PROCEEDINGS VOLUME 5144
OPTICAL METROLOGY | 23-26 JUNE 2003
Optical Measurement Systems for Industrial Inspection III
OPTICAL METROLOGY
23-26 June 2003
Munich, Germany
New Techniques I: High Resolution Surface Metrology
Proc. SPIE 5144, Some topics in surface and nanometrology, 0000 (30 May 2003); doi: 10.1117/12.508362
Proc. SPIE 5144, Intracavity beam shaping for nanoscale surface metrology, 0000 (30 May 2003); doi: 10.1117/12.500549
Proc. SPIE 5144, Vector simulations of dark beam interaction with nanoscale surface features, 0000 (30 May 2003); doi: 10.1117/12.500588
Proc. SPIE 5144, Interference microscope for sub-Angstrom surface roughness measurements, 0000 (30 May 2003); doi: 10.1117/12.500925
Proc. SPIE 5144, High-speed measurements using optical profiler, 0000 (30 May 2003); doi: 10.1117/12.501035
New Techniques II: Digital Holography
Proc. SPIE 5144, Error factors of comparison in difference holographic interferometry, 0000 (30 May 2003); doi: 10.1117/12.499897
Proc. SPIE 5144, Highly efficient optical reconstruction of digital holograms for deformation and shape control, 0000 (30 May 2003); doi: 10.1117/12.501241
Proc. SPIE 5144, Influence of reference beam aberrations in digital holography on the image quality, 0000 (30 May 2003); doi: 10.1117/12.499899
Proc. SPIE 5144, Reconstruction of phase-shift digital holograms with unknown phase-shift by Fourier fringe analysis, 0000 (30 May 2003); doi: 10.1117/12.508359
Proc. SPIE 5144, Focal-plane-invariant algorithm for digital reconstruction of holograms recorded in the near diffraction zone, 0000 (30 May 2003); doi: 10.1117/12.502055
Proc. SPIE 5144, Optimized interferometer for 3D digital holographic endoscopy, 0000 (30 May 2003); doi: 10.1117/12.508357
Shape Measurement I: Surface Profiling Techniques (1)
Proc. SPIE 5144, Statistical characterization of speckle noise in coherent imaging systems, 0000 (30 May 2003); doi: 10.1117/12.502054
Proc. SPIE 5144, Optical versus tactile geometry measurement: alternatives or counterparts, 0000 (30 May 2003); doi: 10.1117/12.508360
Proc. SPIE 5144, Simultaneous measurement of surface topology and material distribution by polarization detection, 0000 (30 May 2003); doi: 10.1117/12.501332
Proc. SPIE 5144, Development of confocal-based techniques for shape measurements on structured surfaces containing dissimilar materials, 0000 (30 May 2003); doi: 10.1117/12.500470
Proc. SPIE 5144, Standing-wave interferometer based on partially transparent photodiodes, 0000 (30 May 2003); doi: 10.1117/12.499902
Proc. SPIE 5144, Three-wavelength laser light source for absolute sub-Angstrom two-point-source interferometer, 0000 (30 May 2003); doi: 10.1117/12.500414
Proc. SPIE 5144, Simple polarization phase shifting for scatterplate interferometry, 0000 (30 May 2003); doi: 10.1117/12.500009
Proc. SPIE 5144, Oblique point-diffraction source for interferometer design, 0000 (30 May 2003); doi: 10.1117/12.500253
Proc. SPIE 5144, Adaptive Shack-Hartmann sensor, 0000 (30 May 2003); doi: 10.1117/12.499543
Proc. SPIE 5144, Isotropic n-dimensional quadrature transform and its applications in fringe pattern processing, 0000 (30 May 2003); doi: 10.1117/12.499801
Proc. SPIE 5144, Design and characterization of liquid crystal light modulators, 0000 (30 May 2003); doi: 10.1117/12.508361
Proc. SPIE 5144, Application of a ferroelectric liquid-crystal-on-silicon display in fringe projections setups, 0000 (30 May 2003); doi: 10.1117/12.499646
Proc. SPIE 5144, Measurement of optically effective surfaces by imaging of gratings, 0000 (30 May 2003); doi: 10.1117/12.500601
Proc. SPIE 5144, Three-dimensional camera, 0000 (30 May 2003); doi: 10.1117/12.501959
Proc. SPIE 5144, Design and implementation of a photogrammetric expert system for close-range industrial applications, 0000 (30 May 2003); doi: 10.1117/12.500262
Proc. SPIE 5144, Three-dimensional measurement by stereophotogrammetry, 0000 (30 May 2003); doi: 10.1117/12.500157
Proc. SPIE 5144, Three-dimensional level curves scanning based on intersection between laser lines, 0000 (30 May 2003); doi: 10.1117/12.499772
Proc. SPIE 5144, Uncertainty of topography determination based on slope difference or curvature measuring systems in laboratory and industrial environments, 0000 (30 May 2003); doi: 10.1117/12.500425
