PROCEEDINGS VOLUME 4782
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY | 7-11 JULY 2002
X-Ray Mirrors, Crystals, and Multilayers II
INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE AND TECHNOLOGY
7-11 July 2002
Seattle, WA, United States
Opening and Introduction
Proc. SPIE 4782, Challenges for synchrotron x-ray optics, 0000 (24 December 2002); doi: 10.1117/12.455685
Mirror Metrology
Proc. SPIE 4782, Topography measurement of nanometer synchrotron optics, 0000 (24 December 2002); doi: 10.1117/12.450982
Proc. SPIE 4782, 3D surface profile measurements of large x-ray synchrotron radiation mirrors using stitching interferometry, 0000 (24 December 2002); doi: 10.1117/12.454816
Proc. SPIE 4782, Temperature-dependence perturbations on LTP measurements, 0000 (24 December 2002); doi: 10.1117/12.450981
Proc. SPIE 4782, High-accuracy reconstruction of a function f(x) when only df(x)/dx or d(2)f(x)/dx(2) is known at discrete measurement points, 0000 (24 December 2002); doi: 10.1117/12.450459
Proc. SPIE 4782, New process for x-ray mirror image quality improvement, 0000 (24 December 2002); doi: 10.1117/12.450457
Mirror-Based Focusing Devices
Proc. SPIE 4782, Submicron focusing of hard x-ray beam by elliptically figured mirrors for scanning x-ray microscopy, 0000 (24 December 2002); doi: 10.1117/12.453754
Proc. SPIE 4782, Mirrors for nanofocusing x-ray beams, 0000 (24 December 2002); doi: 10.1117/12.455687
Proc. SPIE 4782, Kirkpatrick-Baez elliptical bendable mirrors at the nanospectroscopy beamline: metrological results and x-ray performance, 0000 (24 December 2002); doi: 10.1117/12.450983
Poster Session
Proc. SPIE 4782, The present state of Kirkpatrick-Baez mirror systems at the ESRF, 0000 (24 December 2002); doi: 10.1117/12.455686
Applications, Systems, and Fabrication Issues
Proc. SPIE 4782, Design and performance of the flexural-hinge-based mirror bender at the SLS protein crystallography beamline X06SA, 0000 (24 December 2002); doi: 10.1117/12.453695
Proc. SPIE 4782, Nickel-plated invar mirrors for synchrotron radiation beam lines, 0000 (24 December 2002); doi: 10.1117/12.453759
Proc. SPIE 4782, Profile coating of KB mirror applications at the Advanced Photon Source, 0000 (24 December 2002); doi: 10.1117/12.456298
Proc. SPIE 4782, Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers, 0000 (24 December 2002); doi: 10.1117/12.450460
Crystal-Based Optics
Proc. SPIE 4782, Applications of x-ray intensity interferometry, 0000 (24 December 2002); doi: 10.1117/12.450979
Proc. SPIE 4782, Performance of cryogenically cooled monochromators at SPring-8, 0000 (24 December 2002); doi: 10.1117/12.450980
Poster Session
Proc. SPIE 4782, Toroidal mirror for single-pulse experiments on ID09B, 0000 (24 December 2002); doi: 10.1117/12.455683
X-Ray and Broadband Multilayers
Proc. SPIE 4782, Status of small d-spacing x-ray multilayer development at Osmic, 0000 (24 December 2002); doi: 10.1117/12.451345
Proc. SPIE 4782, High-resolution carbon/carbon multilayers, 0000 (24 December 2002); doi: 10.1117/12.451361
Proc. SPIE 4782, Wideband multilayer mirrors for medium to hard x-ray applications, 0000 (24 December 2002); doi: 10.1117/12.455690
Proc. SPIE 4782, Broadband normal-incidence aperiodic multilayer mirrors for soft x-ray dispersive spectroscopy: theory and implementation, 0000 (24 December 2002); doi: 10.1117/12.451355
EUV Multilayers
Proc. SPIE 4782, Microstructure of Mo/Si multilayers with barrier layers, 0000 (24 December 2002); doi: 10.1117/12.453818
Proc. SPIE 4782, EUV multilayer mirrors with tailored spectral reflectivity, 0000 (24 December 2002); doi: 10.1117/12.451348
Proc. SPIE 4782, Development of EUV point diffraction interferometry using the NewSUBARU undulator radiation, 0000 (24 December 2002); doi: 10.1117/12.451354
Proc. SPIE 4782, Highly reflective uranium mirrors for astrophysics applications, 0000 (24 December 2002); doi: 10.1117/12.451359
Poster Session
Proc. SPIE 4782, Fabry-Perot interferometer in x rays, 0000 (24 December 2002); doi: 10.1117/12.451344
Multilayer Diffraction and Interface Roughness
Proc. SPIE 4782, Review of multilayer normal-incidence gratings operating at 9- to 40-nm wavelengths, 0000 (24 December 2002); doi: 10.1117/12.451353
Proc. SPIE 4782, Diffuse scattering sheets in reciprocal space corresponding to Kiessig fringes for x-ray multilayers, 0000 (24 December 2002); doi: 10.1117/12.451360
Poster Session
Proc. SPIE 4782, Aspheric surface fabrication in nanometer-level accuracy by numerically controlled plasma chemical vaporization machining (CVM) and elastic emission machining (EEM), 0000 (24 December 2002); doi: 10.1117/12.453749
Proc. SPIE 4782, Wave-optical analysis of submicron focusing of hard x-ray beams by reflective optics, 0000 (24 December 2002); doi: 10.1117/12.453752
Proc. SPIE 4782, Heat stability of Mo/Si multilayers inserted with silicon oxide layers, 0000 (24 December 2002); doi: 10.1117/12.451346
Proc. SPIE 4782, Reflectivity and stability of Cr/Sc multilayers for the soft x-ray range, 0000 (24 December 2002); doi: 10.1117/12.451350
Proc. SPIE 4782, Irradiation of EUV multilayer optics with synchrotron radiation of a different time structure, 0000 (24 December 2002); doi: 10.1117/12.451352
Proc. SPIE 4782, New type of Monk-Gillieson monochromator capable of covering a 0.7- to 25-nm range, 0000 (24 December 2002); doi: 10.1117/12.450458
Crystal-Based Optics
Proc. SPIE 4782, Recent developments of multilayer mirror optics for laboratory x-ray instrumentation, 0000 (24 December 2002); doi: 10.1117/12.469363
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