PROCEEDINGS VOLUME 4451
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 29 JULY - 3 AUGUST 2001
Optical Manufacturing and Testing IV
Proceedings Volume 4451 is from: Logo
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
29 July - 3 August 2001
San Diego, CA, United States
Projects I: NGST
Proc. SPIE 4451, Development of lightweight mirror technology for the next generation space telescope, 0000 (27 December 2001); doi: 10.1117/12.453604
Proc. SPIE 4451, Final results of the Subscale Beryllium Mirror Demonstrator (SBMD)program, 0000 (27 December 2001); doi: 10.1117/12.453614
Proc. SPIE 4451, Cryogenic optical testing results for the Subscale Beryllium Mirror Demonstrator (SBMD), 0000 (27 December 2001); doi: 10.1117/12.453625
Proc. SPIE 4451, NGST mirror system demonstrator from the University of Arizona, 0000 (27 December 2001); doi: 10.1117/12.453635
Proc. SPIE 4451, AMSD test error budget sensitivity analysis, 0000 (27 December 2001); doi: 10.1117/12.453642
Proc. SPIE 4451, Semi-rigid active mirror technology advancements, 0000 (27 December 2001); doi: 10.1117/12.453651
Proc. SPIE 4451, In-process status of the 1.4-m beryllium semi-rigid Advanced Mirror System Demonstrator (AMSD), 0000 (27 December 2001); doi: 10.1117/12.453654
Projects II: Gossamer
Proc. SPIE 4451, Results for silicon lightweight mirrors (SLMS), 0000 (27 December 2001); doi: 10.1117/12.453655
Proc. SPIE 4451, Design manufacture and test of a cryo-stable Offner relay using aluminum foam core optics, 0000 (27 December 2001); doi: 10.1117/12.453656
Proc. SPIE 4451, Demonstration of a 0.5-m ultralightweight mirror for use at geosynchronous orbit, 0000 (27 December 2001); doi: 10.1117/12.453605
Proc. SPIE 4451, Manufacturing and evaluation of membrane optical elements for ultralightweight optics, 0000 (27 December 2001); doi: 10.1117/12.453606
Proc. SPIE 4451, Stretched membrane with electrostatic curvature (SMEC) mirrors for extremely large space telescopes, 0000 (27 December 2001); doi: 10.1117/12.453607
Projects III: Large Optics
Proc. SPIE 4451, Large aspheric optics for high-power, high-energy laser, 0000 (27 December 2001); doi: 10.1117/12.453608
Proc. SPIE 4451, Manufacturing and testing of two off-axis aspherical mirrors, 0000 (27 December 2001); doi: 10.1117/12.453609
Proc. SPIE 4451, SOFIA primary mirror fabrication and testing, 0000 (27 December 2001); doi: 10.1117/12.453610
Proc. SPIE 4451, Manufacturing of primary mirrors from Sitall CO-115M for European projects TTL, NOA, and VST, 0000 (27 December 2001); doi: 10.1117/12.453611
Proc. SPIE 4451, Manufacturing of secondary mirrors from Sitall CO-115M for European projects TTL, NOA, and VST, 0000 (27 December 2001); doi: 10.1117/12.453612
Fabrication I: Grinding
Proc. SPIE 4451, Modeling of tool shape evolution in conformal (raster) grinding, 0000 (27 December 2001); doi: 10.1117/12.453613
Proc. SPIE 4451, Development of optimal grinding and polishing tools for aspheric surfaces, 0000 (27 December 2001); doi: 10.1117/12.453615
Proc. SPIE 4451, Surface features and residual strains in AlON grinding, 0000 (27 December 2001); doi: 10.1117/12.453616
Proc. SPIE 4451, Suitability of igneous rock for precision tooling, 0000 (27 December 2001); doi: 10.1117/12.453617
Proc. SPIE 4451, Manufacturing-induced residual stresses in optical glasses and crystals: Example of residual stress relief by magnetorheological finishing (MRF) in commercial silicon wafers, 0000 (27 December 2001); doi: 10.1117/12.453618
Fabrication II: Polishing
Proc. SPIE 4451, Quantitative characterization of optical polishing pitch, 0000 (27 December 2001); doi: 10.1117/12.453619
Proc. SPIE 4451, Nanometer accurate shaping with fluid jet polishing, 0000 (27 December 2001); doi: 10.1117/12.453620
Proc. SPIE 4451, Constellation-X cylinder figuring and polishing studies, 0000 (27 December 2001); doi: 10.1117/12.453621
Proc. SPIE 4451, Precision optical asphere fabrication by plasma jet chemical etching (PJCE) and ion beam figuring, 0000 (27 December 2001); doi: 10.1117/12.453622
Proc. SPIE 4451, Wet-etch figuring: optical surfacing by controlled application of etchant solution using the Marangoni effect, 0000 (27 December 2001); doi: 10.1117/12.453623
