PROCEEDINGS VOLUME 4517
LIGHTMETRY | 5-8 JUNE 2000
Lightmetry: Metrology, Spectroscopy, and Testing Techniques Using Light
LIGHTMETRY
5-8 June 2000
Pultusk, Poland
Radiometry, Lasermetry, Properties and Corrections of Photometric Detectors
Proc. SPIE 4517, Radiometry in military applications, 0000 (10 August 2001); doi: 10.1117/12.435948
Proc. SPIE 4517, Simple method of laser beam quality analysis, 0000 (10 August 2001); doi: 10.1117/12.435959
Proc. SPIE 4517, Method of measuring spatial intensity of laser beams, 0000 (10 August 2001); doi: 10.1117/12.435970
Proc. SPIE 4517, Measurement capabilities of a compact thermal-type standard of energy unit of pulse laser radiation, 0000 (10 August 2001); doi: 10.1117/12.435981
Proc. SPIE 4517, Chosen properties of a photometric detector BPYP 07, 0000 (10 August 2001); doi: 10.1117/12.435989
Proc. SPIE 4517, Errors of spectral correction caused by the diffusing element of the photometric meter head during illuminence measurement, 0000 (10 August 2001); doi: 10.1117/12.435990
Proc. SPIE 4517, Angular characteristics of a silicon detector spectral sensitivity corrected by an absorption filter, 0000 (10 August 2001); doi: 10.1117/12.435991
Proc. SPIE 4517, New approach to the spatial correction of luxmeter photometric heads, 0000 (10 August 2001); doi: 10.1117/12.435992
Absorption and Transmission Spectrometry
Proc. SPIE 4517, Method of order parameter estimation for liquid crystal in the electro-optical cell from absorption band dichroism, 0000 (10 August 2001); doi: 10.1117/12.435993
Proc. SPIE 4517, Absorption spectra and circular dichroism of calcium and strontium gallogermanates doped by chromium, 0000 (10 August 2001); doi: 10.1117/12.435949
Proc. SPIE 4517, Optical transmission spectra of Na0.4R0.6F2.2 single crystals with fluorite structure, 0000 (10 August 2001); doi: 10.1117/12.435950
Proc. SPIE 4517, New peculiarities of spectroscopic measurements with noncollinear scheme and nonpolarized light, 0000 (10 August 2001); doi: 10.1117/12.435951
Reflectometry and Scatterometry
Proc. SPIE 4517, Polarization characteristics of He-Ne laser radiation reflected by leaves, 0000 (10 August 2001); doi: 10.1117/12.435952
Proc. SPIE 4517, Laser heating effect on polarization characteristics of radiation reflected by glass-reinforced silicon polymer, 0000 (10 August 2001); doi: 10.1117/12.435953
Proc. SPIE 4517, Optical properties of deposited layers created by an erosion plasma torch, 0000 (10 August 2001); doi: 10.1117/12.435954
Proc. SPIE 4517, Optical constants and film thickness calculation based on the ratio of envelopes of the reflectance spectrum, 0000 (10 August 2001); doi: 10.1117/12.435955
Proc. SPIE 4517, Evanescent Bessel light beams, 0000 (10 August 2001); doi: 10.1117/12.435956
Proc. SPIE 4517, Linear bi-gyrotropic and quadratic gyroelectric Kerr effect, 0000 (10 August 2001); doi: 10.1117/12.435957
Proc. SPIE 4517, Polytetrafluoroethylene powder as a material for reflectance and color standards, 0000 (10 August 2001); doi: 10.1117/12.435958
Proc. SPIE 4517, AFM and optical methods in determining roughness of SERS-active silver electrodes, 0000 (10 August 2001); doi: 10.1117/12.435960
Proc. SPIE 4517, Direct and inverse problem in scatterometry of rough surfaces, 0000 (10 August 2001); doi: 10.1117/12.435961
Ellipsometry, Polarimetry, Spectropolarimetry, and Related Areas of Research
Colorimetry and Filtering of Color Images
Proc. SPIE 4517, Colorimetric evaluation of display performance, 0000 (10 August 2001); doi: 10.1117/12.435976
Proc. SPIE 4517, Color evaluation of guest-host liquid crystal displays, 0000 (10 August 2001); doi: 10.1117/12.435977
Proc. SPIE 4517, Colorimetric evaluation of the spot center during the optical design of microscope objectives, 0000 (10 August 2001); doi: 10.1117/12.435978
Proc. SPIE 4517, Colorimetry as a diagnostic tool in the manufacture of antireflection coatings, 0000 (10 August 2001); doi: 10.1117/12.435979
Proc. SPIE 4517, Effect of measurement geometry on colorimetric head spectral errors, 0000 (10 August 2001); doi: 10.1117/12.435980
Proc. SPIE 4517, Efficient filtering of color image sequences, 0000 (10 August 2001); doi: 10.1117/12.435982
Interferometry and Interference Filters
Proc. SPIE 4517, Applications of low-coherence interferometry in fiber optics, 0000 (10 August 2001); doi: 10.1117/12.435983
Proc. SPIE 4517, Time-domain and spectral-domain two-beam interference under general measurement conditions, 0000 (10 August 2001); doi: 10.1117/12.435984
Proc. SPIE 4517, Modified interferometric method for refractive index profile measurement of multi-elliptical core optical fibers, 0000 (10 August 2001); doi: 10.1117/12.435985
Proc. SPIE 4517, Order parameter evaluation of LC polymer from interferometric/refractometric data, 0000 (10 August 2001); doi: 10.1117/12.435986
Proc. SPIE 4517, Narrow-band polarizing interference filters with liquid crystal space layer, 0000 (10 August 2001); doi: 10.1117/12.435987
Proc. SPIE 4517, Application of interference filters for synthesis spectral characteristics of UV meters, 0000 (10 August 2001); doi: 10.1117/12.435988
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