INTELLIGENT SYSTEMS AND ADVANCED MANUFACTURING
28-31 October 2001
Boston, MA, United States
Image Processing and Image Reconstruction
Proc. SPIE 4564, Three-dimensional object recognition based on multiple-perspective imaging with microlens arrays, 0000 (4 October 2001); doi: 10.1117/12.444076
Proc. SPIE 4564, Optical flow measurment on Boolean edge detection and Hough transform, 0000 (4 October 2001); doi: 10.1117/12.444085
Proc. SPIE 4564, 6-DOF pose estimation of polyhedral objects based on analysis of geometric features in x-ray images, 0000 (4 October 2001); doi: 10.1117/12.444093
Proc. SPIE 4564, Image reconstruction in x-ray tomography using a radial basis function (RBF) neural network, 0000 (4 October 2001); doi: 10.1117/12.444110
Proc. SPIE 4564, Solidification of resin in stereolithography: comparison between measured and estimated shapes of solidified resin, and manufacturing accuracy of photo-cured model, 0000 (4 October 2001); doi: 10.1117/12.444111
Proc. SPIE 4564, 3D image reconstruction using optical sectioning in confocal scanning microscopy, 0000 (4 October 2001); doi: 10.1117/12.444112
Interferometer-based Measurement and Display
Proc. SPIE 4564, Proposal of interferometric display device driven by electrostatic force, 0000 (4 October 2001); doi: 10.1117/12.444113
Proc. SPIE 4564, Inspection system for microelectronics BGA package using wavelength scanning interferometry, 0000 (4 October 2001); doi: 10.1117/12.444114
Proc. SPIE 4564, Very small portable holographic interferometers and compact speckle interferometer with semiconductor laser sources well suited for industrial inspections, 0000 (4 October 2001); doi: 10.1117/12.444077
Proc. SPIE 4564, Dual-position sensitive diode-based orientation measurement in laser-interferometry-based sensing and measurement technique, 0000 (4 October 2001); doi: 10.1117/12.444078
Proc. SPIE 4564, Optical inspection method of lead frame using mathematical morphology, 0000 (4 October 2001); doi: 10.1117/12.444079
Visual Perception for Robots and Industrial Processes
Proc. SPIE 4564, Perceptual basis for reactive teleoperation, 0000 (4 October 2001); doi: 10.1117/12.444080
Proc. SPIE 4564, Hand/eye calibration of a robot arm with a 3D visual sensor, 0000 (4 October 2001); doi: 10.1117/12.444081
Invited Session I
Proc. SPIE 4564, Optical micromachines for photonic networks, 0000 (4 October 2001); doi: 10.1117/12.444082
Proc. SPIE 4564, Tunable photonic devices and modules based on micro-optomechatronics, 0000 (4 October 2001); doi: 10.1117/12.444083
Proc. SPIE 4564, Fiber collimator arrays for optical devices/systems, 0000 (4 October 2001); doi: 10.1117/12.444084
Proc. SPIE 4564, Novel receiver scheme for optical packet ultradense WDM systems, 0000 (4 October 2001); doi: 10.1117/12.444086
Optical Elements and Devices
Proc. SPIE 4564, Optical cross-connect architecture for high-capacity WDM wavelength routed networks, 0000 (4 October 2001); doi: 10.1117/12.444087
Proc. SPIE 4564, All-optical regeneration, 0000 (4 October 2001); doi: 10.1117/12.444088
Photothermal and Piezo Actuators
Proc. SPIE 4564, Photothermal actuator composed of optical fibers, 0000 (4 October 2001); doi: 10.1117/12.444089
Proc. SPIE 4564, Discrete-time compensation algorithm for hysteresis in piezoceramic actuators, 0000 (4 October 2001); doi: 10.1117/12.444090
Proc. SPIE 4564, Walking machine driven by a light beam, 0000 (4 October 2001); doi: 10.1117/12.444091
Control of Optomechatronic Devices
Proc. SPIE 4564, Method to improve the capability of electro-optical theodolite to track fast-moving target, 0000 (4 October 2001); doi: 10.1117/12.444092
Proc. SPIE 4564, Adaptive low-velocity friction compensation, 0000 (4 October 2001); doi: 10.1117/12.444094
Invited Session II
Proc. SPIE 4564, Development of PMP system for high-speed measurement of solder paste volume on printed circuit boards, 0000 (4 October 2001); doi: 10.1117/12.444095
Proc. SPIE 4564, Statistical-learning-based object recognition algorithm for solder joint inspection, 0000 (4 October 2001); doi: 10.1117/12.444096
Proc. SPIE 4564, Neural-network-based parts classification for SMT processes, 0000 (4 October 2001); doi: 10.1117/12.444097
Optical Sensors and Measurements I
Proc. SPIE 4564, High-performance absolute optical encoder using M-code, 0000 (4 October 2001); doi: 10.1117/12.444098
Proc. SPIE 4564, Optomechatronic response of high-performance force-sensing microlasers, 0000 (4 October 2001); doi: 10.1117/12.444099
Proc. SPIE 4564, Measurement of vibrational motions using a three-facet mirror, 0000 (4 October 2001); doi: 10.1117/12.444100
Optical Sensors and Measurements II
Proc. SPIE 4564, Electric field detector using electro-optic device, 0000 (4 October 2001); doi: 10.1117/12.444101
Proc. SPIE 4564, Flatness measurement by UV moire, 0000 (4 October 2001); doi: 10.1117/12.444102
Proc. SPIE 4564, Noncontact sensing of electric potential using electroluminescence effects, 0000 (4 October 2001); doi: 10.1117/12.444103
Proc. SPIE 4564, Auto-alignment for incident angle of ellipsometer, 0000 (4 October 2001); doi: 10.1117/12.444104
Optical/Visual Sensors and Measurements for Biological Applications
Proc. SPIE 4564, Three-dimensional imaging method for biological samples under liquid, 0000 (4 October 2001); doi: 10.1117/12.444105
Proc. SPIE 4564, Reconstruction of anatomical shapes from scattered data using deformable Bezier surfaces, 0000 (4 October 2001); doi: 10.1117/12.444106
Proc. SPIE 4564, Protein-based optical transducer for mechatronic devices, 0000 (4 October 2001); doi: 10.1117/12.444107
Visual Perception for Robots and Industrial Processes
Proc. SPIE 4564, Development of a phase (contrast) reversal speckle interferometric system for in-plane displacement measurement with two-fold sensitivity, 0000 (4 October 2001); doi: 10.1117/12.444108
Proc. SPIE 4564, Automated inspection system for ball stud, 0000 (4 October 2001); doi: 10.1117/12.444109
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