Proc. SPIE 4451, Research on the microstructure of ceramic glass and its polished surface quality, 0000 (27 December 2001); doi: 10.1117/12.453624
Fabrication II: MRF and Micro-Optics
Proc. SPIE 4451, Exploring anisotropy in removal rate for single crystal sapphire using MRF, 0000 (27 December 2001); doi: 10.1117/12.453626
Proc. SPIE 4451, Use of magnetorheological finishing (MRF) to relieve residual stress and subsurface damage on lapped semiconductor silicon wafers, 0000 (27 December 2001); doi: 10.1117/12.453627
Proc. SPIE 4451, Fabrication of integrated diffractive micro-optics for MEMS applications, 0000 (27 December 2001); doi: 10.1117/12.453628
Proc. SPIE 4451, Scanning electron and atomic force microscopy measurements of ion beam etched InP samples using Ar/H2 chemistry, 0000 (27 December 2001); doi: 10.1117/12.453629
Testing I: Profilometry
Proc. SPIE 4451, Self-referencing, motion-insensitive approach for absolute aspheric profiling of large optics to the nanometer level and beyond, 0000 (27 December 2001); doi: 10.1117/12.453630
Proc. SPIE 4451, Analysis of the uncertainty of the ultraprecise large-area curvature scanning technique for measuring steep aspheres and complex surfaces, 0000 (27 December 2001); doi: 10.1117/12.453631
Proc. SPIE 4451, Applicability of iTIRM for roughness reduction monitoring, 0000 (27 December 2001); doi: 10.1117/12.453632
Proc. SPIE 4451, New approach for testing of aspherical micro-optics with high numerical aperture, 0000 (27 December 2001); doi: 10.1117/12.453633
Proc. SPIE 4451, Fast surface profiler by white-light interferometry using a new algorithm, the SEST algorithm, 0000 (27 December 2001); doi: 10.1117/12.453634
Testing II: Stitching and Mid-Spatial Frequency
Proc. SPIE 4451, Stitching interferometry and absolute surface shape metrology: similarities, 0000 (27 December 2001); doi: 10.1117/12.453636
Proc. SPIE 4451, Correlation of test data from some NIF small optical components, 0000 (27 December 2001); doi: 10.1117/12.453637
Proc. SPIE 4451, Use of beam parameters in optical component testing, 0000 (27 December 2001); doi: 10.1117/12.453638
Testing III: Interferometry
Proc. SPIE 4451, Interferometric measurement of refractive index inhomogeneity on polished sapphire substrates: application to LIGO-II, 0000 (27 December 2001); doi: 10.1117/12.453639
Proc. SPIE 4451, Multiple-surface phase-shifting interferometry, 0000 (27 December 2001); doi: 10.1117/12.453640
Proc. SPIE 4451, Uncertainties in interferometric measurements of radius of curvature, 0000 (27 December 2001); doi: 10.1117/12.453641
Proc. SPIE 4451, High-precision 2D angle measurement using fringe analysis techniques, 0000 (27 December 2001); doi: 10.1117/12.453643
Joint Session
Proc. SPIE 4451, Thermo-mechanical performance of precision C/SiC mounts, 0000 (27 December 2001); doi: 10.1117/12.453644
Proc. SPIE 4451, Measurement of the dynamic deformation of a high-frequency scanning mirror using a Shack-Hartmann wavefront sensor, 0000 (27 December 2001); doi: 10.1117/12.453645
Fabrication I: Grinding
Proc. SPIE 4451, Ultraprecision grinding machining of optical aspheric surface in ductile mode, 0000 (27 December 2001); doi: 10.1117/12.453646
Proc. SPIE 4451, Effects of diamond cutting tool's rake angle and edge radius on the diamond turned surface quality, 0000 (27 December 2001); doi: 10.1117/12.453647
Testing I: Profilometry
Proc. SPIE 4451, Calibration of a vertical-scan long trace profiler at MSFC, 0000 (27 December 2001); doi: 10.1117/12.453648
Proc. SPIE 4451, Design and application of Dall compensator for null testing of large-aperture aspherical surface and convex lens, 0000 (27 December 2001); doi: 10.1117/12.453649
Testing II: Stitching and Mid-Spatial Frequency
Proc. SPIE 4451, Analysis of Hartmann testing techniques for large-sized optics, 0000 (27 December 2001); doi: 10.1117/12.453650
Fabrication II: Polishing
Proc. SPIE 4451, First aspheric form and texture results from a production machine embodying the precession process, 0000 (27 December 2001); doi: 10.1117/12.453652
Joint Session
Proc. SPIE 4451, Silicon carbide high performance optics: a cost-effective, flexible fabrication process, 0000 (27 December 2001); doi: 10.1117/12.453653
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