PROCEEDINGS VOLUME 4419
IV IBEROAMERICAN MEETING OF OPTICS AND THE VII LATIN AMERICAN MEETING OF OPTICS, LASERS AND THEIR APPLICATIONS | 3-7 SEPTEMBER 2001
4th Iberoamerican Meeting on Optics and 7th Latin American Meeting on Optics, Lasers, and Their Applications
IV IBEROAMERICAN MEETING OF OPTICS AND THE VII LATIN AMERICAN MEETING OF OPTICS, LASERS AND THEIR APPLICATIONS
3-7 September 2001
Tandil, Argentina
Optical Metrology
Proc. SPIE 4419, Strains and stress distribution on the shearwall by speckle photography technique, 0000 (14 August 2001); doi: 10.1117/12.437055
Proc. SPIE 4419, Application of high-speed phase-shifted speckle interferometry to the detection of subsurface delaminations in carbon fiber composites, 0000 (14 August 2001); doi: 10.1117/12.437203
Industrial and Biomedical Applications
Proc. SPIE 4419, Modified electrochemical emission spectroscopy (MEES) of detection of crevice corrosion of metallic alloys, 0000 (14 August 2001); doi: 10.1117/12.437229
Optical Spectroscopy
Proc. SPIE 4419, Transition probabilities of molecular systems in presence-of-time-dependent electric fields, 0000 (14 August 2001); doi: 10.1117/12.437237
Nonlinear Optics
Proc. SPIE 4419, Modification in the relaxation times and strength constant of potential curves in four-wave mixing, 0000 (14 August 2001); doi: 10.1117/12.437244
Optical Spectroscopy
Proc. SPIE 4419, Evolution operator calculation and transition probability study of molecules interacting with an electromagnetic field, 0000 (14 August 2001); doi: 10.1117/12.437247
Optical Metrology
Proc. SPIE 4419, Integral system of virtual instruments for characterizing particles using optical methods, 0000 (14 August 2001); doi: 10.1117/12.437056
Optoelectronic Devices
Proc. SPIE 4419, Fiber Fabry-Perot cavities using linearly chirped fiber Bragg gratings, 0000 (14 August 2001); doi: 10.1117/12.437071
Optical Metrology
Proc. SPIE 4419, Moire technique and measurement of vibrations, 0000 (14 August 2001); doi: 10.1117/12.437092
Industrial and Biomedical Applications
Proc. SPIE 4419, Moire topography in odontology, 0000 (14 August 2001); doi: 10.1117/12.437095
Optical Metrology
Proc. SPIE 4419, Piston detection with the classical Ronchi test, 0000 (14 August 2001); doi: 10.1117/12.437101
Condensed Matter and Thin Films Optics
Proc. SPIE 4419, Microtopographic characterization of graded Cr-Cr2O3 cermet solar coatings, 0000 (14 August 2001); doi: 10.1117/12.437107
Color, Vision, and Radiometry
Proc. SPIE 4419, Fifty years of the modulation transfer function, 0000 (14 August 2001); doi: 10.1117/12.437113
Proc. SPIE 4419, Determination of the sensitivity coefficient related to gloss estimation as a function of the temperature in the evaluation of its typical uncertainty, 0000 (14 August 2001); doi: 10.1117/12.437124
Nonlinear Optics
Proc. SPIE 4419, Experimental observation of spatial bright soliton branching in a SBN61:Ce crystal, 0000 (14 August 2001); doi: 10.1117/12.437149
Optoelectronic Devices
Proc. SPIE 4419, Simple fiber optic device to interrogate fiber optic Bragg gratings used as sensors, 0000 (14 August 2001); doi: 10.1117/12.437158
Optical Metrology
Proc. SPIE 4419, Two-beam interferometer illuminated by a non-monochromatic incoherent periodic source: I. Young's interferometer, 0000 (14 August 2001); doi: 10.1117/12.437162
Atmospheric Optics
Proc. SPIE 4419, Models of turbulence for aero-optics applications, 0000 (14 August 2001); doi: 10.1117/12.437183
Optical Metrology
Proc. SPIE 4419, Phase retrieval in electronic speckle pattern interferometry using the continuous wavelet transform, 0000 (14 August 2001); doi: 10.1117/12.437189
Proc. SPIE 4419, Two beam interferometer illuminated by a non-monochromatic incoherent periodic source: II. Wollaston prism, 0000 (14 August 2001); doi: 10.1117/12.437193
Color, Vision, and Radiometry
Proc. SPIE 4419, Why the contrast function slope is important, 0000 (14 August 2001); doi: 10.1117/12.437204
Nonlinear Optics
Proc. SPIE 4419, Simultaneous stochastic effects of the solvent and electromagnetic field on the absorptive and dispersive process in a four-wave mixing signal, 0000 (14 August 2001); doi: 10.1117/12.437208
Physical Optics
Proc. SPIE 4419, Optical description of an interface, 0000 (14 August 2001); doi: 10.1117/12.437215
Optical Instruments
Proc. SPIE 4419, Correction of longitudinal chromatic aberration of polychromatic Gaussian beams, 0000 (14 August 2001); doi: 10.1117/12.437216
Lasers and Quantum Optics
Proc. SPIE 4419, Amplification of polarized signals using a helically wound erbium-doped fiber amplifier, 0000 (14 August 2001); doi: 10.1117/12.437217
Optical Metrology
Proc. SPIE 4419, Determination of displacement derivatives by multiple-source photometry, 0000 (14 August 2001); doi: 10.1117/12.437218
Optoelectronic Devices
Proc. SPIE 4419, Polarization optics for out-of-plane light trajectories: GRIN lenses and optical fibers, 0000 (14 August 2001); doi: 10.1117/12.437219
Lasers and Quantum Optics
