PROCEEDINGS VOLUME 4420
LASER METROLOGY FOR PRECISION MANAGEMENT AND INSPECTION IN INDUSTRY | 22-22 FEBRUARY 2001
Laser Metrology for Precision Measurement and Inspection in Industry
LASER METROLOGY FOR PRECISION MANAGEMENT AND INSPECTION IN INDUSTRY
22-22 February 2001
Florianopolis, Brazil
Length, Shape, and Position Measurement
Proc. SPIE 4420, Sources of error in absolute distance interferometry, 0000 (11 September 2001); doi: 10.1117/12.439197
Proc. SPIE 4420, High-precision measurement of cylinder form deviations with grazing incidence interferometry, 0000 (11 September 2001); doi: 10.1117/12.439208
Proc. SPIE 4420, Interferometric length and roughness measurements with nanometer accuracy level, 0000 (11 September 2001); doi: 10.1117/12.439212
In-Process Measurement and Testing
Proc. SPIE 4420, Unique criterion to estimate the performances of some laser diode range finders, 0000 (11 September 2001); doi: 10.1117/12.439213
Proc. SPIE 4420, New sensor for triangulation measurement of AGV attitude and position, 0000 (11 September 2001); doi: 10.1117/12.439214
Proc. SPIE 4420, Material testing of laser welds and claddings using digital speckle photography, 0000 (11 September 2001); doi: 10.1117/12.439215
Proc. SPIE 4420, Interferometric method for in-situ characterization of coating industrial processes, 0000 (11 September 2001); doi: 10.1117/12.439216
Proc. SPIE 4420, Comparison between laser interferometric and calibrated artifacts for the geometric test of machine tools, 0000 (11 September 2001); doi: 10.1117/12.439217
Sensors, New Instruments, and Performance evaluation
Proc. SPIE 4420, User's guide to IR detectors, 0000 (11 September 2001); doi: 10.1117/12.439218
Proc. SPIE 4420, New generation of lasermike, 0000 (11 September 2001); doi: 10.1117/12.439198
Proc. SPIE 4420, New strategic challenges for instrumentation in precision laser metrology for industry, 0000 (11 September 2001); doi: 10.1117/12.439199
Holography, Speckle Metrology, and Interferometry
Proc. SPIE 4420, Application of endoscopic ESPI in NDI, 0000 (11 September 2001); doi: 10.1117/12.439200
Proc. SPIE 4420, Portable residual stresses measurement device using ESPI and a radial in-plane interferometer, 0000 (11 September 2001); doi: 10.1117/12.439201
Proc. SPIE 4420, Comparison of strain/stress measurements on free form surfaces using ESPI and strain gauge technique, 0000 (11 September 2001); doi: 10.1117/12.439202
Proc. SPIE 4420, Multipulsed digital holography applied to full 3D measurements of dynamic events, 0000 (11 September 2001); doi: 10.1117/12.439203
Proc. SPIE 4420, Recent developments in double-pulsed video speckle interferometry and its application to the measurement of high-speed transient deformations, 0000 (11 September 2001); doi: 10.1117/12.439204
Proc. SPIE 4420, Robust spatial phase-stepping ESPI system, 0000 (11 September 2001); doi: 10.1117/12.439205
Proc. SPIE 4420, Camera-based active phase stabilization for electronic holography, 0000 (11 September 2001); doi: 10.1117/12.439206
Proc. SPIE 4420, Spatial phase-stepping using a computer-generated diffractive optical element, 0000 (11 September 2001); doi: 10.1117/12.439207
Microgeometry and Nanotechnology
Proc. SPIE 4420, Noninvasive microtomographic inspection of rough surfaces by active triangulation, 0000 (11 September 2001); doi: 10.1117/12.439209
Proc. SPIE 4420, Traceable measurement results from scanning probe microscopes by laser interferometry, 0000 (11 September 2001); doi: 10.1117/12.439210
Proc. SPIE 4420, Laser-based measurement to nanometer scale accuracy, 0000 (11 September 2001); doi: 10.1117/12.439211
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