Proc. SPIE 5144, Advanced simulation of eye-safe imaging laser radar for range estimation, system comparison, and design process, 0000 (30 May 2003); doi: 10.1117/12.500440
Proc. SPIE 5144, Measurement of the composite resin thickness variations using digital interferometry, 0000 (30 May 2003); doi: 10.1117/12.500557
Proc. SPIE 5144, Optical design of rotationally symmetric triangulation sensors with low-cost detectors based on reflective optics, 0000 (30 May 2003); doi: 10.1117/12.500477
Proc. SPIE 5144, Calibration and production of praxial sensors for the ATLAS muon spectrometer, 0000 (30 May 2003); doi: 10.1117/12.500633
Proc. SPIE 5144, Digital fringe projection in 3D shape measurement: an error analysis, 0000 (30 May 2003); doi: 10.1117/12.500618
Proc. SPIE 5144, Laser goniometer systems for dynamic calibration of optical encoders, 0000 (30 May 2003); doi: 10.1117/12.501348
Proc. SPIE 5144, Application of grazing incidence interferometer to rough surface measurement, 0000 (30 May 2003); doi: 10.1117/12.500108
Proc. SPIE 5144, Component forming simulations validated using optical shape measurements, 0000 (30 May 2003); doi: 10.1117/12.500668
Proc. SPIE 5144, Calibration method of structured light system with a planar object, 0000 (30 May 2003); doi: 10.1117/12.500246
Proc. SPIE 5144, Imaging properties of vibrating flat mirror, 0000 (30 May 2003); doi: 10.1117/12.499576
Displacement Measurement I
Proc. SPIE 5144, A look into life sciences: more than a side step from industrial inspection?, 0000 (30 May 2003); doi: 10.1117/12.508363
Proc. SPIE 5144, Multicomponent shearography using optical fiber imaging-bundles, 0000 (30 May 2003); doi: 10.1117/12.499784
Proc. SPIE 5144, A novel approach to determination of the 3D order elastic moduli of isotropic materials, 0000 (30 May 2003); doi: 10.1117/12.499552
Proc. SPIE 5144, Evaluation of the optical rosette for translation, stresses, and stress gradient measurement, 0000 (30 May 2003); doi: 10.1117/12.503013
Proc. SPIE 5144, Internal deformation and velocity field measurements by use of digital speckle radiography, 0000 (30 May 2003); doi: 10.1117/12.500493
Proc. SPIE 5144, Evaluation of phase objects by pulsed TV holography and defocused speckle displacement, 0000 (30 May 2003); doi: 10.1117/12.500582
Nondestructive Testing I
Proc. SPIE 5144, Detection and sizing of delamination cracks in composite panels using speckle interferometry and genetic algorithms, 0000 (30 May 2003); doi: 10.1117/12.508358
Proc. SPIE 5144, Measuring distances and displacements using dispersive white-light spectral interferometry, 0000 (30 May 2003); doi: 10.1117/12.488763
Proc. SPIE 5144, Industrial applications of shearography for inspections of aircraft components, 0000 (30 May 2003); doi: 10.1117/12.508366
Proc. SPIE 5144, The development of an optical computed tomography apparatus for fault detection in transparent materials, 0000 (30 May 2003); doi: 10.1117/12.500898
Applications I
Proc. SPIE 5144, In-line geometric fault detection in car parts based on structured light projection and image processing, 0000 (30 May 2003); doi: 10.1117/12.500056
Proc. SPIE 5144, Determining the average annual ring width on the front side of lumber, 0000 (30 May 2003); doi: 10.1117/12.500200
Proc. SPIE 5144, Scattered ultrasound fields measured by scanning laser vibrometry, 0000 (30 May 2003); doi: 10.1117/12.500398
Proc. SPIE 5144, Analysis of the measurement capability of optical fringe projection systems, 0000 (30 May 2003); doi: 10.1117/12.501037
Proc. SPIE 5144, Autonomous scanning laser Doppler vibrometer vibration tracking method for inline quality control, 0000 (30 May 2003); doi: 10.1117/12.501236
Proc. SPIE 5144, Interferometric analysis of a lithium niobate with engineering reversed domains, 0000 (30 May 2003); doi: 10.1117/12.501840
Proc. SPIE 5144, New integrated approach for repairing and redesigning heavy forming tools, 0000 (30 May 2003); doi: 10.1117/12.499162
Proc. SPIE 5144, Photogrammetry in the line: recent developments in industrial photogrammetry, 0000 (30 May 2003); doi: 10.1117/12.499418
Proc. SPIE 5144, Progressive addition lenses power map measurement using Ronchi test techniques, 0000 (30 May 2003); doi: 10.1117/12.500463