PROCEEDINGS VOLUME 4563
INTELLIGENT SYSTEMS AND ADVANCED MANUFACTURING | 28-31 OCTOBER 2001
Sensors and Controls for Intelligent Manufacturing II
IN THIS VOLUME

0 Sessions, 15 Papers, 0 Presentations
INTELLIGENT SYSTEMS AND ADVANCED MANUFACTURING
28-31 October 2001
Boston, MA, United States
Open Architecture Controllers and Applications
Proc. SPIE 4563, Open architecture CMM motion controller, 0000 (27 December 2001); doi: 10.1117/12.452646
Proc. SPIE 4563, Real-time operating system timing jitter and its impact on motor control, 0000 (27 December 2001); doi: 10.1117/12.452653
Proc. SPIE 4563, Distributed numerical controllers, 0000 (27 December 2001); doi: 10.1117/12.452655
Proc. SPIE 4563, Intelligent open-architecture controller using knowledge server, 0000 (27 December 2001); doi: 10.1117/12.452656
Proc. SPIE 4563, Open architecture control for laser materials processing, 0000 (27 December 2001); doi: 10.1117/12.452657
Sensors and Industrial Applications
Proc. SPIE 4563, Ten-dollar thermal infrared imager, 0000 (27 December 2001); doi: 10.1117/12.452658
Proc. SPIE 4563, Recognition of free-form shapes using spherical SOFMs, 0000 (27 December 2001); doi: 10.1117/12.452659
Proc. SPIE 4563, Neural network modeling of the laser material-removal process, 0000 (27 December 2001); doi: 10.1117/12.452660
Process Modeling and Control
Proc. SPIE 4563, Vibration analysis of a bearing integrated sensor module, 0000 (27 December 2001); doi: 10.1117/12.452647
Proc. SPIE 4563, In-situ monitoring of composite cure process with fiber optic refractive index sensor, 0000 (27 December 2001); doi: 10.1117/12.452648
Proc. SPIE 4563, Frequency domain reduction of linear structured uncertain systems using L2-optimal pole retention, 0000 (27 December 2001); doi: 10.1117/12.452649
Proc. SPIE 4563, Frequency domain reduction of linear structured uncertain systems using integral squared error criterion, 0000 (27 December 2001); doi: 10.1117/12.452650
Poster Session
Proc. SPIE 4563, Self-validating sensors with application to a flexible link control system, 0000 (27 December 2001); doi: 10.1117/12.452651
Proc. SPIE 4563, Novel subpixel imaging system with linear CCD sensors, 0000 (27 December 2001); doi: 10.1117/12.452652
Proc. SPIE 4563, Measurement and control for mechanical compressive stress, 0000 (27 December 2001); doi: 10.1117/12.452654
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