PROCEEDINGS VOLUME 5195
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING | 3-8 AUGUST 2003
Crystals, Multilayers, and Other Synchrotron Optics
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING
3-8 August 2003
San Diego, California, United States
Focusing Methods and Devices I
Proc. SPIE 5195, Double gradient multilayers for broadband focusing, 0000 (23 December 2003); doi: 10.1117/12.502658
Poster Session
Proc. SPIE 5195, Dynamic focusing of polychromatic incident beam with bent crystals in Laue geometry, 0000 (23 December 2003); doi: 10.1117/12.505058
Focusing Methods and Devices II
Proc. SPIE 5195, Focusing properties of x-ray polymer refractive lenses from SU-8 resist layer, 0000 (23 December 2003); doi: 10.1117/12.507111
Proc. SPIE 5195, Focusing properties of silicon refractive lenses: comparison of experimental results with the computer simulation, 0000 (23 December 2003); doi: 10.1117/12.507070
Multilayers and Novel Optics
Proc. SPIE 5195, High selective x-ray multilayers, 0000 (23 December 2003); doi: 10.1117/12.502709
Proc. SPIE 5195, Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography, 0000 (23 December 2003); doi: 10.1117/12.503825
Proc. SPIE 5195, X-ray optics for 50-100 keV undulator radiation using crystals and refractive lenses, 0000 (23 December 2003); doi: 10.1117/12.506374
Proc. SPIE 5195, Development and application of aberration-compensating x-ray phase retarder systems, 0000 (23 December 2003); doi: 10.1117/12.504098
Applications and Stability Issues
Proc. SPIE 5195, Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique, 0000 (23 December 2003); doi: 10.1117/12.507495
Proc. SPIE 5195, Stability issues in the use of coherent x-rays, 0000 (23 December 2003); doi: 10.1117/12.512853
Poster Session
Proc. SPIE 5195, Sagittally focusing diffractive-refractive x-ray lens with a large acceptance and a long focusing distance, 0000 (23 December 2003); doi: 10.1117/12.504730
Proc. SPIE 5195, Influence of crystal surface roughness on the angular spread of x-ray diffracted beam, 0000 (23 December 2003); doi: 10.1117/12.505553
Focusing Methods and Devices I
Proc. SPIE 5195, Double multilayer monochromator to tailor bending magnet radiation spectrum, 0000 (23 December 2003); doi: 10.1117/12.515980
Focusing Methods and Devices II
Proc. SPIE 5195, Spatially resolved tilt and strain measurements in diamond crystals, 0000 (23 December 2003); doi: 10.1117/12.516621
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