PROCEEDINGS VOLUME 5189
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING | 3-8 AUGUST 2003
Surface Scattering and Diffraction III
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING
3-8 August 2003
San Diego, California, United States
Polarization in Surface Scattering and Diffraction: Joint Session with Polarization Science and Remote Sensing Conference
Proc. SPIE 5189, Reflection and transmission scattering by rough plane surface of glass hemisphere, 0000 (16 October 2003); doi: 10.1117/12.507780
Proc. SPIE 5189, Polarization of holographic volume grating diffraction, 0000 (16 October 2003); doi: 10.1117/12.508293
Theory and Analysis
Proc. SPIE 5189, Coherent scattering of an electromagnetic wave from, and its transmission through, a slab of a left-handed medium with a randomly rough illuminated surface, 0000 (16 October 2003); doi: 10.1117/12.503386
Proc. SPIE 5189, Use of the single-wavelength approximation in radiometric diffraction loss calculations, 0000 (16 October 2003); doi: 10.1117/12.509464
Proc. SPIE 5189, Changes in the spectrum of light scattered from a rough dielectric film on a metal surface, 0000 (16 October 2003); doi: 10.1117/12.502604
Proc. SPIE 5189, Intermode power transfer in multimode optical fiber with a rough surface, 0000 (16 October 2003); doi: 10.1117/12.507407
Proc. SPIE 5189, Inverse scattering with far-field intensity data, 0000 (16 October 2003); doi: 10.1117/12.510631
Proc. SPIE 5189, Efficient excitation of surface plasmon polaritons by the scattering of a volume electromagnetic beam from a circularly symmetric defect of cosinusoidal form and finite size on a planar metal surface, 0000 (16 October 2003); doi: 10.1117/12.503532
Proc. SPIE 5189, Comparison between theoretical calculation and measurement of angular spectrum changes from rough surface scattering, 0000 (16 October 2003); doi: 10.1117/12.503407
Proc. SPIE 5189, Image formation with a scatter-probe near-field optical microscope, 0000 (16 October 2003); doi: 10.1117/12.507329
Poster - Monday
Proc. SPIE 5189, Resonance diffraction of electromagnetic waves on impedance gratings under grazing incidence, 0000 (16 October 2003); doi: 10.1117/12.505047
Instruments and Applications
Proc. SPIE 5189, Deducing light scatter from AFM measurements, 0000 (16 October 2003); doi: 10.1117/12.505016
Proc. SPIE 5189, Development review of an angle-resolved light scatter (ARS) sensor LARISSA, 0000 (16 October 2003); doi: 10.1117/12.505021
Proc. SPIE 5189, Interference with a Collett-Wolf source, 0000 (16 October 2003); doi: 10.1117/12.503409
Proc. SPIE 5189, Estimation of performance limits of multipole method using parallel computing techniques, 0000 (16 October 2003); doi: 10.1117/12.509479
Proc. SPIE 5189, The effect of weave orientation on the BRDF of tarp samples, 0000 (16 October 2003); doi: 10.1117/12.505865
Proc. SPIE 5189, Simulation of eye-safe imaging laser radar for advanced range estimation and improved design process using VRML, 0000 (16 October 2003); doi: 10.1117/12.505714
Proc. SPIE 5189, Appearance characterization by a scatterometer employing a hemispherical screen, 0000 (16 October 2003); doi: 10.1117/12.503560
Poster - Monday
Proc. SPIE 5189, Analysis of stress measurement by means of a speckle decorrelation, 0000 (16 October 2003); doi: 10.1117/12.507289
Proc. SPIE 5189, Optical processor for determination of speckle pattern relative translation: computer analysis, 0000 (16 October 2003); doi: 10.1117/12.519659
Theory and Analysis
Proc. SPIE 5189, Impedance boundary conditions and effective surface impedance of inhomogeneous metal, 0000 (16 October 2003); doi: 10.1117/12.519853
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