Keynote Papers
Proc. SPIE 4902, Improved-resolution 3D TV, video, and imaging using moving micro-optics array lens techniques and systems (MALTS), 0000 (18 October 2002); doi: 10.1117/12.467259
Surface Profile Measurements
Proc. SPIE 4902, Three-dimensional surface profile measurement using a liquid crystal grating with a triangular intensity distribution, 0000 (18 October 2002); doi: 10.1117/12.467400
Proc. SPIE 4902, Surface profile measurement of concave-shaped mirror using grating projection method, 0000 (18 October 2002); doi: 10.1117/12.467533
Proc. SPIE 4902, Development of an abbreviated-type three-dimensional optical measuring apparatus for textiles, 0000 (18 October 2002); doi: 10.1117/12.467624
Proc. SPIE 4902, Shape measurement using an experimental untracked range sensor, 0000 (18 October 2002); doi: 10.1117/12.467719
3D Shape Measurements and Reconstruction
Proc. SPIE 4902, Three-dimensional measurement system with micro tactile sensor, 0000 (18 October 2002); doi: 10.1117/12.468214
Proc. SPIE 4902, Development of deep-range and high-resolution laser 3D measurement system, 0000 (18 October 2002); doi: 10.1117/12.469140
Microoptical System/Assembly I
Proc. SPIE 4902, Micromechanical mirror based on PZN-PT single crystal films, 0000 (18 October 2002); doi: 10.1117/12.467609
Actuation/Control for Optomechatronic Systems
Proc. SPIE 4902, Two-dimensional movement of photothermal actuator composed of optical fibers, 0000 (18 October 2002); doi: 10.1117/12.467713
Proc. SPIE 4902, Microbubble actuator using photothermal effect, 0000 (18 October 2002); doi: 10.1117/12.467714
Optomechatronic Systems/Devices
Proc. SPIE 4902, Miniaturized machine moving in a pipe using photothermal effect, 0000 (18 October 2002); doi: 10.1117/12.467629
Proc. SPIE 4902, Operating in sub-arc seconds: high-precision laser terminals for intersatellite communications, 0000 (18 October 2002); doi: 10.1117/12.467643
Proc. SPIE 4902, Accommodation-assisting glasses for presbyopia, 0000 (18 October 2002); doi: 10.1117/12.467708
Microoptical System/Assembly I
Proc. SPIE 4902, Tapping force measurement using micromachined cantilevers and laser systems, 0000 (18 October 2002); doi: 10.1117/12.467331
Proc. SPIE 4902, Fluid pressure measurement while filling a rectangular cavity using a pressure cell of opto-electronic arrangement embedded on a diaphragm, 0000 (18 October 2002); doi: 10.1117/12.467349
Proc. SPIE 4902, Parallel robot for micro-assembly with integrated innovative optical 3D sensor, 0000 (18 October 2002); doi: 10.1117/12.467484
Poster Session
Proc. SPIE 4902, Friction compensation with repeat control at low speed for an optoelectronic system, 0000 (18 October 2002); doi: 10.1117/12.467377
Machine Vision and Image Processing for Optomechatronics I
Proc. SPIE 4902, Visual inspection PC system for quality control of electronic devices, 0000 (18 October 2002); doi: 10.1117/12.467256
Proc. SPIE 4902, Proposal of a taste evaluating method for sponge cake using a 3D range sensor, 0000 (18 October 2002); doi: 10.1117/12.467257
Machine Vision and Image Processing for Optomechatronics II
Proc. SPIE 4902, Robust Hough transform LMedS HT and its application to visual inspection, 0000 (18 October 2002); doi: 10.1117/12.467258
Machine Vision and Image Processing for Optomechatronics I
Proc. SPIE 4902, Optical tomography using confocal fan-beam illumination and its application to LCD panel inspection, 0000 (18 October 2002); doi: 10.1117/12.467626
Keynote Papers
Proc. SPIE 4902, From optical MEMS to photonic crystal, 0000 (18 October 2002); doi: 10.1117/12.467722
Micro-optical System/Assembly II
Proc. SPIE 4902, Automated vision-guided precision positioning in microassembly, 0000 (18 October 2002); doi: 10.1117/12.467625
Proc. SPIE 4902, In-situ optical probe interferometer for measuring displacement of nanoindenter: a configuration, 0000 (18 October 2002); doi: 10.1117/12.467681
Proc. SPIE 4902, Design and manufacturing of actuating beams with mirror and electrodes with mirror support pyramid on substrate for optical switch, 0000 (18 October 2002); doi: 10.1117/12.467717
Machine Vision and Image Processing for Optomechatronics I
Proc. SPIE 4902, Robust registration for real-world machine visions, 0000 (18 October 2002); doi: 10.1117/12.467333
Machine Vision and Image Processing for Optomechatronics II
Proc. SPIE 4902, Constant-magnification focusing using a varifocal mirror and its application to 3D imaging, 0000 (18 October 2002); doi: 10.1117/12.467395
