PROCEEDINGS VOLUME 4679
BOULDER DAMAGE | 1-3 OCTOBER 2001
Laser-Induced Damage in Optical Materials: 2001
BOULDER DAMAGE
1-3 October 2001
Boulder, CO, United States
Fundamental Mechanisms
Proc. SPIE 4679, Initiation, growth, and mitigation of UV-laser-induced damage in fused silica, 0000 (9 April 2002); doi: 10.1117/12.461680
Materials and Measurements
Proc. SPIE 4679, Design and characterization of all-polymeric interference mirrors and optics, 0000 (9 April 2002); doi: 10.1117/12.461682
Surfaces and Mirrors
Mini Symposium on Optical Materials for Telecommunications
Proc. SPIE 4679, Designing high-power components for optical telecommunications, 0000 (9 April 2002); doi: 10.1117/12.461709
Proc. SPIE 4679, UV-laser modification of silica planar waveguide based DWDM devices, 0000 (9 April 2002); doi: 10.1117/12.461719
Proc. SPIE 4679, Design issues for tunable filters for optical telecommunications, 0000 (9 April 2002); doi: 10.1117/12.461728
By Title Only: Papers not Presented due to Events of Sept. 11, 2001
Proc. SPIE 4679, Development of a photothermal microscope for multiscale studies of defects, 0000 (9 April 2002); doi: 10.1117/12.461681
Thin Films
Proc. SPIE 4679, Technological processing of silica as seen through laser-induced damage tests, 0000 (9 April 2002); doi: 10.1117/12.461683
Proc. SPIE 4679, Influence of storage conditions on the LIDT of very high damage resistance mirrors, 0000 (9 April 2002); doi: 10.1117/12.461684
Proc. SPIE 4679, Kinetic study of laser damage initiation by creation of an electron plasma from absorbing nano-inclusions, 0000 (9 April 2002); doi: 10.1117/12.461685
By Title Only: Papers not Presented due to Events of Sept. 11, 2001
Proc. SPIE 4679, Time-resolved measurements of reflectivity, plasma formation, and damage of hafnia/silica multilayer mirrors at 1064 nm, 0000 (9 April 2002); doi: 10.1117/12.461686
Thin Films
Proc. SPIE 4679, Laser megajoule 1.06-um mirror production with very high laser damage threshold, 0000 (9 April 2002); doi: 10.1117/12.461687
By Title Only: Papers not Presented due to Events of Sept. 11, 2001
Proc. SPIE 4679, Dynamic absorptance behavior of hybrid multilayers at 193 nm, 0000 (9 April 2002); doi: 10.1117/12.461688
Materials and Measurements
Proc. SPIE 4679, Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm, 0000 (9 April 2002); doi: 10.1117/12.461690
Surfaces and Mirrors
Proc. SPIE 4679, Excimer-laser-induced photochemical polishing of SiC mirror, 0000 (9 April 2002); doi: 10.1117/12.461691
By Title Only: Papers not Presented due to Events of Sept. 11, 2001
Proc. SPIE 4679, Optical properties of porous fluoride coating for UV and DUV lasers, 0000 (9 April 2002); doi: 10.1117/12.461692
Thin Films
Proc. SPIE 4679, Aperture scaling of 351-nm high-reflectivity sol-gel-based mirror coatings, 0000 (9 April 2002); doi: 10.1117/12.461693
Fundamental Mechanisms
Proc. SPIE 4679, Effect of laser-induced antidiffusion on phonon-assisted electron transitions in semiconductor Fokker-Planck equation, 0000 (9 April 2002); doi: 10.1117/12.461694
Materials and Measurements
Proc. SPIE 4679, Study of laser-induced damage in PPLN, 0000 (9 April 2002); doi: 10.1117/12.461695
Proc. SPIE 4679, Method and laser system for creating high-resolution laser-induced damage images, 0000 (9 April 2002); doi: 10.1117/12.461696
Mini Symposium on Optical Materials for Telecommunications
Proc. SPIE 4679, Evaluation of materials selection criteria for composite optical limiters, 0000 (9 April 2002); doi: 10.1117/12.461697
Fundamental Mechanisms
Proc. SPIE 4679, Simple thermal response model for a p-doped silicon substrate irradiated by 1.06- and 1.32-um lasers, 0000 (9 April 2002); doi: 10.1117/12.461698
Proc. SPIE 4679, Calculation of relative damage thresholds for coated or contaminated total internal reflection surfaces, 0000 (9 April 2002); doi: 10.1117/12.461699
Proc. SPIE 4679, Measurement of relative damage thresholds at total internal reflection surfaces, 0000 (9 April 2002); doi: 10.1117/12.461700