Proc. SPIE 4419, Electromagnetic fields effects on the optical properties in a two-level system immersed in a thermal bath, 0000 (14 August 2001); doi: 10.1117/12.437220
Optical Materials
Proc. SPIE 4419, High-sensitivity thermal lens absorption measurement using nearly collimated beams, 0000 (14 August 2001); doi: 10.1117/12.437225
Physical Optics
Proc. SPIE 4419, Comparison by theory and experiment for the scattering of light by two-dimensional randomly rough metallic surfaces, 0000 (14 August 2001); doi: 10.1117/12.437226
Optical Metrology
Proc. SPIE 4419, Rigid body motion removal by derotating digital holograms, 0000 (14 August 2001); doi: 10.1117/12.437227
Optical Image Processing
Proc. SPIE 4419, Optical processing by volume speckle in a sillenite crystal, 0000 (14 August 2001); doi: 10.1117/12.437228
Physical Optics
Proc. SPIE 4419, Brewster's angle and the effective electric polarization, 0000 (14 August 2001); doi: 10.1117/12.437230
Proc. SPIE 4419, Variation of the polarization of the reflected wave in an isotropic medium-uniaxial crystal interface, 0000 (14 August 2001); doi: 10.1117/12.437231
Optical Metrology
Proc. SPIE 4419, Analysis of diffraction images by a Ronchi grating of objects with a periodical structure, 0000 (14 August 2001); doi: 10.1117/12.437232
Proc. SPIE 4419, Double-exposure specklegrams obtained by using scaled aperture pupils, 0000 (14 August 2001); doi: 10.1117/12.437233
Optical Image Processing
Proc. SPIE 4419, Logic operations by using modulated speckle, 0000 (14 August 2001); doi: 10.1117/12.437234
Optical Metrology
Proc. SPIE 4419, Collimation testing based on self-imaging, 0000 (14 August 2001); doi: 10.1117/12.437235
Proc. SPIE 4419, Wavelet description of dynamic speckle: application to the assessment of the drying of paint, 0000 (14 August 2001); doi: 10.1117/12.437236
Nonlinear Optics
Proc. SPIE 4419, Waveguiding properties of dark spatial soliton arrays in BTO photorefractive crystal, 0000 (14 August 2001); doi: 10.1117/12.437238
Optical Metrology
Proc. SPIE 4419, Valuation stress area induced by rapid expansion appliance using the technique double-exposure holographic interferometry, 0000 (14 August 2001); doi: 10.1117/12.437239
Physical Optics
Proc. SPIE 4419, Comparison of the converging and diverging geometries for measuring enhanced backscatter, 0000 (14 August 2001); doi: 10.1117/12.437240
Optical Instruments
Proc. SPIE 4419, Optical design of an instrument for measuring the scattering of light in the visible from a two-dimensional rough surface, 0000 (14 August 2001); doi: 10.1117/12.437241
Optical Spectroscopy
Proc. SPIE 4419, Extended analysis and adjusted values of the Xe VI configurations, 0000 (14 August 2001); doi: 10.1117/12.437242
Diffractive Optics
Proc. SPIE 4419, Talbot effect in a GRIN medium, 0000 (14 August 2001); doi: 10.1117/12.437243
Optical Metrology
Proc. SPIE 4419, Optical interferometric applications to fluid viscometry, 0000 (14 August 2001); doi: 10.1117/12.437245
Optoelectronic Devices
Proc. SPIE 4419, Modeling and production of high-birefringence FOBG sensors, 0000 (14 August 2001); doi: 10.1117/12.437246
Lasers and Quantum Optics
Proc. SPIE 4419, High-gain EDFA using ASE suppression: numerical simulation and experimental characterization, 0000 (14 August 2001); doi: 10.1117/12.437248
Optoelectronic Devices
Proc. SPIE 4419, Development of Bragg grating sensors at CEFET-PR and University of Aveiro, 0000 (14 August 2001); doi: 10.1117/12.437249
Industrial and Biomedical Applications
Proc. SPIE 4419, Assessment of bruising in fruits using dynamic speckle, 0000 (14 August 2001); doi: 10.1117/12.437250
Optical Metrology
Proc. SPIE 4419, Study of velocimetry in a fluid by laser scattering, 0000 (14 August 2001); doi: 10.1117/12.437251
Optical Image Processing
Proc. SPIE 4419, Multiplexed computer generated holograms by division of cells, 0000 (14 August 2001); doi: 10.1117/12.437252
Industrial and Biomedical Applications
Proc. SPIE 4419, Comparative study of Al- and Zn-phthalocyanine uptake in rabbit iliac artery by transadvantitial measurements of induced fluorescence, 0000 (14 August 2001); doi: 10.1117/12.437057
Optoelectronic Devices
Proc. SPIE 4419, Optoelectronic feedback in a Sagnac fiber-optic modulator, 0000 (14 August 2001); doi: 10.1117/12.437058
Ultrafast Optics
Proc. SPIE 4419, Characterization of arbitrarily polarized ultrashort pulses using frequency-resolved optical gating, 0000 (14 August 2001); doi: 10.1117/12.437059
Proc. SPIE 4419, Evolution of the polarization state of ultrashort laser pulses in low-birefringent optical fibers, 0000 (14 August 2001); doi: 10.1117/12.437060
Lasers and Quantum Optics
Proc. SPIE 4419, Coherence and modal structure of optical cavity under conditions of thermic instability in a He-Ne gas laser, 0000 (14 August 2001); doi: 10.1117/12.437061
Ultrafast Optics
Proc. SPIE 4419, Characterization of ultrashort pulses with arbitrary polarization state by nonlinear phase modulation, 0000 (14 August 2001); doi: 10.1117/12.437062