PROCEEDINGS VOLUME 5220
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING | 3-8 AUGUST 2003
Nanofabrication Technologies
IN THIS VOLUME

0 Sessions, 13 Papers, 0 Presentations
Session 1  (3)
Session 2  (2)
Session 3  (1)
Session 4  (4)
OPTICAL SCIENCE AND TECHNOLOGY, SPIE'S 48TH ANNUAL MEETING
3-8 August 2003
San Diego, California, United States
Session 1
Proc. SPIE 5220, Nanofabrication of structures for cell engineering, 0000 (15 October 2003); doi: 10.1117/12.509749
Proc. SPIE 5220, Sub-lithographic patterning technology for nanowire model catalysts and DNA label-free hybridization detection, 0000 (15 October 2003); doi: 10.1117/12.505409
Proc. SPIE 5220, Self-assembly of metallic nanoparticles in a cholesteric liquid crystal, 0000 (15 October 2003); doi: 10.1117/12.503558
Session 2
Proc. SPIE 5220, Incorporation of bioactive materials into integrated systems, 0000 (15 October 2003); doi: 10.1117/12.509314
Proc. SPIE 5220, Nanowire growth for sensor arrays, 0000 (15 October 2003); doi: 10.1117/12.507189
Session 3
Proc. SPIE 5220, A raster multibeam lithography tool for sub-100-nm mask fabrication utilizing a novel photocathode, 0000 (15 October 2003); doi: 10.1117/12.512863
Session 4
Proc. SPIE 5220, Scanning probe lithography of self-assembled monolayers, 0000 (15 October 2003); doi: 10.1117/12.504613
Proc. SPIE 5220, Laser manipulation and fixation of metal nanoparticles using an optical fiber probe, 0000 (15 October 2003); doi: 10.1117/12.507262
Proc. SPIE 5220, Fine gold grating fabrication on glass plate by imprint lithography, 0000 (15 October 2003); doi: 10.1117/12.505408
Proc. SPIE 5220, Two-step modified NERIME process using combined focused ion beam lithography and plasma etching, 0000 (15 October 2003); doi: 10.1117/12.503510
Poster Session
Proc. SPIE 5220, Resonance-enhanced fluorescence in photonic crystals studied by near-field technique, 0000 (15 October 2003); doi: 10.1117/12.505696
Proc. SPIE 5220, Considerations of optical microlens-array design for nano-MEMS-based optical switch arrays, 0000 (15 October 2003); doi: 10.1117/12.505783
Proc. SPIE 5220, Analysis of AFM tip-induced oxidation of thin metal film in the air, 0000 (15 October 2003); doi: 10.1117/12.507643
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