Optical Manufacturing I
Proc. SPIE 5180, Optics needs for future space telescopes, 0000 (22 December 2003); doi: 10.1117/12.514277
Proc. SPIE 5180, Cooperative educational project for optical technicians utilizing amateur telescope making, 0000 (22 December 2003); doi: 10.1117/12.506166
Proc. SPIE 5180, Precessions aspheric polishing: new results from the development program, 0000 (22 December 2003); doi: 10.1117/12.507462
Optical Manufacturing II: Polishing and Crystal Materials
Proc. SPIE 5180, Inverse topographic analysis of scratches, 0000 (22 December 2003); doi: 10.1117/12.506036
Proc. SPIE 5180, Optimization of polishing processes by using iTIRM for in situ monitoring of surface quality, 0000 (22 December 2003); doi: 10.1117/12.503679
Proc. SPIE 5180, Grain decoration in aluminum oxynitride (ALON) from polishing on bound abrasive laps, 0000 (22 December 2003); doi: 10.1117/12.506849
Proc. SPIE 5180, Single-point diamond turning of DAST crystals, 0000 (22 December 2003); doi: 10.1117/12.510445
Optical Manufacturing III: Ion Milling
Proc. SPIE 5180, Finishing procedure for high-performance synchrotron optics, 0000 (22 December 2003); doi: 10.1117/12.506505
Proc. SPIE 5180, Multiple high-period-accuracy gratings fabricated by holographic exposure and ion-beam etching with nanometer depth accuracy in silicon, 0000 (22 December 2003); doi: 10.1117/12.508286
Proc. SPIE 5180, Ion beam milling of optically polished CaF2 surfaces, 0000 (22 December 2003); doi: 10.1117/12.505658
Optical Manufacturing IV: Fluid Jet Polishing
Proc. SPIE 5180, Jules Verne: a new polishing technique related to FJP, 0000 (22 December 2003); doi: 10.1117/12.503668
Proc. SPIE 5180, Polishing robot based on FJP with in situ monitoring system, 0000 (22 December 2003); doi: 10.1117/12.504739
Proc. SPIE 5180, New magnetically assisted finishing method: material removal with magnetorheological fluid jet, 0000 (22 December 2003); doi: 10.1117/12.506280
Optical Manufacturing V: MRF
Proc. SPIE 5180, Prediction of MRF polishing by classification of the initial error with Zernike polynomials, 0000 (22 December 2003); doi: 10.1117/12.507652
Optical Manufacturing VI: Plastic Optics
Proc. SPIE 5180, Polishing PMMA and other optical polymers with magnetorheological finishing, 0000 (22 December 2003); doi: 10.1117/12.506860
Proc. SPIE 5180, Development and manufacture of visor for helmet-mounted display, 0000 (22 December 2003); doi: 10.1117/12.506435
Cryogenic and Lightweight Optics for Space Telescopes I
Proc. SPIE 5180, Wilkinson Microwave Anisotropy Probe scientific instrument metrology, 0000 (22 December 2003); doi: 10.1117/12.506267
Proc. SPIE 5180, Integration and verification of the James Webb Space Telescope, 0000 (22 December 2003); doi: 10.1117/12.506410
Proc. SPIE 5180, Kodak AMSD mirror program: overview and cryo test results, 0000 (22 December 2003); doi: 10.1117/12.505181
Proc. SPIE 5180, Optical characterization of the beryllium semi-rigid AMSD mirror assembly, 0000 (22 December 2003); doi: 10.1117/12.506386
Cryogenic and Lightweight Optics for Space Telescopes II
Proc. SPIE 5180, Techniques and uncertainty analysis for interferometric surface figure error measurement of spherical mirrors at 20K, 0000 (22 December 2003); doi: 10.1117/12.508300
Proc. SPIE 5180, Helium cryo testing of an SLMS (silicon lightweight mirrors) athermal optical assembly, 0000 (22 December 2003); doi: 10.1117/12.508378
Proc. SPIE 5180, Interferometric measurement of the vibrational characteristics of light-weight mirrors, 0000 (22 December 2003); doi: 10.1117/12.506305
Cryogenic and Lightweight Optics for Space Telescopes III
Proc. SPIE 5180, Metrology results and lessons learned from the Univ. of Arizona NGST mirror system demonstrator, 0000 (22 December 2003); doi: 10.1117/12.512740
Optical Testing I: Micro-Optics
Proc. SPIE 5180, Dynamic MEMS measuring interferometric microscope, 0000 (22 December 2003); doi: 10.1117/12.506487
