PROCEEDINGS VOLUME 5011
ELECTRONIC IMAGING 2003 | 20-24 JANUARY 2003
Machine Vision Applications in Industrial Inspection XI
IN THIS VOLUME

0 Sessions, 35 Papers, 0 Presentations
3D  (1)
ELECTRONIC IMAGING 2003
20-24 January 2003
Santa Clara, CA, United States
3D
Proc. SPIE 5011, Accurate surface reconstruction of large 3D objects from range data, 0000 (22 May 2003); doi: 10.1117/12.477507
Industrial Inspection I
Proc. SPIE 5011, Distributed image processing system for the monitoring of hot steel wire, 0000 (22 May 2003); doi: 10.1117/12.473965
Proc. SPIE 5011, Identification of white contaminants and their removal from wool fibers, 0000 (22 May 2003); doi: 10.1117/12.474038
Proc. SPIE 5011, Vision system for auto-detection of cashmere pigmented fibers, 0000 (22 May 2003); doi: 10.1117/12.474033
Industrial Inspection II
Proc. SPIE 5011, Primary detection of hardwood log defects using laser surface scanning, 0000 (22 May 2003); doi: 10.1117/12.474036
Proc. SPIE 5011, Tunnel profile measurement by vision metrology toward application to NATM, 0000 (22 May 2003); doi: 10.1117/12.477510
Proc. SPIE 5011, Calibration verification of a mining machine using image processing, 0000 (22 May 2003); doi: 10.1117/12.473967
Proc. SPIE 5011, Relief reconstruction of rough-textured surface through image analysis, 0000 (22 May 2003); doi: 10.1117/12.474044
Proc. SPIE 5011, Shape description and analysis of range data for milled steel blocks, 0000 (22 May 2003); doi: 10.1117/12.474029
Industrial Inspection III
Proc. SPIE 5011, Machine vision technique for measuring glass container thickness, 0000 (22 May 2003); doi: 10.1117/12.474071
Proc. SPIE 5011, Computer-vision-based gob inspection system for monitoring and control in the glass industry, 0000 (22 May 2003); doi: 10.1117/12.474025
Proc. SPIE 5011, Development of a strain analyzer system for sheet metal stamped parts based on an optical 3D digitizer, 0000 (22 May 2003); doi: 10.1117/12.473963
Proc. SPIE 5011, Automated serial number recognition system, 0000 (22 May 2003); doi: 10.1117/12.474021
Pattern Recognition I
Proc. SPIE 5011, Hybrid machine vision method for autonomous guided vehicles, 0000 (22 May 2003); doi: 10.1117/12.474027
Proc. SPIE 5011, Three color selective stereo gradient method for fast topography recognition of metallic surfaces, 0000 (22 May 2003); doi: 10.1117/12.473968
Proc. SPIE 5011, Using a high-speed camera to discriminate projective lines with an adverse illumination, 0000 (22 May 2003); doi: 10.1117/12.474014
Proc. SPIE 5011, Classification of painting cracks for content-based analysis, 0000 (22 May 2003); doi: 10.1117/12.474012
Pattern Recognition II
Proc. SPIE 5011, Estimating cross-section semiconductor structure by comparing top-down SEM images, 0000 (22 May 2003); doi: 10.1117/12.479691
Proc. SPIE 5011, Effect of acquisition system features on algorithm performance, 0000 (22 May 2003); doi: 10.1117/12.474069
Proc. SPIE 5011, Content-based segmentation of patterned wafer for automatic threshold determination, 0000 (22 May 2003); doi: 10.1117/12.479689
Proc. SPIE 5011, Fine structure measurement in the SEM cross section of LSI using the Canny edge detector, 0000 (22 May 2003); doi: 10.1117/12.474039
Proc. SPIE 5011, Comprehensive investigation of subpixel edge detection schemes in metrology, 0000 (22 May 2003); doi: 10.1117/12.474070
Registration/Multispectral
Proc. SPIE 5011, Automated image registration in semiconductor industry: a case study in the direct-to-digital holography inspection system, 0000 (22 May 2003); doi: 10.1117/12.479688
Proc. SPIE 5011, NIR spectrophotometric system based on a conventional CCD camera, 0000 (22 May 2003); doi: 10.1117/12.474007
Proc. SPIE 5011, Real-time multispectral high-temperature measurement: application to control in the industry, 0000 (22 May 2003); doi: 10.1117/12.473990
Proc. SPIE 5011, Ornamental stone finished product aesthetic inspection and characterization through a digital spectrophotometric approach, 0000 (22 May 2003); doi: 10.1117/12.473969
Interferometry
Proc. SPIE 5011, Dynamic classification of fringe patterns in holographic interferometry by optical wavelet filtering, 0000 (22 May 2003); doi: 10.1117/12.477512
Proc. SPIE 5011, Determination of speckle fringe orientation map by image sequence and removing the speckle noise from speckle fringe patterns, 0000 (22 May 2003); doi: 10.1117/12.473972
Poster Session
Proc. SPIE 5011, Skeletonization based on the symmetric point pairs sequence and its application, 0000 (22 May 2003); doi: 10.1117/12.473978
Proc. SPIE 5011, Estimation of electron beam profile from SEM image by using wavelet multiresolution analysis, 0000 (22 May 2003); doi: 10.1117/12.474010
Proc. SPIE 5011, Temperature mapping in heat treatment processes with a standard color-video camera by means of image processing, 0000 (22 May 2003); doi: 10.1117/12.477505
Proc. SPIE 5011, Camera calibration technique with planar scenes, 0000 (22 May 2003); doi: 10.1117/12.477506
Proc. SPIE 5011, Automated visual inspection for polished stone manufacture, 0000 (22 May 2003); doi: 10.1117/12.477511
Proc. SPIE 5011, Stereo vision technology for object measurement, 0000 (22 May 2003); doi: 10.1117/12.477513
Proc. SPIE 5011, Eigenspace technique for object characterization in a disaster field, 0000 (22 May 2003); doi: 10.1117/12.479686
Back to Top