PROCEEDINGS VOLUME 4703
NDE FOR HEALTH MONITORING AND DIAGNOSTICS | 17-21 MARCH 2002
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
NDE FOR HEALTH MONITORING AND DIAGNOSTICS
17-21 March 2002
San Diego, California, United States
Characterization of Surfaces and Thin Film
Proc. SPIE 4703, Determination of mechanical properties of superhard amorphous, nanocrystalline, and microcrystalline materials by laser-based surface acoustic waves, 0000 (7 June 2002); doi: 10.1117/12.469610
Proc. SPIE 4703, NDE of zinc layer on steel substrate using laser-ultrasonic SAW, 0000 (7 June 2002); doi: 10.1117/12.469621
Proc. SPIE 4703, Measurement and simulation of the laser-based thermo-elastic excitation and propagation of acoustic pulses for thin film and MEMS inspection, 0000 (7 June 2002); doi: 10.1117/12.469627
Proc. SPIE 4703, Nondestructive evaluation of bonding characteristics of TiO2-Al2O3 gas sensor, 0000 (7 June 2002); doi: 10.1117/12.469628
Proc. SPIE 4703, In-situ x-ray reflectivity measurement of the interface roughness of tantalum pentoxide thin film during rf magnetron sputtering deposition, 0000 (7 June 2002); doi: 10.1117/12.469629
Proc. SPIE 4703, Subsurface detection and characterization of Hertzian cracks in advanced ceramic materials using optical coherence tomography, 0000 (7 June 2002); doi: 10.1117/12.469630
Scanning Probe Techniques I
Proc. SPIE 4703, Atomic force acoustic microscopy at ultrasonic frequencies, 0000 (7 June 2002); doi: 10.1117/12.469631
Proc. SPIE 4703, Quantitative elastic-property information with acoustic AFM: measurements and modeling, 0000 (7 June 2002); doi: 10.1117/12.469632
Proc. SPIE 4703, Nonlinear vibrations in atomic force microscopy, 0000 (7 June 2002); doi: 10.1117/12.469633
Scanning Probe Techniques II
Proc. SPIE 4703, Ultrasonic atomic force microscopy with real-time mapping of resonance frequency and Q factor, 0000 (7 June 2002); doi: 10.1117/12.469611
Proc. SPIE 4703, Finite element simulations of nonlinear vibrations of atomic force microscope cantilevers, 0000 (7 June 2002); doi: 10.1117/12.469612
Proc. SPIE 4703, Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy, 0000 (7 June 2002); doi: 10.1117/12.469613
Micromaterials Reliability and Characterization of Localized Damage
Proc. SPIE 4703, Micro Materials Center Berlin: reliability research for MEMS, 0000 (7 June 2002); doi: 10.1117/12.469614
Proc. SPIE 4703, Damage detection and characterization in smart CFRP composites, 0000 (7 June 2002); doi: 10.1117/12.469615
Proc. SPIE 4703, Characterization of epoxy coating degradation using NDE imaging techniques, 0000 (7 June 2002); doi: 10.1117/12.469616
Proc. SPIE 4703, Relations between crack opening behavior and crack tip diffraction of longitudinal wave, 0000 (7 June 2002); doi: 10.1117/12.469617
Proc. SPIE 4703, Characterization of miniaturized tensile specimens using micromagnetic techniques, 0000 (7 June 2002); doi: 10.1117/12.469618
Proc. SPIE 4703, Output signal prediction of an open-ended waveguide probe when scanning elliptically shaped cracks in metals, 0000 (7 June 2002); doi: 10.1117/12.469619
Testing of MEMS and Microelectronic Components
Proc. SPIE 4703, Accelerated life testing (ALT) in microelectronics and photonics: its role, attributes, challenges, pitfalls, and interaction with qualification tests, 0000 (7 June 2002); doi: 10.1117/12.469620
Proc. SPIE 4703, Microcharacterization of MEMS ultrasonic transducers using laser interferometry, 0000 (7 June 2002); doi: 10.1117/12.469622
Proc. SPIE 4703, Micro- and nano-DAC: a powerful technique for nondestructive microcrack evaluation, 0000 (7 June 2002); doi: 10.1117/12.469623
Thermal Testing of Nanomaterials
Proc. SPIE 4703, Nondestructive characterization and application of doped and undoped polycrystalline diamond films, 0000 (7 June 2002); doi: 10.1117/12.469624
Proc. SPIE 4703, Analytical modeling of flash thermography: results for a layered sample, 0000 (7 June 2002); doi: 10.1117/12.469625
Proc. SPIE 4703, Diffusion-based thermal tomography, 0000 (7 June 2002); doi: 10.1117/12.469626
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