Proc. SPIE 5180, Self-calibration technique for transmitted wavefront measurements, 0000 (22 December 2003); doi: 10.1117/12.506408
Proc. SPIE 5180, Self-calibration for microrefractive lens measurements, 0000 (22 December 2003); doi: 10.1117/12.506396
Proc. SPIE 5180, Null test measurement of high-numerical-aperture cylindrical microlenses in transmitted light, 0000 (22 December 2003); doi: 10.1117/12.505547
Proc. SPIE 5180, Traceable radius of curvature measurements on a micro-interferometer, 0000 (22 December 2003); doi: 10.1117/12.506416
Optical Testing II: System Performance Characterization
Proc. SPIE 5180, Precise free spectral range measurement of telecom etalons, 0000 (22 December 2003); doi: 10.1117/12.506392
Proc. SPIE 5180, Microscope objective production: on the way from the micrometer scale to the nanometer scale, 0000 (22 December 2003); doi: 10.1117/12.505803
Proc. SPIE 5180, Ultra-fast MTF Test for High-Volume production of CMOS Imaging Cameras, 0000 (22 December 2003); doi: 10.1117/12.507928
Optical Testing III: Aspheric Metrology
Proc. SPIE 5180, Non-null interferometer for measurement of aspheric transmitted wavefronts, 0000 (22 December 2003); doi: 10.1117/12.506047
Proc. SPIE 5180, Characterization of aspherical surface that has high numerical aperture by using a computer-generated hologram, 0000 (22 December 2003); doi: 10.1117/12.506621
Proc. SPIE 5180, Important considerations when using the Shack-Hartmann method for testing highly aspheric optics, 0000 (22 December 2003); doi: 10.1117/12.505884
Proc. SPIE 5180, Interferometric testing of soft contact lenses, 0000 (22 December 2003); doi: 10.1117/12.505854
Optical Testing IV: Profilometry
Proc. SPIE 5180, Characterization of symmetric aberrations in aspheric surfaces using noncontact profilometry, 0000 (22 December 2003); doi: 10.1117/12.508042
Proc. SPIE 5180, Calibration of high-speed optical profiler, 0000 (22 December 2003); doi: 10.1117/12.504930
Proc. SPIE 5180, Algorithm with optimum noise suppression for surface profiling by white-light interferometry, 0000 (22 December 2003); doi: 10.1117/12.506711
Proc. SPIE 5180, Submicroradian error sources in pencil beam interferometry, 0000 (22 December 2003); doi: 10.1117/12.507465
Optical Testing V: Stitching Algorithms
Proc. SPIE 5180, Recent developments of multi-aperture overlap-scanning technique, 0000 (22 December 2003); doi: 10.1117/12.505340
Optical Testing VI: Index and Windows
Proc. SPIE 5180, Three-dimensional bulk index inhomogeneity measurement using computed tomography, 0000 (22 December 2003); doi: 10.1117/12.504746
Proc. SPIE 5180, Measurement of surface figure and optical thickness variation of a thin parallel plate in wavelength-scanned interferometry with minimized laser tuning range, 0000 (22 December 2003); doi: 10.1117/12.503439
Optical Testing VII: Algorithms and Interferometers
Proc. SPIE 5180, Regression analysis for wavefront fitting with Zernike polynomials, 0000 (22 December 2003); doi: 10.1117/12.501144
Proc. SPIE 5180, Fourier analysis of the sampling characteristics of the phase-shifting algorithm, 0000 (22 December 2003); doi: 10.1117/12.505277
Optical Testing III: Aspheric Metrology
Proc. SPIE 5180, Revisiting the Hartmann test, 0000 (22 December 2003); doi: 10.1117/12.514264
Optical Testing IV: Profilometry
Proc. SPIE 5180, On-machine measurement with an LTP (long trace profiler), 0000 (22 December 2003); doi: 10.1117/12.509457
Optical Testing V: Stitching Algorithms
Proc. SPIE 5180, Shape measurement of complex objects using connection techniques based on overlapping areas, 0000 (22 December 2003); doi: 10.1117/12.505382
Optical Testing VII: Algorithms and Interferometers
Proc. SPIE 5180, Lateral shearing interferometer using phase-shifting technique without moving element, 0000 (22 December 2003); doi: 10.1117/12.505396
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