PROCEEDINGS VOLUME 4778
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 7-11 JULY 2002
Interferometry XI: Applications
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
7-11 July 2002
Seattle, WA, United States
Optical Inspection of Microcomponents
Proc. SPIE 4778, Development and validation of digital microholo interferometric system for micromechanical testing, 0000 (19 June 2002); doi: 10.1117/12.473541
Proc. SPIE 4778, Characterization of shape and deformation of MEMS by quantitative optoelectronic metrology techniques, 0000 (19 June 2002); doi: 10.1117/12.473551
Proc. SPIE 4778, Quantitative investigation of chemical shrinkage stress in flip chip using a 3D moire interferometry system, 0000 (19 June 2002); doi: 10.1117/12.473561
Proc. SPIE 4778, Application of digital holographic microinterferometer for microelements testing, 0000 (19 June 2002); doi: 10.1117/12.473569
Three-Dimensional Shape Measurement
Proc. SPIE 4778, Three-dimensional data acquisition and processing for virtual reality applications, 0000 (19 June 2002); doi: 10.1117/12.473572
Proc. SPIE 4778, Compact 3D camera, 0000 (19 June 2002); doi: 10.1117/12.473573
Proc. SPIE 4778, 3D shape measurement of shoeprint impression with structured illumination and fringe pattern analysis, 0000 (19 June 2002); doi: 10.1117/12.473574
Proc. SPIE 4778, Phaseshift rapid in-vivo measuring of human skin (PRIMOS) by digital fringe projection with micromirror display devices DMD, 0000 (19 June 2002); doi: 10.1117/12.473575
Proc. SPIE 4778, Simultaneous measurement of 3D shape and color of objects, 0000 (19 June 2002); doi: 10.1117/12.473532
High-Precision Surface Metrology
Proc. SPIE 4778, High-accuracy interferometric measurement of aspheres, 0000 (19 June 2002); doi: 10.1117/12.473533
Proc. SPIE 4778, Measurement of highly parabolic mirror using computer-generated hologram, 0000 (19 June 2002); doi: 10.1117/12.473534
Proc. SPIE 4778, Step height measurements using a combination of a laser displacement gage and a broadband interferometric surface profiler, 0000 (19 June 2002); doi: 10.1117/12.473535
Proc. SPIE 4778, Characterization of the frequency-modulated continuous wave subsystem of an angstrom-accuracy absolute interferometer, 0000 (19 June 2002); doi: 10.1117/12.473536
Proc. SPIE 4778, Interferometer control of optical tweezers, 0000 (19 June 2002); doi: 10.1117/12.473537
Optical Shop Testing
Proc. SPIE 4778, Interferometric testing of refractive microcylinder lenses, 0000 (19 June 2002); doi: 10.1117/12.473538
Proc. SPIE 4778, Characterization of aspherical micro-optics using digital holography: improvement of accuracy, 0000 (19 June 2002); doi: 10.1117/12.473539
Proc. SPIE 4778, Specification and characterization of CGHs for interferometrical optical testing, 0000 (19 June 2002); doi: 10.1117/12.473540
Distance, Displacement, and Vibration Measurement
Proc. SPIE 4778, Measurement of surface shape and deformation by phase-shifting image digital holography, 0000 (19 June 2002); doi: 10.1117/12.473542
Proc. SPIE 4778, Application of grating shearography to the experimental analysis of a single fabric lamina under tensile loading, 0000 (19 June 2002); doi: 10.1117/12.473543
Optical Shop Testing
Proc. SPIE 4778, Absolute distance measurements using FTPSI with a widely tunable IR laser, 0000 (19 June 2002); doi: 10.1117/12.473544
Distance, Displacement, and Vibration Measurement
Proc. SPIE 4778, High-precision 2D-angle measurement interferometer, 0000 (19 June 2002); doi: 10.1117/12.473545
Industrial Inspection