Proc. SPIE 4679, Use of order statistics in the determination of laser damage threshold, 0000 (9 April 2002); doi: 10.1117/12.461701
By Title Only: Papers not Presented due to Events of Sept. 11, 2001
Proc. SPIE 4679, Pit formation in GaAs surface induced by picosecond and femtosecond laser pulses, 0000 (9 April 2002); doi: 10.1117/12.461702
Proc. SPIE 4679, Four-layer polymeric optical waveguides based on styrene acrylonitrile (SAN), 0000 (9 April 2002); doi: 10.1117/12.461703
Surfaces and Mirrors
Proc. SPIE 4679, Influence of glass surface layers on laser-induced damage threshold, 0000 (9 April 2002); doi: 10.1117/12.461704
Fundamental Mechanisms
Proc. SPIE 4679, Soliton-type waves of reflection and conduction in laser-matter interaction: as appeared in collected papers of the Symposium on Laser-Induced Damage in Optical Materials 1969-1998 (review), 0000 (9 April 2002); doi: 10.1117/12.461705
Proc. SPIE 4679, Soliton-type waves of reflection and conduction in metals at static loading as a possible tool of precatastrophic damage indications, 0000 (9 April 2002); doi: 10.1117/12.461706
Proc. SPIE 4679, Effect of discreteness of laser action and condensed medium response on the nonlinear and photophysical phenomena, 0000 (9 April 2002); doi: 10.1117/12.461707
Thin Films
Proc. SPIE 4679, Fabrication of a thin film exponential transmission lines by superconducting materials for high-speed communication devices, 0000 (9 April 2002); doi: 10.1117/12.461708
Proc. SPIE 4679, Establishing links between single gold nanoparticles buried inside SiO2 thin film and 351-nm pulsed-laser damage morphology, 0000 (9 April 2002); doi: 10.1117/12.461710
Surfaces and Mirrors
Proc. SPIE 4679, Localized CO2-laser treatment for mitigation of 351-nm damage growth in fused silica, 0000 (9 April 2002); doi: 10.1117/12.461711
Fundamental Mechanisms
Proc. SPIE 4679, Improving 351-nm damage performance of large-aperture fused silica and DKDP optics, 0000 (9 April 2002); doi: 10.1117/12.461712
Materials and Measurements
Proc. SPIE 4679, Results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasers, 0000 (9 April 2002); doi: 10.1117/12.461713
Proc. SPIE 4679, Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals, 0000 (9 April 2002); doi: 10.1117/12.461714
Proc. SPIE 4679, Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm, 0000 (9 April 2002); doi: 10.1117/12.461715
Fundamental Mechanisms
Proc. SPIE 4679, Engineered defects for investigation of laser-induced damage of fused silica at 355 nm, 0000 (9 April 2002); doi: 10.1117/12.461716
Proc. SPIE 4679, Structural modifications in fused silica due to laser-damage-induced shock compression, 0000 (9 April 2002); doi: 10.1117/12.461717
Surfaces and Mirrors
Proc. SPIE 4679, UV-laser conditioning for reduction of 351-nm damage initiation in fused silica, 0000 (9 April 2002); doi: 10.1117/12.461718
Proc. SPIE 4679, CO2-laser polishing for reductoin of 351-nm surface damage initiation in fused silica, 0000 (9 April 2002); doi: 10.1117/12.461720
Thin Films
Proc. SPIE 4679, Performance of bare and sol-gel-coated DKDP crystal surfaces exposed to multiple 351-nm laser pulses in vacuum and air, 0000 (9 April 2002); doi: 10.1117/12.461721
Materials and Measurements
Proc. SPIE 4679, Performance of thin borosilicate glass sheets at 351 nm, 0000 (9 April 2002); doi: 10.1117/12.461722
Surfaces and Mirrors
Proc. SPIE 4679, Initiation identification in fused-silica 35-nm optics, 0000 (9 April 2002); doi: 10.1117/12.461724
Proc. SPIE 4679, Combined advanced finishing and UV-laser conditioning for producing UV-damage-resistant fused-silica optics, 0000 (9 April 2002); doi: 10.1117/12.461725
Materials and Measurements
Proc. SPIE 4679, Damage testing of partial reflectors for 157-nm laser calorimeters, 0000 (9 April 2002); doi: 10.1117/12.461726
Proc. SPIE 4679, Intrinsic laser-induced breakdown of silicate glasses, 0000 (9 April 2002); doi: 10.1117/12.461727
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