Proc. SPIE 4902, 3D vision sensor with multiple CCD cameras, 0000 (18 October 2002); doi: 10.1117/12.468381
Optical Sensors and Measurements I
Proc. SPIE 4902, Investigation using communication theory in spatial fringe analysis method, 0000 (18 October 2002); doi: 10.1117/12.467248
Proc. SPIE 4902, Measuring system for micro radius of curvature, 0000 (18 October 2002); doi: 10.1117/12.467250
Proc. SPIE 4902, Absolute-distance interferometry (ADI) with randomly modulated optical wavelength, 0000 (18 October 2002); doi: 10.1117/12.467262
Proc. SPIE 4902, Reflection moiré for high spatial resolution, 0000 (18 October 2002); doi: 10.1117/12.467398
Poster Session
Proc. SPIE 4902, Linear positioning laser calibration setup of CNC machine tools, 0000 (18 October 2002); doi: 10.1117/12.467482
Machine Vision and Real-Time Imaging System
Proc. SPIE 4902, Influence of the machine vision lens on the accuracy in contactless 2D metrology, 0000 (18 October 2002); doi: 10.1117/12.467251
Proc. SPIE 4902, Development of laser direct imager, 0000 (18 October 2002); doi: 10.1117/12.467385
Proc. SPIE 4902, Advantage of using region of interests in automated part sorting with line-scan cameras in real time, 0000 (18 October 2002); doi: 10.1117/12.467618
Proc. SPIE 4902, Robust texture segmentation algorithm based on the Fourier spectrum analysis, 0000 (18 October 2002); doi: 10.1117/12.467628
Proc. SPIE 4902, Effect of noise level for estimating the spatial uncertainties of workobject localization, 0000 (18 October 2002); doi: 10.1117/12.469920
Optomechatronics for Photonic Networks
Proc. SPIE 4902, Next-generation photonic networks, 0000 (18 October 2002); doi: 10.1117/12.467615
Proc. SPIE 4902, Optical ADM node construction using a disk filter, 0000 (18 October 2002); doi: 10.1117/12.467394
Proc. SPIE 4902, Tunable receiver for optical packet ultradense WDM systems, 0000 (18 October 2002); doi: 10.1117/12.467396
Proc. SPIE 4902, Applications for optical communication using micromechanisms, 0000 (18 October 2002); doi: 10.1117/12.467399
Proc. SPIE 4902, Autonomic control of photonic networks based on absolute wavelength management, 0000 (18 October 2002); doi: 10.1117/12.467617
Optical Sensors and Measurements II
Proc. SPIE 4902, Correction of nonlinearity in single-frequency interferometry, 0000 (18 October 2002); doi: 10.1117/12.467682
Proc. SPIE 4902, Birefringence dispersion measurement by geometric phase, 0000 (18 October 2002); doi: 10.1117/12.467709
Proc. SPIE 4902, Mean-squared and worst-case performance of multispacecraft imaging systems: a feature-based approach, 0000 (18 October 2002); doi: 10.1117/12.467721
Poster Session
Proc. SPIE 4902, 3D sensor system using multistripe laser and stereo camera for environment recognition of mobile robots, 0000 (18 October 2002); doi: 10.1117/12.467350
Autonomous Robots: Sensing, Control, and Manipulation
Proc. SPIE 4902, Miniature gripper system for optical fiber handling, 0000 (18 October 2002); doi: 10.1117/12.467630
Proc. SPIE 4902, Map building for mobile robots by ultrasonic and infrared sensor data fusion, 0000 (18 October 2002); doi: 10.1117/12.467644
Proc. SPIE 4902, Structured light sensory basis for reactive telerobotic manipulation of a circular saw, 0000 (18 October 2002); doi: 10.1117/12.467707
Visual and Optical Inspection
Proc. SPIE 4902, Visual inspection system with flexible illumination and autofocusing, 0000 (18 October 2002); doi: 10.1117/12.467381
Proc. SPIE 4902, Dynamic characteristics of the PDLC-based electro-optic modulator for TFT LCD inspection, 0000 (18 October 2002); doi: 10.1117/12.467530
Proc. SPIE 4902, Study on an inspection method of repeated pattern: automatic pattern inspection for TFT LCD, 0000 (18 October 2002); doi: 10.1117/12.467613
Proc. SPIE 4902, Surface inspection of patterned wafer based on 2D wavelet transform, 0000 (18 October 2002); doi: 10.1117/12.467632
Pattern Recognition/Classification
Proc. SPIE 4902, Toward a production-line classification of metallic satin-finished surfaces using coherent light, 0000 (18 October 2002); doi: 10.1117/12.467515
Proc. SPIE 4902, Feature association within a multiple-camera system, 0000 (18 October 2002); doi: 10.1117/12.467716
Micro-optical System/Assembly II
Proc. SPIE 4902, Optical implementation of closed-loop controllers for mechatronic systems, 0000 (18 October 2002); doi: 10.1117/12.467253
Pattern Recognition/Classification