Lasers and Photodectors in Industry, Imaging, and Sensors
Proc. SPIE 5036, New generation of all-optical devices for future communication networks, 0000 (8 July 2003); doi: 10.1117/12.498224
Proc. SPIE 5036, Highly conherent tunable semiconductor lasers in metrology of length, 0000 (8 July 2003); doi: 10.1117/12.498233
Proc. SPIE 5036, Image quality influenced by selected image-sensor parameters, 0000 (8 July 2003); doi: 10.1117/12.498235
Proc. SPIE 5036, Interferometric method for deformation measurement of structures in industry, 0000 (8 July 2003); doi: 10.1117/12.498236
Proc. SPIE 5036, Fast-sampling multipixel detector for a heterodyne interferometer with angstrom precision, 0000 (8 July 2003); doi: 10.1117/12.498238
Proc. SPIE 5036, Technological aspects of a custom CMOS sensor for adaptive optics, 0000 (8 July 2003); doi: 10.1117/12.498240
Proc. SPIE 5036, 2-W high-brightness semiconductor lasers with Bragg-grating filtering, 0000 (8 July 2003); doi: 10.1117/12.498241
Proc. SPIE 5036, Photodetection and computer analysis of a human eye retina image influenced by glaucoma, 0000 (8 July 2003); doi: 10.1117/12.498242
Proc. SPIE 5036, Optical porous-silicon-based sensors with chemically modified surface for detection of organic vapors, 0000 (8 July 2003); doi: 10.1117/12.498244
Proc. SPIE 5036, Monitoring of laser welding processes by optical emission spectroscopy, 0000 (8 July 2003); doi: 10.1117/12.498245
Proc. SPIE 5036, Phase elements by means of a photolithographic system employing a spatial light modulator, 0000 (8 July 2003); doi: 10.1117/12.498247
Proc. SPIE 5036, Peculiarities of electroluminescence of quantum dot laser heterostructures, 0000 (8 July 2003); doi: 10.1117/12.498248
Proc. SPIE 5036, Investigation of the sensitivity of PCS fibers to changes of light absorption coefficient of the cladding, 0000 (8 July 2003); doi: 10.1117/12.498249
Proc. SPIE 5036, Measuring parameters and characteristics of a fiber optic spectrometer using white-light spectral interferometry, 0000 (8 July 2003); doi: 10.1117/12.498250
Proc. SPIE 5036, Optical properties of thin layers and conditions of the reactive sputtering for passivation of SQWSCH lasers, 0000 (8 July 2003); doi: 10.1117/12.498251
Proc. SPIE 5036, AIN mirror coating for high-power (AlGa)As laser diodes, 0000 (8 July 2003); doi: 10.1117/12.498253
Proc. SPIE 5036, Passively Q-switched diode-pumped Nd:YAG laser with intracavity optical parametric oscillator, 0000 (8 July 2003); doi: 10.1117/12.498255
Proc. SPIE 5036, Testing of security applications of optical JTC, 0000 (8 July 2003); doi: 10.1117/12.498256
Proc. SPIE 5036, Ray method for measurement of static deformations of optically rough surfaces, 0000 (8 July 2003); doi: 10.1117/12.498257
Proc. SPIE 5036, Mode locking of diode- and flashlamp-pumped Nd:YAG lasers using semiconductor saturable absorbers, 0000 (8 July 2003); doi: 10.1117/12.498258
Proc. SPIE 5036, Ultralow-pump-threshold laser-diode-pumped continuous Cr:LiSAF laser, 0000 (8 July 2003); doi: 10.1117/12.498259
Proc. SPIE 5036, Sensitivity of an IGI fiber with a germanium-oxide-doped silica core to refractive index changes of the optical cladding, 0000 (8 July 2003); doi: 10.1117/12.498260
Proc. SPIE 5036, The self-imaging phenomenon and its applications, 0000 (8 July 2003); doi: 10.1117/12.498261
Proc. SPIE 5036, 10-W cw Nd-doped double-clad fiber laser operating at 1.06 um, 0000 (8 July 2003); doi: 10.1117/12.498326
Proc. SPIE 5036, Accuracy improvement of unflat object size measurements in laser scanning systems, 0000 (8 July 2003); doi: 10.1117/12.498328
Proc. SPIE 5036, Automatic stand for metrological certification of high-accuracy angular measuring devices, 0000 (8 July 2003); doi: 10.1117/12.498329
Proc. SPIE 5036, Analysis of a wedge prism to perform small-angle beam deviation, 0000 (8 July 2003); doi: 10.1117/12.498330
Proc. SPIE 5036, Correction of CCD sensor noise, 0000 (8 July 2003); doi: 10.1117/12.498331
Physics and Simulation of Photonic Devices
Proc. SPIE 5036, Optimum design of CMOS APS imagers, 0000 (8 July 2003); doi: 10.1117/12.498332
