PROCEEDINGS VOLUME 4649
SYMPOSIUM ON INTEGRATED OPTOELECTRONIC DEVICES | 19-25 JANUARY 2002
Vertical-Cavity Surface-Emitting Lasers VI
SYMPOSIUM ON INTEGRATED OPTOELECTRONIC DEVICES
19-25 January 2002
San Jose, California, United States
VCSEL Manufacturing I
Proc. SPIE 4649, Beyond 850 nm: progress at other wavelengths and implications from the standard, 0000 (4 June 2002); doi: 10.1117/12.469216
Proc. SPIE 4649, Speed it up to 10 Gb/s and flip chip it: VCSEL today, 0000 (4 June 2002); doi: 10.1117/12.469225
Proc. SPIE 4649, Large aperture 850nm oxide-confined VCSELs for 10Gb/s data communication, 0000 (4 June 2002); doi: 10.1117/12.469244
Long Wavelength VCSELs
Proc. SPIE 4649, Performance of monolithic 1.3m VCSELs in telecom applications, 0000 (4 June 2002); doi: 10.1117/12.469246
Proc. SPIE 4649, Development of 1.3 micron oxide-confined VCSELs grown by MOCVD, 0000 (4 June 2002); doi: 10.1117/12.469247
Proc. SPIE 4649, Temperature characteristics of 1.16 um highly strained GaInAs/GaAs VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469248
VCSEL Characterization
Proc. SPIE 4649, Diffusive turn-off transients in current modulated multitransverse mode VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469217
Proc. SPIE 4649, Direct measurement of the local temperature distribution in oxide VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469218
Proc. SPIE 4649, Performance of proton-implant/oxide aperture VCSELs and comparison with vector optical model, 0000 (4 June 2002); doi: 10.1117/12.469219
Proc. SPIE 4649, Characterization of VCSEL modal output using near-field scanning optical microscopy, 0000 (4 June 2002); doi: 10.1117/12.469220
Novel Structures
Proc. SPIE 4649, Light-current characterization of dual-wavelength VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469221
Proc. SPIE 4649, Coherence optimization of vertical-cavity semiconductor optical amplifiers, 0000 (4 June 2002); doi: 10.1117/12.469222
Proc. SPIE 4649, Grating-outcoupled surface-emitting semiconductor lasers at 1310 and 1550 nm, 0000 (4 June 2002); doi: 10.1117/12.469223
VCSEL Manufacturing II
Proc. SPIE 4649, Advancements in the design and production of VCSELs at AXL, 0000 (4 June 2002); doi: 10.1117/12.469224
Proc. SPIE 4649, VCSEL reliability research at Gore Photonics, 0000 (4 June 2002); doi: 10.1117/12.469226
Proc. SPIE 4649, Oxide VCSEL reliability qualification at Agilent Technologies, 0000 (4 June 2002); doi: 10.1117/12.469227
Proc. SPIE 4649, Production of high-speed oxide-confined VCSEL arrays for datacom applications, 0000 (4 June 2002); doi: 10.1117/12.469228
VCSEL Arrays
Proc. SPIE 4649, Fabrication and performance of large (64x64) arrays of integrated VCSELs and detectors, 0000 (4 June 2002); doi: 10.1117/12.469229
Proc. SPIE 4649, Experiments on the scalability of the coherent coupling of VCSEL arrays, 0000 (4 June 2002); doi: 10.1117/12.469230
Proc. SPIE 4649, Modal characteristics of 2D antiguided VCSEL arrays, 0000 (4 June 2002); doi: 10.1117/12.469231
Proc. SPIE 4649, Simulation of transient dynamic behavior in laterally coupled VCSEL arrays, 0000 (4 June 2002); doi: 10.1117/12.469232
High-Speed VCSELs and Transceiver Applications
Proc. SPIE 4649, Multimode VCSELs for high bit-rate and transparent low-cost fiber-optic links, 0000 (4 June 2002); doi: 10.1117/12.469233
Proc. SPIE 4649, Connectorized parallel modules for the very short reach fiber optic market, 0000 (4 June 2002); doi: 10.1117/12.469234
Fabrication and Characterization
Proc. SPIE 4649, Fabrication and applications of lift-off vertical-cavity surface-emitting laser (VCSEL) disks, 0000 (4 June 2002); doi: 10.1117/12.469235
Proc. SPIE 4649, Fabrication control during AlAs oxidation of the VCSELs via optical probing technique of AlAs lateral oxidation (OPTALO), 0000 (4 June 2002); doi: 10.1117/12.469236
Proc. SPIE 4649, Parallel interconnect components for optical modules utilizing flip-chip VCSEL on ultra-thin silicon-on-sapphire substrate, 0000 (4 June 2002); doi: 10.1117/12.469238
Proc. SPIE 4649, Ultrafast narrow bandwidth modulation of VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469239
Proc. SPIE 4649, Frequency response of current modulation induced polarization switching in VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469240
Poster Session
Proc. SPIE 4649, Integrated optical and electronic modeling of oxide-confined visible VCSELs, 0000 (4 June 2002); doi: 10.1117/12.469241
Proc. SPIE 4649, Optically pumped semiconductor thin-disk laser with external cavity operating at 660 nm, 0000 (4 June 2002); doi: 10.1117/12.469242
Proc. SPIE 4649, Comparative study of the high-speed digital modulation performance of single- and multimode oxide confined VCSELs for free space optical interconnects, 0000 (4 June 2002); doi: 10.1117/12.469243
Proc. SPIE 4649, Polarization behavior of vertical-cavity surface-emitting lasers under the influence of in-plane anisotropic strain, 0000 (4 June 2002); doi: 10.1117/12.469245
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