PROCEEDINGS VOLUME 4401
LASERS IN METROLOGY AND ART CONSERVATION | 18-22 JUNE 2001
Recent Developments in Traceable Dimensional Measurements
LASERS IN METROLOGY AND ART CONSERVATION
18-22 June 2001
Munich, Germany
End Standards
Proc. SPIE 4401, Automatic gauge block measurement by phase stepping interferometry with three laser wavelengths, 0000 (22 October 2001); doi: 10.1117/12.445608
Proc. SPIE 4401, Deformations of a gauging surface texture under wringing conditions, 0000 (22 October 2001); doi: 10.1117/12.445619
Proc. SPIE 4401, Two-part study toward lowest uncertainty calibration of ceramic gauge blocks: interferometry and mechanical comparison techniques, 0000 (22 October 2001); doi: 10.1117/12.445628
Proc. SPIE 4401, Scientific basis for traceable dimensional measurements in a nanometer range: methods and concepts, 0000 (22 October 2001); doi: 10.1117/12.445636
Measuring Gauge Characteristics
Proc. SPIE 4401, Development of an interferometric dilatometer for gauge blocks, 0000 (22 October 2001); doi: 10.1117/12.445640
Proc. SPIE 4401, Characterization of inductance probe for gauge block measurement by Fizeau interferometer, 0000 (22 October 2001); doi: 10.1117/12.445641
Proc. SPIE 4401, Investigation into the measuring of the length spacing of step gauges, 0000 (22 October 2001); doi: 10.1117/12.445642
Proc. SPIE 4401, Japanese ultimate flatness interferometer (FUJI) and its preliminary experiment, 0000 (22 October 2001); doi: 10.1117/12.445643
Distance and Line Scale Measurement
Proc. SPIE 4401, Quadrature phase interferometer used to calibrate dial indicator calibrators, 0000 (22 October 2001); doi: 10.1117/12.445644
Proc. SPIE 4401, Development of a calibration system for electronic distance measuring instruments, 0000 (22 October 2001); doi: 10.1117/12.445609
Proc. SPIE 4401, Traceable measurements for tape benches made easy, 0000 (22 October 2001); doi: 10.1117/12.445610
Proc. SPIE 4401, Development of an automatic line scale measuring instrument, 0000 (22 October 2001); doi: 10.1117/12.445611
Proc. SPIE 4401, Adaptive interferometric metrology system (AIMS) based on an interferometer employing a "common-path" optical configuration, 0000 (22 October 2001); doi: 10.1117/12.445612
Coordinate Metrology
Proc. SPIE 4401, Evaluation of the performance of a novel laser tracker used for coordinate measurements, 0000 (22 October 2001); doi: 10.1117/12.445613
Proc. SPIE 4401, Accuracy and versatility of the NIST M48 coordinate measuring machine, 0000 (22 October 2001); doi: 10.1117/12.445614
Proc. SPIE 4401, Uncertainty estimation by the concept of virtual instruments, 0000 (22 October 2001); doi: 10.1117/12.445615
Proc. SPIE 4401, Virtual CMM using Monte Carlo methods based on frequency content of the error signal, 0000 (22 October 2001); doi: 10.1117/12.445616
Shape and Form Measurements
Proc. SPIE 4401, Novel design of a one-dimensional measurement probe, 0000 (22 October 2001); doi: 10.1117/12.445617
Proc. SPIE 4401, Tracing back radius of curvature and topography to the base unit of length with ultraprecision, 0000 (22 October 2001); doi: 10.1117/12.445618
Proc. SPIE 4401, Use and treaceable calibration of autocollimators for ultra-precise measurement of slope and topography, 0000 (22 October 2001); doi: 10.1117/12.445620
Proc. SPIE 4401, Recent length and angle comparisons in Asia Pacific, 0000 (22 October 2001); doi: 10.1117/12.445621
Nanoscale Measurements
Proc. SPIE 4401, Development and traceability of a multifunctional microscope, 0000 (22 October 2001); doi: 10.1117/12.445622
Proc. SPIE 4401, Calibration of nanosensors with direct traceability to the meter, 0000 (22 October 2001); doi: 10.1117/12.445623
Measuring Gauge Characteristics
Proc. SPIE 4401, Precise interferometric measurements at single-crystal silicon yielding thermal expansion coefficients from 12 deg to 28 degC and compressibility, 0000 (22 October 2001); doi: 10.1117/12.445624
Nanoscale Measurements
Proc. SPIE 4401, Calibration of a 2D reference mirror system of a photomask measuring instrument, 0000 (22 October 2001); doi: 10.1117/12.445625
Establishing Direct Traceability on the Shop Floor
Proc. SPIE 4401, Developments at NIST on traceability in dimensional measurements, 0000 (22 October 2001); doi: 10.1117/12.445626
Proc. SPIE 4401, Realizing traceability to the SI in dimensional metrology: today and in the future, 0000 (22 October 2001); doi: 10.1117/12.445627
Poster Session
Proc. SPIE 4401, Portable I2-stabilized Nd:YVO4/KTP laser for secondary wavelength standards at 532 nm, 0000 (22 October 2001); doi: 10.1117/12.445629
Proc. SPIE 4401, Automatic high-precision calibration system for angle encoder, 0000 (22 October 2001); doi: 10.1117/12.445630
Proc. SPIE 4401, Status of the nanometer comparator at PTB, 0000 (22 October 2001); doi: 10.1117/12.445631
Proc. SPIE 4401, Absolute measurement of planarity: pixel versus Zernike data analysis, 0000 (22 October 2001); doi: 10.1117/12.445632
Proc. SPIE 4401, Gauge block interferometer using three frequency-stabilized lasers, 0000 (22 October 2001); doi: 10.1117/12.445633
Proc. SPIE 4401, Improved calibration of an interference microscope, 0000 (22 October 2001); doi: 10.1117/12.445634
Proc. SPIE 4401, Nonlinear error of common-path laser heterodyne interferometer, 0000 (22 October 2001); doi: 10.1117/12.445635
Nanoscale Measurements
Proc. SPIE 4401, Digital in-line holography with numerical reconstruction: three-dimensional particle tracking, 0000 (22 October 2001); doi: 10.1117/12.445637
Poster Session
Proc. SPIE 4401, New instrument for the measurement of diameter and form of cylinders, 0000 (22 October 2001); doi: 10.1117/12.445638
Proc. SPIE 4401, New modified Michelson's interferometer and its applications in metrology as new miniaturized absolute portable gravimeter, 0000 (22 October 2001); doi: 10.1117/12.445639
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