PROCEEDINGS VOLUME 5113
SPIE'S FIRST INTERNATIONAL SYMPOSIUM ON FLUCTUATIONS AND NOISE | 1-4 JUNE 2003
Noise in Devices and Circuits
SPIE'S FIRST INTERNATIONAL SYMPOSIUM ON FLUCTUATIONS AND NOISE
1-4 June 2003
Santa Fe, New Mexico, United States
Noise in MOSFETs I
Proc. SPIE 5113, Low-frequency noise and fluctuations in advanced CMOS devices, 0000 (12 May 2003); doi: 10.1117/12.484913
Proc. SPIE 5113, Impact of scaling down on 1/f noise in MOSFETs, 0000 (12 May 2003); doi: 10.1117/12.492906
Proc. SPIE 5113, Low-frequency noise and radiation response of buried oxides in SOI nMOS transistors, 0000 (12 May 2003); doi: 10.1117/12.487870
Proc. SPIE 5113, Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology, 0000 (12 May 2003); doi: 10.1117/12.488964
Noise in MOSFETs II
Proc. SPIE 5113, Flicker noise characterization and modeling of MOSFETs for RF IC design, 0000 (12 May 2003); doi: 10.1117/12.497094
Proc. SPIE 5113, Non-quasi-static (NQS) thermal noise modeling of the MOS transistor, 0000 (12 May 2003); doi: 10.1117/12.488835
Proc. SPIE 5113, Compact modeling of noise for RF CMOS circuit, 0000 (12 May 2003); doi: 10.1117/12.492939
Proc. SPIE 5113, Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs, 0000 (12 May 2003); doi: 10.1117/12.497141
Keynote Paper
Proc. SPIE 5113, Low-frequency noise behavior of polysilicon emitter bipolar junction transistors: a review, 0000 (12 May 2003); doi: 10.1117/12.488850
Noise and RTS in Bipolar Technologies
Proc. SPIE 5113, 1/f noise in advanced bipolar technologies, 0000 (12 May 2003); doi: 10.1117/12.489022
Proc. SPIE 5113, Comparison of low-frequency noise in III-V and Si/SiGe HBTs, 0000 (12 May 2003); doi: 10.1117/12.488966
Proc. SPIE 5113, Effect of the interface recombination current fluctuations on 1/f noise of gated lateral bipolar transistors, 0000 (12 May 2003); doi: 10.1117/12.496893
KT, Jitter, and Phase Noise
Proc. SPIE 5113, An overview of low-frequency noise in advanced CMOS/SOI transistors, 0000 (12 May 2003); doi: 10.1117/12.487717
Proc. SPIE 5113, 1/f noise and clock jitter in digital electronic systems, 0000 (12 May 2003); doi: 10.1117/12.488153
Proc. SPIE 5113, Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators, 0000 (12 May 2003); doi: 10.1117/12.497467
Proc. SPIE 5113, Nonlinear modeling of low-to-high-frequency noise up-conversion in microwave electron devices, 0000 (12 May 2003); doi: 10.1117/12.497568
GR Noise
Proc. SPIE 5113, Brief history of recombination noise in semiconductor junction devices, 0000 (12 May 2003); doi: 10.1117/12.497117
Proc. SPIE 5113, Generation-recombination noise in GaN and GaN-based devices, 0000 (12 May 2003); doi: 10.1117/12.488468
Proc. SPIE 5113, Computer simulation and reverse engineering of trap-assisted generation-recombination noise in advanced silicon MOSFETs, 0000 (12 May 2003); doi: 10.1117/12.497127
Theory, Modeling, and Applications
Proc. SPIE 5113, Fast and ultrafast dissipation and fluctuations in two-dimensional channels for nitride and arsenide FETs, 0000 (12 May 2003); doi: 10.1117/12.488759
Proc. SPIE 5113, Microscopic investigation of large-signal noise in semiconductor materials and devices, 0000 (12 May 2003); doi: 10.1117/12.488959
Proc. SPIE 5113, Characteristic potential method of noise calculation in semiconductor devices: calculation of 1/f noise in MOS transistors in the ohmic region, 0000 (12 May 2003); doi: 10.1117/12.488947
Proc. SPIE 5113, General models for 1/f noise, 0000 (12 May 2003); doi: 10.1117/12.490145
Proc. SPIE 5113, Noise analysis of an 0.8-V ultralow-power CMOS operational amplifier, 0000 (12 May 2003); doi: 10.1117/12.488938
KT, Advanced Materials, and Devices
Proc. SPIE 5113, III-V HEMTs: low-noise devices for high-frequency applications, 0000 (12 May 2003); doi: 10.1117/12.488859
Proc. SPIE 5113, Study of low-frequency noise in GaN-on-Si films obtained by laser-assisted debonding, 0000 (12 May 2003); doi: 10.1117/12.497674
Proc. SPIE 5113, Low-frequency drain noise in AlGaN/GaN HEMTs on Si substrate, 0000 (12 May 2003); doi: 10.1117/12.497130
Measurements, Limitations
Proc. SPIE 5113, Low-frequency noise measurements: applications, methodologies and instrumentation, 0000 (12 May 2003); doi: 10.1117/12.489652
KT, Advanced Materials, and Devices
Proc. SPIE 5113, Noise and charge transport in polymer thin film structures, 0000 (12 May 2003); doi: 10.1117/12.485990
Novel Devices
Proc. SPIE 5113, Difference in dependence of 1/f and RTS noise on current in quantum-dot light-emitting diodes, 0000 (12 May 2003); doi: 10.1117/12.503166
Poster Session
Proc. SPIE 5113, High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation, 0000 (12 May 2003); doi: 10.1117/12.490176
Proc. SPIE 5113, Shot noise reduction in the AlGaAs/GaAs- and InGaP/GaAs-based HBTs, 0000 (12 May 2003); doi: 10.1117/12.490187
Proc. SPIE 5113, Low-frequency noise in porous Si LED, 0000 (12 May 2003); doi: 10.1117/12.492905
Proc. SPIE 5113, 1/f noise in passive components under time-varying bias, 0000 (12 May 2003); doi: 10.1117/12.492922
Proc. SPIE 5113, Kink-effect-related noise in InAlAs/InGaAs short-channel HEMTs, 0000 (12 May 2003); doi: 10.1117/12.493050
Proc. SPIE 5113, Model of flicker noise effects on phase noise in oscillators, 0000 (12 May 2003); doi: 10.1117/12.496951
Proc. SPIE 5113, A theory for Hooge's equation based on temperature fluctuations, 0000 (12 May 2003); doi: 10.1117/12.496966
Proc. SPIE 5113, Linear time-variant noise-generating systems, 0000 (12 May 2003); doi: 10.1117/12.497019
Proc. SPIE 5113, Accurate modeling of noise parameters in subquarter-micrometer gate FETs using physical simulators, 0000 (12 May 2003); doi: 10.1117/12.497029
Proc. SPIE 5113, Determination of the influence of device structure and alloy composition on the noise behavior of hetero-FETs, 0000 (12 May 2003); doi: 10.1117/12.497035
Proc. SPIE 5113, LF noise in cross Hall effect devices: geometrical study, 0000 (12 May 2003); doi: 10.1117/12.497145
Proc. SPIE 5113, Physical model for low-frequency noise in avalanche breakdown of PN junctions, 0000 (12 May 2003); doi: 10.1117/12.497403
Proc. SPIE 5113, Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025, 0000 (12 May 2003); doi: 10.1117/12.497578
Proc. SPIE 5113, Principles and applications of coherent random noise radar technology, 0000 (12 May 2003); doi: 10.1117/12.484912
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