PROCEEDINGS VOLUME 5025
FIFTH SEMINAR ON PROBLEMS OF THEORETICAL AND APPLIED ELECTRON AND ION OPTICS | 14-15 NOVEMBER 2001
Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics
FIFTH SEMINAR ON PROBLEMS OF THEORETICAL AND APPLIED ELECTRON AND ION OPTICS
14-15 November 2001
Moscow, Russian Federation
Theoretical and Computer Electron Optics
Proc. SPIE 5025, Three-dimensional numeric calculation of electrostatic field with universal algorithm of surface-charge singularities treatment based on the Fichera's method, 0000 (1 April 2003); doi: 10.1117/12.497994
Proc. SPIE 5025, Matching and correcting electric mirrors in electron optics, 0000 (1 April 2003); doi: 10.1117/12.497598
Proc. SPIE 5025, Calculation of electrostatic mirrors free of spherical and chromatic aberrations, 0000 (1 April 2003); doi: 10.1117/12.497600
Proc. SPIE 5025, Simulation of klystron-type electron devices, 0000 (1 April 2003); doi: 10.1117/12.497997
Proc. SPIE 5025, Complex of codes for computer-aided design of electron guns with grid control, 0000 (1 April 2003); doi: 10.1117/12.497614
Proc. SPIE 5025, On-line distance learning system to study theory of magnetic lenses electron optics, 0000 (1 April 2003); doi: 10.1117/12.497999
Proc. SPIE 5025, Computer simulation of influence of residual gas on formation of intensive electronic beams in plasma sources of the charged particles, 0000 (1 April 2003); doi: 10.1117/12.498003
Proc. SPIE 5025, Electron gun model for technological and microscopical applications, 0000 (1 April 2003); doi: 10.1117/12.497620
Proc. SPIE 5025, Simulation of the electron-optical system of the MIS-I electron-beam multicharged ion, 0000 (1 April 2003); doi: 10.1117/12.511994
Analytical and Technological Electron-Optical Devices and Equipment
Proc. SPIE 5025, Device for controlling a charged particle beam structure, 0000 (1 April 2003); doi: 10.1117/12.497623
Proc. SPIE 5025, PEEM/LEEM resolution, 0000 (1 April 2003); doi: 10.1117/12.498007
Proc. SPIE 5025, Control of spatial information of electron beam waves in electron beam computers and electron microscopes, 0000 (1 April 2003); doi: 10.1117/12.497630
Proc. SPIE 5025, Anode modulator of electron-beam sources of multicharged ions, 0000 (1 April 2003); doi: 10.1117/12.511993
Intensive Electron Beam Simulation and Design
Proc. SPIE 5025, Intense electron beam in electron cooling method, 0000 (1 April 2003); doi: 10.1117/12.498008
Proc. SPIE 5025, Formation of an intense electron beam in guns with a small-diameter cathode, 0000 (1 April 2003); doi: 10.1117/12.498016
Proc. SPIE 5025, Relativistic electron beam injector synthesis on basis of geometrized space-charge-flow equations, 0000 (1 April 2003); doi: 10.1117/12.497635
Proc. SPIE 5025, Using magnetron-injection guns for beam-plasma microwave tubes, 0000 (1 April 2003); doi: 10.1117/12.497594
Proc. SPIE 5025, Problems of account of electron-optical systems beam-plasma devices of microwave, 0000 (1 April 2003); doi: 10.1117/12.498028
Electron and Ion-Beam Interaction with Matter
Proc. SPIE 5025, Interactions of fast helium ions with an emitter of radioisotope source of electric current, 0000 (1 April 2003); doi: 10.1117/12.498029
Proc. SPIE 5025, Orthogonal-projection method for solving equations of diffusion of minority charge carriers generated by the electron beam in semiconductors, 0000 (1 April 2003); doi: 10.1117/12.498033
Proc. SPIE 5025, Particularities of IR-radiation absorbing in fine polyimide structures and microbolometer detector on their base, 0000 (1 April 2003); doi: 10.1117/12.498042
Proc. SPIE 5025, Representations of wave electron optics for description of the process of electron interaction with crystal lattice field: deriving an analytical description of dynamic multiwave electron diffraction on crystal lattice by using Kirchhoff's diffraction integral, 0000 (1 April 2003); doi: 10.1117/12.498056
Proc. SPIE 5025, Collective electron oscillations in ceramic systems, 0000 (1 April 2003); doi: 10.1117/12.498057
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