PROCEEDINGS VOLUME 4399
LASERS IN METROLOGY AND ART CONSERVATION | 18-22 JUNE 2001
Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering
IN THIS VOLUME

0 Sessions, 17 Papers, 0 Presentations
3D Testing  (4)
LASERS IN METROLOGY AND ART CONSERVATION
18-22 June 2001
Munich, Germany
Interferometric Testing
Proc. SPIE 4399, Use of endoscopes in pulsed digital holographic interferometry, 0000 (3 October 2001); doi: 10.1117/12.445572
Proc. SPIE 4399, Digital holographic interferometry for characterization of transparent materials, 0000 (3 October 2001); doi: 10.1117/12.445580
Proc. SPIE 4399, Moire interferometry using stuck foil-embossed diffraction grating, 0000 (3 October 2001); doi: 10.1117/12.445585
Surface Inspection
Proc. SPIE 4399, In-line detection and evaluation of surface defects on thin metallic wires, 0000 (3 October 2001); doi: 10.1117/12.445586
Proc. SPIE 4399, Reflection grating method for 3D measurement of reflecting surfaces, 0000 (3 October 2001); doi: 10.1117/12.445587
Proc. SPIE 4399, Diode laser interferometer for surface profilometry with nanometer resolution on lateral dimensions in the centimeter range, 0000 (3 October 2001); doi: 10.1117/12.445588
3D Testing
Proc. SPIE 4399, Shape and displacement determination based on extended spatio-temporal fringe pattern analysis, 0000 (3 October 2001); doi: 10.1117/12.445573
Proc. SPIE 4399, Integrated environment for the inspection of complex parts, 0000 (3 October 2001); doi: 10.1117/12.445574
Proc. SPIE 4399, Tool 3D geometry measurement system, 0000 (3 October 2001); doi: 10.1117/12.445575
Proc. SPIE 4399, Modified high-accuracy 3D shape data conversion system for reverse engineering applications, 0000 (3 October 2001); doi: 10.1117/12.445576
Specific Techniques I
Proc. SPIE 4399, Prototype of a fiber optic sensor for quick measurement of fiber optic eccentricity, 0000 (3 October 2001); doi: 10.1117/12.445577
Proc. SPIE 4399, Near-infrared linear birefringence measurement system using a photoelastic modulator, 0000 (3 October 2001); doi: 10.1117/12.445578
Proc. SPIE 4399, Applications of Fresnel diffraction from phase objects, 0000 (3 October 2001); doi: 10.1117/12.445579
Specific Techniques II
Proc. SPIE 4399, Virtual moire interference approach for an industrial safety monitoring system, 0000 (3 October 2001); doi: 10.1117/12.445581
Proc. SPIE 4399, Virtual optical laboratory for speckle metrology, 0000 (3 October 2001); doi: 10.1117/12.445582
Proc. SPIE 4399, Speckle interferometry for measurement of continuous deformations, 0000 (3 October 2001); doi: 10.1117/12.445583
Proc. SPIE 4399, Application of Ritchey-Common test in large flat measurements, 0000 (3 October 2001); doi: 10.1117/12.445584
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