PROCEEDINGS VOLUME 5024
INTERNATIONAL CONFERENCE ON OPTICAL DIAGNOSTICS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS 2003 | 1-3 APRIL 2003
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
IN THIS VOLUME

0 Sessions, 31 Papers, 0 Presentations
INTERNATIONAL CONFERENCE ON OPTICAL DIAGNOSTICS OF MATERIALS AND DEVICES FOR OPTO-, MICRO-, AND QUANTUM ELECTRONICS 2003
1-3 April 2003
Moscow, Russian Federation
Optical Properties of Materials and Structures
Proc. SPIE 5024, Laser spectroscopy of silicon quantum materials, 0000 (1 April 2003); doi: 10.1117/12.497304
Proc. SPIE 5024, Ionization of impurities in semiconductors by intense FIR radiation, 0000 (1 April 2003); doi: 10.1117/12.497302
Proc. SPIE 5024, Correlation of optical properties with the microstructure of Si nanocrystals in SiO2 fabricated by ion implantation, 0000 (1 April 2003); doi: 10.1117/12.497298
Proc. SPIE 5024, Modeling optical properties geterophases ceramic materials SiC+AlN type by the Bruggman theory, 0000 (1 April 2003); doi: 10.1117/12.497297
Proc. SPIE 5024, Structural transformations caused in sulphate luminophors during thermal treatment, 0000 (1 April 2003); doi: 10.1117/12.497292
Proc. SPIE 5024, Influence of the surface polariton absorption on the color of metallic surfaces with small irregularities, 0000 (1 April 2003); doi: 10.1117/12.497291
Proc. SPIE 5024, Photostructural transformations in amorphous Ge-S thin films: a photoluminescence study, 0000 (1 April 2003); doi: 10.1117/12.497289
Proc. SPIE 5024, Photosensitive properties of As-S layers, 0000 (1 April 2003); doi: 10.1117/12.497287
Proc. SPIE 5024, Optical and magnetotransport study of quaternary semimagnetic Hg1-x-yCdxMnySe and Hg1-x-yCdxMnyTe single crystals, 0000 (1 April 2003); doi: 10.1117/12.497284
Proc. SPIE 5024, Study of charge flow mechanisms in metal-porous silicon structures by photoluminescent and electrophysical techniques, 0000 (1 April 2003); doi: 10.1117/12.497279
Proc. SPIE 5024, Optical properties and photoinduced effects in Ge-As-Se films and two-layer systems on their basis, 0000 (1 April 2003); doi: 10.1117/12.497268
Proc. SPIE 5024, IR ellipsometric studies of Ti and Mo surfaces modified by high-dose ion irradiation, 0000 (1 April 2003); doi: 10.1117/12.497263
Proc. SPIE 5024, Electromagnetic wave reflection by rough fractal surface of semiconductor materials, 0000 (1 April 2003); doi: 10.1117/12.497262
Proc. SPIE 5024, Effect of irradiation on quantum-size layer properties grown on semi-insulating GaAs, 0000 (1 April 2003); doi: 10.1117/12.497257
Proc. SPIE 5024, Dispersion of optical characteristics of anisotropic CdP2 single crystals, 0000 (1 April 2003); doi: 10.1117/12.497253
Optical Testing of Materials and Devices
Proc. SPIE 5024, Raman scattering and microstructural analysis of polycrystalline CuInS2 films for solar cell devices, 0000 (1 April 2003); doi: 10.1117/12.497250
Proc. SPIE 5024, Diagnostics of optical nonlinearities: spatial beam distortion technique and its application to semiconductors and novel materials, 0000 (1 April 2003); doi: 10.1117/12.497191
Proc. SPIE 5024, Optical diagnostics of InGaAs quantum well in pseudomorphic modulation-doped Al1-xGaxAs/InyGa1-yAs/GaAs heterostructures of less-than-critical layer thickness, 0000 (1 April 2003); doi: 10.1117/12.497184
Proc. SPIE 5024, Nondestructive diagnostics of bulk GaAs and CdZnTe crystals by nanosecond and picosecond wave-mixing techniques, 0000 (1 April 2003); doi: 10.1117/12.497179
Proc. SPIE 5024, Study of microsoiling in technological mediums by method of quasi-elastic light scattering, 0000 (1 April 2003); doi: 10.1117/12.497178
Proc. SPIE 5024, Determination of optical constants of thin films on substrates by reflectance and transmittance measurements, 0000 (1 April 2003); doi: 10.1117/12.497177
Proc. SPIE 5024, Testing optical materials by birefringence dispersion mapping, 0000 (1 April 2003); doi: 10.1117/12.497176
Proc. SPIE 5024, Photoluminescence and radioluminescence spectra of x-ray phosphors, 0000 (1 April 2003); doi: 10.1117/12.497172
Proc. SPIE 5024, On-line monitoring of the manufacturing process of optical microelements by means of controlled heating with laser, 0000 (1 April 2003); doi: 10.1117/12.497165
Proc. SPIE 5024, Real-time interferometric investigation of defects and stresses in solids, 0000 (1 April 2003); doi: 10.1117/12.497160
Proc. SPIE 5024, Attachment-level parameterization in copper-doped lithium tetraborate, 0000 (1 April 2003); doi: 10.1117/12.497159
Proc. SPIE 5024, Thermostimulated luminescence and x-ray luminescence of chromium- and titanium-doped leucosapphire single crystals, 0000 (1 April 2003); doi: 10.1117/12.497158
Proc. SPIE 5024, Extraction of the Mueller-Jones part constructed on basis of four anisotropy mechanisms out of experimental deterministic Mueller matrix, 0000 (1 April 2003); doi: 10.1117/12.497157
Proc. SPIE 5024, Holographic associative processor using photorefractive crystals, 0000 (1 April 2003); doi: 10.1117/12.497156
Proc. SPIE 5024, Spectral-analytical characteristics of laser plasma under multipulse excitation regime, 0000 (1 April 2003); doi: 10.1117/12.497154
Proc. SPIE 5024, Characterization of thin film semiconductor heterostructures using interference modes in wide spectral region, 0000 (1 April 2003); doi: 10.1117/12.497152
Back to Top