PROCEEDINGS VOLUME 4826
FOURTH OXFORD CONFERENCE ON SPECTROSCOPY | 10-12 JUNE 2002
Fourth Oxford Conference on Spectroscopy
IN THIS VOLUME

0 Sessions, 22 Papers, 0 Presentations
Displays  (5)
FOURTH OXFORD CONFERENCE ON SPECTROSCOPY
10-12 June 2002
Davidson, NC, United States
Standards and Intercomparisons
Proc. SPIE 4826, Uncertainty analysis of reflectance colorimetry, 0000 (8 August 2003); doi: 10.1117/12.514477
Proc. SPIE 4826, NPL-NRC comparison of mid-infrared regular transmittance, 0000 (8 August 2003); doi: 10.1117/12.514478
Proc. SPIE 4826, Linearity characterization of NIST's infrared spectral regular transmittance and reflectance scales, 0000 (8 August 2003); doi: 10.1117/12.514482
Proc. SPIE 4826, Intercomparison of high-resolution color measurements with similar and dissimilar geometric conditions, 0000 (8 August 2003); doi: 10.1117/12.514485
Proc. SPIE 4826, Overview of primary reference materials for molecular absorption spectrophotometry in the United States, 0000 (8 August 2003); doi: 10.1117/12.514489
Colorimetry of Fluorescent Materials
Proc. SPIE 4826, Measurement issues in the color specification of fluorescent-retroreflective materials for high-visibility traffic signing and personal safety applications, 0000 (8 August 2003); doi: 10.1117/12.519762
Proc. SPIE 4826, Measuring fluorescent whitened materials: problems, status, and recommendations, 0000 (8 August 2003); doi: 10.1117/12.514492
Proc. SPIE 4826, Assessing fluorescent color: a review of common practices and their limitations, 0000 (8 August 2003); doi: 10.1117/12.514495
Proc. SPIE 4826, Spectral and colorimetric intercomparison of fluorescent materials: polychromatic versus monochromatic irradiation, 0000 (8 August 2003); doi: 10.1117/12.514513
Proc. SPIE 4826, Investigation of photoluminescent effect in opal glasses used as diffuse reflectance standards, 0000 (8 August 2003); doi: 10.1117/12.514521
Appearance Measurement
Proc. SPIE 4826, Gonio-spectrophotometry of metal-flake and pearl-mica pigmented paint surfaces, 0000 (8 August 2003); doi: 10.1117/12.514525
Proc. SPIE 4826, Systematic approach for describing the geometry of spectrophotometry, 0000 (8 August 2003); doi: 10.1117/12.514528
Proc. SPIE 4826, Analysis of spectrophotometer specular performance using goniometric information, 0000 (8 August 2003); doi: 10.1117/12.514529
Displays
Proc. SPIE 4826, iColor: remote monitoring/calibration of spectrophotometers using the Internet, 0000 (8 August 2003); doi: 10.1117/12.544381
Updates in Technology
Proc. SPIE 4826, Wavelength-tunable quasi-cw laser source for high-accuracy spectrometric measurement in the 200-nm to 500-nm region, 0000 (8 August 2003); doi: 10.1117/12.514530
Proc. SPIE 4826, Holmium oxide solution as a prototype intrinsic standard in molecular absorption spectrophotometry, 0000 (8 August 2003); doi: 10.1117/12.514532
Proc. SPIE 4826, NPL correction kit for enhanced and traceable reflectance measurement, 0000 (8 August 2003); doi: 10.1117/12.514533
Proc. SPIE 4826, Diffuse reflectance scales at NPL, 0000 (8 August 2003); doi: 10.1117/12.514535
Displays
Proc. SPIE 4826, NIST display colorimeter calibration facility, 0000 (8 August 2003); doi: 10.1117/12.514537
Proc. SPIE 4826, Color gamut assessment standard: construction, characterization, and interlaboratory measurement comparison, 0000 (8 August 2003); doi: 10.1117/12.514538
Proc. SPIE 4826, Current projects in display metrology at the NIST flat panel display laboratory, 0000 (8 August 2003); doi: 10.1117/12.514542
Proc. SPIE 4826, Sunlight readability of displays: a numerical scale, 0000 (8 August 2003); doi: 10.1117/12.514544
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