PROCEEDINGS VOLUME 4994
INTEGRATED OPTOELECTRONICS DEVICES | 25-31 JANUARY 2003
Vertical-Cavity Surface-Emitting Lasers VII
INTEGRATED OPTOELECTRONICS DEVICES
25-31 January 2003
San Jose, CA, United States
VCSEL Manufacturing
Proc. SPIE 4994, The VCSELs are coming, 0000 (17 June 2003); doi: 10.1117/12.475724
Proc. SPIE 4994, Reliability and commercialization of oxidized VCSEL, 0000 (17 June 2003); doi: 10.1117/12.482636
Novel Structures I
Proc. SPIE 4994, Novel 980-nm and 490-nm light sources using vertical-cavity lasers with extended coupled cavities, 0000 (17 June 2003); doi: 10.1117/12.475742
Proc. SPIE 4994, 142-nm electrostatically actuated tuning using surface-micromachined vertical air-cavity wavelength-selective elements for applications in 1.55-um VCSELs, 0000 (17 June 2003); doi: 10.1117/12.475722
VCSEL Reliability I
Proc. SPIE 4994, Reliability of 1.3-um VCSELs for metro area networks, 0000 (17 June 2003); doi: 10.1117/12.482853
Proc. SPIE 4994, Characterization of failure mechanisms for oxide VCSELs, 0000 (17 June 2003); doi: 10.1117/12.482637
Proc. SPIE 4994, Nanoscale materials characterization of degradation in VCSELs, 0000 (17 June 2003); doi: 10.1117/12.482858
VCSEL Arrays and Characterization
Proc. SPIE 4994, Comparison of approaches to 850-nm 2D VCSEL arrays, 0000 (17 June 2003); doi: 10.1117/12.475739
Proc. SPIE 4994, BER enhancement due to parasitic coupling in VCSEL array interconnects, 0000 (17 June 2003); doi: 10.1117/12.479513
Proc. SPIE 4994, Thermal and optoelectronic model of VCSEL arrays for short-range communications, 0000 (17 June 2003); doi: 10.1117/12.475726
Proc. SPIE 4994, Modeling and observations of modal structure in antiguided VCSEL array, 0000 (17 June 2003); doi: 10.1117/12.475727
Proc. SPIE 4994, Temperature-dependent near-field emission profiles of oxide-confined vertical-cavity surface-emitting lasers, 0000 (17 June 2003); doi: 10.1117/12.473600
Proc. SPIE 4994, Polarization behavior and mode structure of vertical-cavity surface-emitting lasers with elliptical surface relief, 0000 (17 June 2003); doi: 10.1117/12.475729
Long Wavelength VCSELs I
Proc. SPIE 4994, 1.3-um InGaAs(N)/GaAs vertical-cavity lasers, 0000 (17 June 2003); doi: 10.1117/12.482854
VCSEL Reliability II
Proc. SPIE 4994, Reliability and failure mechanisms of oxide VCSELs in nonhermetic environments, 0000 (17 June 2003); doi: 10.1117/12.480281
Proc. SPIE 4994, Highly reliable oxide VCSELs for datacom applications, 0000 (17 June 2003); doi: 10.1117/12.482633
Proc. SPIE 4994, Studies of ESD-related failure patterns of Agilent oxide VCSELs, 0000 (17 June 2003); doi: 10.1117/12.482632
High-Speed VCSELs and Transceiver Applications
Proc. SPIE 4994, VCSEL-based optical front ends for low-cost 10-Gb/s transceivers, 0000 (17 June 2003); doi: 10.1117/12.482855
Proc. SPIE 4994, Development of 850-nm VCSELs for high-speed interconnection systems, 0000 (17 June 2003); doi: 10.1117/12.480373
Novel Structures II and Long Wavelength VCSELs II
Proc. SPIE 4994, 490-nm coherent emission by intracavity frequency doubling of extended cavity surface-emitting diode lasers, 0000 (17 June 2003); doi: 10.1117/12.475743
Proc. SPIE 4994, Electrically pumped fluidic cavity (EPFC) VCSEL for the detection of biologic agents, 0000 (17 June 2003); doi: 10.1117/12.473599
Proc. SPIE 4994, Lateral mode control of vertical-cavity surface-emitting lasers using two-dimensional photonic crystal structure, 0000 (17 June 2003); doi: 10.1117/12.479514
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