PROCEEDINGS VOLUME 4774
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 7-11 JULY 2002
Optical System Contamination: Effects, Measurements, and Control VII
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
7-11 July 2002
Seattle, WA, United States
Contamination Control
Proc. SPIE 4774, Comprehensive searchable database for contamination control plans, 0000 (11 September 2002); doi: 10.1117/12.481643
Proc. SPIE 4774, Contamination control of the SABER cryogenic infrared telescope, 0000 (11 September 2002); doi: 10.1117/12.481652
Proc. SPIE 4774, Cleanliness validation of NIF small optics, 0000 (11 September 2002); doi: 10.1117/12.481661
Proc. SPIE 4774, CO2 jet spray cleaning for optical systems, 0000 (11 September 2002); doi: 10.1117/12.481662
Proc. SPIE 4774, Removal of organic impurities from liquid carbon dioxide, 0000 (11 September 2002); doi: 10.1117/12.481663
Contamination Analysis and Modeling I
Proc. SPIE 4774, Model for particle redistribution during spacecraft launch, 0000 (11 September 2002); doi: 10.1117/12.481664
Proc. SPIE 4774, Tailored particle distributions derived from MIL-STD-1246, 0000 (11 September 2002); doi: 10.1117/12.481665
Proc. SPIE 4774, Contamination scatter functions for stray-light analysis, 0000 (11 September 2002); doi: 10.1117/12.481666
Proc. SPIE 4774, Calculation of spectral degradation due to contaminant films on infrared and optical sensors, 0000 (11 September 2002); doi: 10.1117/12.481667
Proc. SPIE 4774, Molecular contamination effects on the thermal emittance of highly reflective surfaces at cryogenic temperatures, 0000 (11 September 2002); doi: 10.1117/12.481644
Contamination Analysis and Modeling II
Proc. SPIE 4774, Effects of molecular contamination on triple junction solar cells, 0000 (11 September 2002); doi: 10.1117/12.481645
Proc. SPIE 4774, Observations on one-dimensional counterflow diffusion problem, 0000 (11 September 2002); doi: 10.1117/12.481646
Proc. SPIE 4774, Design and contamination analysis of vented detector enclosures, 0000 (11 September 2002); doi: 10.1117/12.481647
Proc. SPIE 4774, Extraction of properties of condensed outgassed species by thermogravimetric analysis, 0000 (11 September 2002); doi: 10.1117/12.481648
Proc. SPIE 4774, Contamination environment resulting from IUS stage II motor post-burn outgassing, 0000 (11 September 2002); doi: 10.1117/12.481649
Proc. SPIE 4774, Development and validation of a new return flux model for the International Space Station, 0000 (11 September 2002); doi: 10.1117/12.481650
Flight Data and On-Oorbit Performance
Proc. SPIE 4774, Return flux experiment REFLEX: spacecraft self-contamination, 0000 (11 September 2002); doi: 10.1117/12.481651
Space Station and Space Shuttle Experiments
Proc. SPIE 4774, Thruster-plume-induced contamination measurements from the PIC and SPIFEX flight experiments, 0000 (11 September 2002); doi: 10.1117/12.481653
Proc. SPIE 4774, International Space Station flights 1A/R-6A external contamination observations and surface assessment, 0000 (11 September 2002); doi: 10.1117/12.481654
Proc. SPIE 4774, Advanced QCM controller for NASA's plume impingement contamination-II, 0000 (11 September 2002); doi: 10.1117/12.481655
Proc. SPIE 4774, Measurements of optically transparent and mirrored specimens from the POSA, LDEF A0034, and EOIM-III space flight experiments, 0000 (11 September 2002); doi: 10.1117/12.481656
Laboratory Measurements
Proc. SPIE 4774, 20K-cryogenic-temperature satellite materials outgassing facility for ASTM-E1559 standard, 0000 (11 September 2002); doi: 10.1117/12.481657
Proc. SPIE 4774, Analysis of semi-volatile residues using diffuse reflectance infrared Fourier transform spectroscopy, 0000 (11 September 2002); doi: 10.1117/12.481658
Proc. SPIE 4774, Detection of organic contamination on surfaces by infrared spectroscopy, 0000 (11 September 2002); doi: 10.1117/12.481659
Proc. SPIE 4774, Interaction of micro-organisms (fungi and bacteria) with optical and electronic materials, 0000 (11 September 2002); doi: 10.1117/12.481660
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