phase shifting technique, 0000 (23 October 2001); doi: 10.1117/12.445561
Poster Session
Proc. SPIE 4398, Novel method for determination of spot/line position in the array-based triangulation sensors, 0000 (23 October 2001); doi: 10.1117/12.445562
Proc. SPIE 4398, Application of multistep algorithms for deformation measurement, 0000 (23 October 2001); doi: 10.1117/12.445563
Proc. SPIE 4398, Noncontact laser speckle sensor for measuring one- and two-dimensional angular displacement, 0000 (23 October 2001); doi: 10.1117/12.445564
Proc. SPIE 4398, Two-wavelength optical tomography system for industrial applications, 0000 (23 October 2001); doi: 10.1117/12.445566
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