PHOTONICS ASIA
14-18 October 2002
Shanghai, China
Design of Optical Systems and Instruments I
Proc. SPIE 4927, Importance of international standards at all levels of optical instrument production, 0000 (20 September 2002); doi: 10.1117/12.472497
Proc. SPIE 4927, Catadioptric omnidirectional system with undistorted imaging for horizontal scene, 0000 (20 September 2002); doi: 10.1117/12.471437
Proc. SPIE 4927, Optical design and analysis of 2D spectrograph for space solar telescope, 0000 (20 September 2002); doi: 10.1117/12.471435
Design of Optical Systems and Instruments II
Proc. SPIE 4927, Semiconductor laser scanning optomechanical system in an integrated machine vision sensor, 0000 (20 September 2002); doi: 10.1117/12.471213
Proc. SPIE 4927, Optmization design of zoom lens systems, 0000 (20 September 2002); doi: 10.1117/12.471198
Proc. SPIE 4927, Head-tracked dome display technology, 0000 (20 September 2002); doi: 10.1117/12.471207
Proc. SPIE 4927, Standardization of acousto-optic tunable filter NIR spectrometric instrument, 0000 (20 September 2002); doi: 10.1117/12.471413
Proc. SPIE 4927, Artificial neural network and application in calibration transfer of AOTF-based NIR spectrometer, 0000 (20 September 2002); doi: 10.1117/12.471415
Proc. SPIE 4927, Design of compact high-resolution optical system for space and stray-light analysis, 0000 (20 September 2002); doi: 10.1117/12.471186
Optimization Algorithms for Lens Design
Proc. SPIE 4927, Critical view of three lens design methods: damped least squares, Spencer's and Glatzel's, 0000 (20 September 2002); doi: 10.1117/12.472494
Proc. SPIE 4927, Study on automatic optical element addition or deletion in lens optimization, 0000 (20 September 2002); doi: 10.1117/12.471188
Proc. SPIE 4927, Simulated annealing algorithm for unwrapping noisy phase map, 0000 (20 September 2002); doi: 10.1117/12.464028
Infrared Optics
Proc. SPIE 4927, Design and fabrication of infrared hybrid refractive/diffractive optical system for 3- to 5-um band, 0000 (20 September 2002); doi: 10.1117/12.471184
Proc. SPIE 4927, Low-temperature blackbodies and facility for calibration of them, 0000 (20 September 2002); doi: 10.1117/12.465976
Proc. SPIE 4927, Application of harmonic diffraction in infrared, 0000 (20 September 2002); doi: 10.1117/12.471678
Proc. SPIE 4927, Calibration method of three-band infrared integrated radiometer, 0000 (20 September 2002); doi: 10.1117/12.471417
Proc. SPIE 4927, Study for the MTF of photovoltaic and photoconductive infrared detector cells, 0000 (20 September 2002); doi: 10.1117/12.471439
Proc. SPIE 4927, Some developments on fractional Fourier optics, 0000 (20 September 2002); doi: 10.1117/12.471424
Interferometry I
Proc. SPIE 4927, Advances in interferometric metrology, 0000 (20 September 2002); doi: 10.1117/12.472495
Proc. SPIE 4927, Arbitrary angle measurement by grating wedge-plate interferometer and the calibration technique, 0000 (20 September 2002); doi: 10.1117/12.471214
Proc. SPIE 4927, Surface roughness measurement using infrared phase-shifting digital interferometer, 0000 (20 September 2002); doi: 10.1117/12.464060
Interferometry II
Proc. SPIE 4927, Simple lateral shearing interferometer using phase-shifting interferometry technique, 0000 (20 September 2002); doi: 10.1117/12.464343
Proc. SPIE 4927, Tolerance analysis and test of focus' coincidence with last surface's curvature center for reference lenses, 0000 (20 September 2002); doi: 10.1117/12.471191
Proc. SPIE 4927, Optical quality and frequency response of an interferometer analyzing with optical design software, 0000 (20 September 2002); doi: 10.1117/12.471192
Proc. SPIE 4927, Imaging performance evaluation for fiber optical plates with modulation transfer function, 0000 (20 September 2002); doi: 10.1117/12.471432
Aspheric Surface Testing
Proc. SPIE 4927, Recent developments in the measurement of aspheric surfaces by contact stylus instrumentation, 0000 (20 September 2002); doi: 10.1117/12.464331
Proc. SPIE 4927, New long trace profiler for aspheric optical surface metrology, 0000 (20 September 2002); doi: 10.1117/12.471438
Optical Testing
Proc. SPIE 4927, Automatic testing of optical multiparameter based on CCD camera and LCD graph generator, 0000 (20 September 2002); doi: 10.1117/12.471423