Proc. SPIE 5036, White-light spectral interferometry with the equalization wavelength determination used to measure group velocity dispersion in optical samples, 0000 (8 July 2003); doi: 10.1117/12.498334
Proc. SPIE 5036, Optical bistability in a bulk heavily doped Er:Yb:phosphate glass laser, 0000 (8 July 2003); doi: 10.1117/12.498335
Proc. SPIE 5036, Precise characterization of fiber Bragg gratings for photonic communications systems, 0000 (8 July 2003); doi: 10.1117/12.498337
Proc. SPIE 5036, Nondestructive imaging and characterization of optical fiber Bragg gratings, 0000 (8 July 2003); doi: 10.1117/12.498355
Proc. SPIE 5036, Thermal behavior of Bragg gratings formed in germanosilicate fiber, 0000 (8 July 2003); doi: 10.1117/12.498362
Proc. SPIE 5036, Explicit finite-difference time domain for nonlinear analysis of waveguide modes, 0000 (8 July 2003); doi: 10.1117/12.498363
Proc. SPIE 5036, Scattering-parameters characterization of microwave photonics networks, 0000 (8 July 2003); doi: 10.1117/12.498368
Proc. SPIE 5036, Simulation of human visual perception properties using the human visual system model, 0000 (8 July 2003); doi: 10.1117/12.498371
Proc. SPIE 5036, Generation of non-Gaussian fundamental modes in low-power end-pumped Nd:YVO4 microchip laser, 0000 (8 July 2003); doi: 10.1117/12.498373
Proc. SPIE 5036, Superradiance as a transition phase from spontaneous to stimulated emission in low-dimensional semiconductor heterostructures, 0000 (8 July 2003); doi: 10.1117/12.498374
Proc. SPIE 5036, Analysis of Bragg grating written in high-birefringence fiber optics, 0000 (8 July 2003); doi: 10.1117/12.498375
Proc. SPIE 5036, Temperature dependence of the multilayer film properties composed of magneto-optical and dielectric materials, 0000 (8 July 2003); doi: 10.1117/12.498452
Proc. SPIE 5036, Double heterojunction bipolar phototransistor model, 0000 (8 July 2003); doi: 10.1117/12.498453
Proc. SPIE 5036, Possibilities and limitations of A2MX4 and AMX3 crystal growth, 0000 (8 July 2003); doi: 10.1117/12.498454
Proc. SPIE 5036, Rate equations for ruby and alexandrite Q-switched lasers, 0000 (8 July 2003); doi: 10.1117/12.498506
Proc. SPIE 5036, Experiments on nondiffracting beams, 0000 (8 July 2003); doi: 10.1117/12.498508
Proc. SPIE 5036, Dynamics of a vectorial neodymium-doped fiber laser passively Q-switched by a polymer-based saturable absorber, 0000 (8 July 2003); doi: 10.1117/12.498509
Proc. SPIE 5036, Optical properties of Er:YAG and Er:YAP materials and layers grown by laser, 0000 (8 July 2003); doi: 10.1117/12.498510
Proc. SPIE 5036, Temperature dependence of electro-optic coefficients of LiNbO3 crystals, 0000 (8 July 2003); doi: 10.1117/12.498513
Proc. SPIE 5036, WDM in SDH network: introduction and interworking, 0000 (8 July 2003); doi: 10.1117/12.498514
Proc. SPIE 5036, Dispersive optical bistability in unidirectional ring cavity, 0000 (8 July 2003); doi: 10.1117/12.498518
Proc. SPIE 5036, Revival of the orbital angular momentum of the vortex beam after interaction with a nontransparent obstacle, 0000 (8 July 2003); doi: 10.1117/12.498519
Guided Wave Photonic Devices
Proc. SPIE 5036, Magneto-optical phenomena in systems with prism coupling, 0000 (8 July 2003); doi: 10.1117/12.498520
Proc. SPIE 5036, Exchangeable grating couplers for integrated optics, 0000 (8 July 2003); doi: 10.1117/12.498525
Proc. SPIE 5036, All-optical triode derived from tandem wavelength conversion in semiconductor lasers and optical amplifiers, 0000 (8 July 2003); doi: 10.1117/12.498526
Proc. SPIE 5036, Optical waveguides prepared by ion exchange technique, 0000 (8 July 2003); doi: 10.1117/12.498528
Proc. SPIE 5036, Influence of temperature changes on the field distribution of the optical fiber above the normalized frequency critical value, 0000 (8 July 2003); doi: 10.1117/12.498529
Proc. SPIE 5036, Modeling the gain and photon statistics of single- and double-pass Er3+-doped Ti:LiNbO3 M-mode straight waveguide amplifiers, 0000 (8 July 2003); doi: 10.1117/12.498531
Proc. SPIE 5036, Magneto-optics of systems containing noncoherent propagation in thick layers, 0000 (8 July 2003); doi: 10.1117/12.498533
Proc. SPIE 5036, Carbon layers for integrated optics, 0000 (8 July 2003); doi: 10.1117/12.498535