PROCEEDINGS VOLUME 5192
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING | 3-8 AUGUST 2003
Optical Diagnostic Methods for Inorganic Materials III
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING
3-8 August 2003
San Diego, California, United States
Birefringance and Photo-Elastic Constant Measurement Techniques
Proc. SPIE 5192, Development of birefringence measurement with double rotating polarization components, 0000 (14 November 2003); doi: 10.1117/12.507258
Proc. SPIE 5192, The Exicor DUV birefringence measurement system and its application to measuring lithography-grade CaF2 lens blanks, 0000 (14 November 2003); doi: 10.1117/12.506213
Proc. SPIE 5192, All-optical acousto-optic method for determination of photo-elastic constants of optical materials, 0000 (14 November 2003); doi: 10.1117/12.506561
Novel Techniques and Measurement Systems
Proc. SPIE 5192, The design of the new NPL reference spectrofluorimeter, 0000 (14 November 2003); doi: 10.1117/12.509181
Proc. SPIE 5192, Laser-based spectrometry at NPL, 0000 (14 November 2003); doi: 10.1117/12.509179
Proc. SPIE 5192, Precise in-situ transmission measurement system at 157 nm, 0000 (14 November 2003); doi: 10.1117/12.506614
Hemispherical Reflectance: Error Sources I
Proc. SPIE 5192, The experimental assessment of the effects of non-Lambertian surfaces on integrating sphere measurements in the mid-IR, 0000 (14 November 2003); doi: 10.1117/12.507294
Proc. SPIE 5192, Analytical evaluation and correction of port loss error in integrating sphere reflectometers, 0000 (14 November 2003); doi: 10.1117/12.508326
Hemispherical Reflectance: Error Sources II
Proc. SPIE 5192, Correction for angular spread in HDR determination of IR optical constants, 0000 (14 November 2003); doi: 10.1117/12.503522
Proc. SPIE 5192, Light trapping in translucent samples and its effect on the hemispherical transmittance obtained by an integrating sphere, 0000 (14 November 2003); doi: 10.1117/12.508196
Hemispherical Reflectance II: Instrumentation and Methods
Proc. SPIE 5192, Specular baffle for improved infrared integrating sphere performance, 0000 (14 November 2003); doi: 10.1117/12.508299
Proc. SPIE 5192, Recent progress at NPL in the development of mid-infrared spectrometric measurements, 0000 (14 November 2003); doi: 10.1117/12.509177
Proc. SPIE 5192, Goniometric realization of reflectance scales at NPL, 0000 (14 November 2003); doi: 10.1117/12.509190
Bidirectional Scattering Distribution Function Instrumentation and Modeling
Proc. SPIE 5192, Physics-based polarimetric BRDF models, 0000 (14 November 2003); doi: 10.1117/12.507317
Proc. SPIE 5192, Algorithmic model of microfacet BRDF for Monte Carlo calculation of optical radiation transfer, 0000 (14 November 2003); doi: 10.1117/12.508577
Proc. SPIE 5192, Analysis and representation of BSDF and BRDF measurements, 0000 (14 November 2003); doi: 10.1117/12.508560
Posters - Thursday
Proc. SPIE 5192, The prediction of lifetime failure of thermal barrier coatings using piezospectroscopic techniques, 0000 (14 November 2003); doi: 10.1117/12.509186
Novel Techniques and Measurement Systems
Proc. SPIE 5192, A hand-held polarized-light camera for the detection of skin cancer borders, 0000 (14 November 2003); doi: 10.1117/12.534100
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