Proc. SPIE 4927, Novel approach to measure the linear birefringence in bulk optical glass sensing head of current sensors, 0000 (20 September 2002); doi: 10.1117/12.464299
Proc. SPIE 4927, Method to measure reflection-induced retardance without compensator, 0000 (20 September 2002); doi: 10.1117/12.464300
Proc. SPIE 4927, Optical analysis for light intensity distribution in EPR with different light sources, 0000 (20 September 2002); doi: 10.1117/12.471197
Proc. SPIE 4927, Analysis of light field of waveguide grating couplers using the FDTD method, 0000 (20 September 2002); doi: 10.1117/12.471204
Proc. SPIE 4927, Vision coordinate measurement technique using stereo-probe imaging, 0000 (20 September 2002); doi: 10.1117/12.464305
Testing with Optical Technology I
Proc. SPIE 4927, Study on a distributing Fabry-Perot measurement system, 0000 (20 September 2002); doi: 10.1117/12.471199
Proc. SPIE 4927, Research on the linear continuous attenuator technique of large caliber, 0000 (20 September 2002); doi: 10.1117/12.471203
Proc. SPIE 4927, Detection of distributed polarization coupling in high-birefringence fibers, 0000 (20 September 2002); doi: 10.1117/12.471194
Proc. SPIE 4927, Tiny gallium arsenide probe for electro-optic sampling, 0000 (20 September 2002); doi: 10.1117/12.471195
Proc. SPIE 4927, Measurement of motionless water surface shape using laser scanning and optical project methods, 0000 (20 September 2002); doi: 10.1117/12.471193
Proc. SPIE 4927, New design to detect vibration, 0000 (20 September 2002); doi: 10.1117/12.471201
Testing with Optical Technology II
Proc. SPIE 4927, Improving the measuring accuracy of laser autocollimator used over long distance, 0000 (20 September 2002); doi: 10.1117/12.471427
Proc. SPIE 4927, Normal spectral emissivity changes of tungsten at 633 nm in the range from room temperature to melting point under pulse-heating conditions, 0000 (20 September 2002); doi: 10.1117/12.464341
Proc. SPIE 4927, Detection and A/D conversion for 10GHz microwave signals using optical sampling, 0000 (20 September 2002); doi: 10.1117/12.464040
Proc. SPIE 4927, Logic circuit design using optically controlled MESFET, 0000 (20 September 2002); doi: 10.1117/12.464344
Proc. SPIE 4927, Unwrapping phase map by estimating regions containing phase jumps, 0000 (20 September 2002); doi: 10.1117/12.471440
Proc. SPIE 4927, Multiwavelength high-thermometry using spectrum analysis, 0000 (20 September 2002); doi: 10.1117/12.471212
Proc. SPIE 4927, Comparison of trap stiffness between a solid-mode optical trap and a donut-mode optical trap, 0000 (20 September 2002); doi: 10.1117/12.471436
Thin Film Design and Optimization
Proc. SPIE 4927, Genetic arithmetic global optimization design of optical thin film used in fiber optic communication, 0000 (20 September 2002); doi: 10.1117/12.471418
Proc. SPIE 4927, Optimization of optical multilayer based on genetic algorithm and nonlinear least square method, 0000 (20 September 2002); doi: 10.1117/12.471190
Proc. SPIE 4927, Design of the filter with flattening spectral transmittance, 0000 (20 September 2002); doi: 10.1117/12.471420
Proc. SPIE 4927, Broad-linewidth bandstop filters with multilayer grating structure, 0000 (20 September 2002); doi: 10.1117/12.471209
Proc. SPIE 4927, Design of highly flat-output gain equalizers, 0000 (20 September 2002); doi: 10.1117/12.471431
Poster Session
Proc. SPIE 4927, Optimum baffle design of star sensor, 0000 (20 September 2002); doi: 10.1117/12.464014
Proc. SPIE 4927, Polar-coordinate laser writer: analysis of exposure dose distribution, 0000 (20 September 2002); doi: 10.1117/12.464067
Proc. SPIE 4927, Vibration-resistance technology of phase-shifting interferometry, 0000 (20 September 2002); doi: 10.1117/12.464059
Proc. SPIE 4927, Laser moire deflectometry system used for fire science research, 0000 (20 September 2002); doi: 10.1117/12.464062
Proc. SPIE 4927, Reflecting optical system to increase signal intensity in confocal microscopy, 0000 (20 September 2002); doi: 10.1117/12.464066
Proc. SPIE 4927, Polychromatic modulation transfer function analysis of color LCD, 0000 (20 September 2002); doi: 10.1117/12.464314
Proc. SPIE 4927, Alternative method for simulating IPSF in two-photon laser scanning microscopy, 0000 (20 September 2002); doi: 10.1117/12.464324
Proc. SPIE 4927, Analysis of resolving power in linear optical image systems, 0000 (20 September 2002); doi: 10.1117/12.471442