Proc. SPIE 4778, Powertrain engineering using holographic/electronic speckle pattern interferometry, 0000 (19 June 2002); doi: 10.1117/12.473546
Proc. SPIE 4778, Reverse engineering by fringe projection, 0000 (19 June 2002); doi: 10.1117/12.473547
Proc. SPIE 4778, Optical tomography for smooth-changing refraction index distribution, 0000 (19 June 2002); doi: 10.1117/12.473548
Proc. SPIE 4778, Ultrasonic displacement measurement using self-mixing interferometry, 0000 (19 June 2002); doi: 10.1117/12.473549
Proc. SPIE 4778, Investigation of spatial light modulators for their application in the reconstruction of coherent masks, 0000 (19 June 2002); doi: 10.1117/12.473550
Proc. SPIE 4778, Digital phase-shift holographic interferometry for quantitative measurements of weak shock waves and its related phenomena, 0000 (19 June 2002); doi: 10.1117/12.473552
Proc. SPIE 4778, Remote interferometry by digital holography for shape control, 0000 (19 June 2002); doi: 10.1117/12.473553
Optical Shop Testing
Proc. SPIE 4778, Simultaneous distance, slope, curvature, and shape measurement with a multipurpose interferometer, 0000 (19 June 2002); doi: 10.1117/12.473554
Distance, Displacement, and Vibration Measurement
Proc. SPIE 4778, In-plane displacement measurement using ESPI based on spatial fringe analysis method, 0000 (19 June 2002); doi: 10.1117/12.473555
Proc. SPIE 4778, Dual-frequency laser interferometry of rotating angle measurement with a grating wedge-plate, 0000 (19 June 2002); doi: 10.1117/12.473556
Three-Dimensional Shape Measurement
Proc. SPIE 4778, Intensity transfer function of DMD and its application in PMP, 0000 (19 June 2002); doi: 10.1117/12.473557
High-Precision Surface Metrology
Proc. SPIE 4778, Realization of aliasing reduction in FTP using microscanning, 0000 (19 June 2002); doi: 10.1117/12.473558
Three-Dimensional Shape Measurement
Proc. SPIE 4778, Three-dimensional measurement by stereophotogrammetry, 0000 (19 June 2002); doi: 10.1117/12.473559
Optical Shop Testing
Proc. SPIE 4778, Dual testing of a large-aperture optical system, 0000 (19 June 2002); doi: 10.1117/12.473560
High-Precision Surface Metrology
Proc. SPIE 4778, New design techniques and calibration methods for CGH-null testing of aspheric surfaces, 0000 (19 June 2002); doi: 10.1117/12.473562
Optical Shop Testing
Proc. SPIE 4778, Simple laser interferometers for concave ellipsoidal mirror testing, 0000 (19 June 2002); doi: 10.1117/12.473563
Three-Dimensional Shape Measurement
Proc. SPIE 4778, Three-dimensional shape measurement system with digital light projector, 0000 (19 June 2002); doi: 10.1117/12.473564
High-Precision Surface Metrology
Proc. SPIE 4778, Measurement of fine dynamic changes of corneal topography by use of interferometry, 0000 (19 June 2002); doi: 10.1117/12.473565
Optical Shop Testing
Proc. SPIE 4778, In-process measurements of material removal in fluid jet polishing, 0000 (19 June 2002); doi: 10.1117/12.473566
Industrial Inspection
Proc. SPIE 4778, Measuring system for straightness and parallelism error of the overlong target vehicle guides, 0000 (19 June 2002); doi: 10.1117/12.473567
Proc. SPIE 4778, Digital interferometry application to the study of hypersonic wind tunnel flows, 0000 (19 June 2002); doi: 10.1117/12.473568
Distance, Displacement, and Vibration Measurement
Proc. SPIE 4778, Holographic interferometry of strain solitary waves in Plexiglas, 0000 (19 June 2002); doi: 10.1117/12.473570
Industrial Inspection
Proc. SPIE 4778, ESPI for mosaics diagnostics, 0000 (19 June 2002); doi: 10.1117/12.473571
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